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Measuring Microscopes are portable and illuminated.

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Measuring Microscopes are portable and illuminated.
Measuring Microscopes are portable and illuminated.

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December 12, 2003 - Suited for general inspection applications, Measuring Stand Microscopes measure linear dimensions as small as 0.0001 in. Compact, 2.48 x 6.77 in., portable microscopes, available with magnifying powers from 20–200x, feature helicoid focusing system to provide bright, clear, undistorted image. Features include acrylic base, penlight attachment that enables use in low-light areas, and scale that appears projected on viewed object by recticle.

(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
Original Press release

GEI International, Inc.
P.O. Box 6849-T
Syracuse, NY, 13217 6849
USA


Portable, Illuminated Wide Field Measuring Microscopes

GEI International, Inc. announces the availability of a range of Measuring Stand Microscopes with wide fields of view for general inspection applications and the accurate measurement of linear dimensions as small as one ten thousandth of an inch (0.0001").

These compact and portable microscopes are available with magnifying powers from 20x to 200x. Dimensions may be measured quickly and easily with these microscopes from the scale that appears projected on the viewed object by the recticle enclosed within the microscope. Both inch and metric (mm) measurements may be made.

The microscopes feature high quality optics and a helicoid focusing system to provide a bright, clear and undistorted image.

The acrylic base of the microscopes permits their use in ambient lighting and a penlight attachment which is supplied as standard enables the microscopes to be use in low light areas.

The overall size of the microscopes is 2.48" x 6.77" and the weight is 11 ounces. All the microscopes are supplied with a padded carrying and storage case.

Further information and literature on this range of microscopes is available from GEI International, Inc.
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