JTAG Testing Software supports Freescale i.MX51 processors.November 22, 2011 -
Providing at-speed testing of embedded processor-based electronic PCB and systems, ScanExpress JET(TM) detects, isolates, and diagnoses structural and functional defects with minimal development. Program controls i.MX51's ARM Cortex(TM)-A8 core through JTAG debug port, enabling development and execution of binary and script test steps using graphical user interface on host PC. Standardized interface tests for SDRAM memory, I2C, Ethernet, PMIC, and UART.
Corelis Extends JTAG Embedded Testing to Freescale i.MX51
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Press release date: November 15, 2011
JTAG functional test solution for i.MX51 applications processors increases test coverage.
Cerritos, CA, - Corelis, Inc., the leading supplier of high-performance JTAG test and measurement tools, announced today ScanExpress JET(TM) support for all members of the Freescale i.MX51 family of applications processors. ScanExpress JTAG Embedded Test (JET) provides at-speed testing of embedded processor-based electronic printed circuit boards and systems to detect, isolate, and diagnose structural and functional defects with minimal development and investment.
ScanExpress JET controls the i.MX51's ARM Cortex(TM)-A8 core through the JTAG debug port, enabling development and execution of binary and script test steps using a graphical user interface on the host PC. Benefits of using ScanExpress JET for i.MX51 applications processors include:
o Standardized interface tests for SDRAM memory, I2C, Ethernet, PMIC, and UART
o Fast in-system programming and testing of parallel and serial NOR and NAND Flash
o Fully automatic test development for all supported peripherals
o Integrated scripting environment for test customization
o No boot code requirement for test execution
Freescale i.MX51 applications processors offer low power, efficient multimedia processing and are targeted at consumer, industrial, automotive, and general embedded applications, representing an ideal platform for ScanExpress JET. "Systems built around the i.MX51 are often designed to fit a particular form factor and need to be highly reliable," explains Ryan Jones, Senior Technical Marketing Engineer at Corelis. "These constraints contribute to the need for automated nonintrusive, at-speed functional tests. ScanExpress JET offers significant functional test coverage with minimal impact on the system design-a simple JTAG connection offers complete control over the CPU allowing convenient and reusable tests for development and production."
To receive additional education on the benefits of embedded testing, download the ScanExpress JET whitepaper today at http://www.corelis.com/whitepapers/ScanExpressJET_Whitepaper.htm.
Corelis, Inc., a subsidiary of Electronic Warfare Associates, Inc., offers bus analysis tools, embedded test tools, and the industry's broadest line of JTAG/boundary-scan software and hardware products combining exceptional ease-of-use with advanced technical innovation and unmatched customer service. Since its founding in 1991, Corelis has delivered a diverse range of electronic test equipment solutions for customers across a wide range of industries, including aerospace, defense, medical, manufacturing, networking, and telecommunications. Today, Corelis continues that trend with focus on product ease of use and dedication to customer service.
Copyright © 2011 Corelis, Inc. All rights reserved.
ScanExpress JET is a trademark of Corelis, Inc. Freescale is a trademark of Freescale Semiconductor, Inc. ARM and Cortex(TM) are trademarks of ARM Limited. All other company and product names may be trade names, trademarks, or registered trademarks of the respective owners with which they are associated. Features, pricing, availability, and specifications are subject to change without notice.