FIB/SEM System offers nanoscale imaging and analysis.
September 1, 2006 -
Helios NanoLab(TM) DualBeam(TM) features ultra-high resolution field emission scanning electron microscope (SEM) column combined with Sidewinder(TM) focused ion beam (FIB) column and gas chemistries to provide imaging resolution and contrast in DualBeam system. Small DualBeam platform enables 3D characterization, analysis, and image reconstruction applications, nano-prototyping (fabrication and testing) capabilities, and advanced sample preparation abilities.
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|Original Press Release |
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FEI Launches Top-of-the-Line Research Dualbeam at M&M
Helios NanoLab(TM) DualBeam Will Enable Industry-Leading Nanoscale Imaging, Analysis, Fabrication and Sample Prep Applications
HILLSBORO, Ore. /July 31, 2006-The next generation of combined focused ion beam (FIB) and scanning electron microscope (SEM) technology for research will be unveiled today when FEI Company (Nasdaq: FEIC) releases its all-new Helios NanoLab(TM) DualBeam(TM) at Microscopy and Microanalysis 2006 in Chicago.
The Helios NanoLab features a new ultra-high resolution field emission SEM column combined with FEI's widely acclaimed Sidewinder(TM) FIB column and gas chemistries to provide new levels of imaging resolution and contrast in a DualBeam system. It also delivers enhanced stability and optimized operation within a wide range of parameters. The new small DualBeam platform enables industry-leading 3D characterization, analysis and image reconstruction applications, nano-prototyping (fabrication and testing) capabilities, and high-quality sample prep abilities for researchers and developers needing to reach deep into the nanoscale.
"The Helios NanoLab was designed to address the demanding requirements of our growing base of DualBeam users in both research and product development environments," said Rob Fastenau, senior vice president of FEI's NanoResearch and Industry market division. "FEI continues to lead innovation in combined FIB/SEM solutions. We believe that users of this all-new DualBeam platform will be able to achieve ground-breaking results in multiple applications with accuracy and repeatability."
With its advanced sample preparation capabilities, the Helios NanoLab complements FEI's Titan S/TEM-the world's most powerful microscope-which continues to receive industry acclaim since its launch at last year's Microscopy & Microanalysis show. The Helios system enables fast and precise preparation of the thinnest S/TEM samples with little damage to samples. Together, the Helios NanoLab and the Titan S/TEM represent the highest-performance tool set currently available on the commercial market.
FEI introduced the world's first combined FIB/SEM system in 1993. Since 2000, it has sold more than 350 small stage DualBeam systems worldwide.
FEI's Tools for Nanotech(TM), featuring focused ion- and electron-beam technologies, deliver 3D characterization, analysis and modification capabilities with resolution down to the sub-Angstrom level and provide innovative solutions for customers working in NanoBiology, NanoResearch and NanoElectronics. With R&D centers in North America and Europe, and sales and service operations in more than 50 countries around the world, FEI is bringing the nanoscale within the grasp of leading researchers and manufacturers and helping to turn some of the biggest ideas of this century into reality. More information can be found on the FEI website at: www.fei.com.