Dimensional Metrology System has telecentric optical design.
July 14, 2009 -
Based on scanning white-light interferometry capable of 20 Nm resolution over vertical depth of up to 70 mm, TMS-100 can measure surfaces as large as 37 x 28 mm in single shot with lateral details as small as 36 µm. It has protective housing with slight positive pressure against dust penetration, and includes actively regulated environmental vibration isolation table. Software and stages for stitching increase field of view up to 80 x 80 mm.
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Original Press release
Polytec, Inc.
1342 Bell Ave., Suite 3A
Tustin, CA, 92780
USA
TMS-100 Metro.Lab for Optical Surface Metrology of Large Scale Precision-Manufactured Components
Polytec introduces a fully automated dimensional metrology measurement system. TMS-100 is based on scanning white-light interferometry capable of 20nm resolution over an unprecedented vertical depth of up to 70 mm. Surfaces as large as 37 mm x 28 mm can be measured in a single shot with lateral details as small as 36 µm. Software and stages for stitching increase the field of view up to 80 mm x 80 mm. The system includes
o a scanning white-light interferometer
o a protective housing with slight positive pressure against dust penetration
o an actively regulated environmental vibration isolation table
Parameters measured include flatness, parallelism, heights or surface parameters. The system is particularly applicable to parts with steep edges and deep holes due to its telecentric optical design. TMS-100 offers a unique combination of value-for-money, precision, application range and robustness. The system together with the optional automatic workpiece positioner is ideal for random sampling during in-line quality assurance and supplements other in-line solutions offered by Polytec.
For more information please see http://www.polytec.com/usa/158_5079.asp join us for one of our live webinars http://www.polytec.com/usa/158_10332.asp or contact us at info@polytec.com
Responsible for queries
Izabela Mijic
Ph: 949-769-2626
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