Product News: Test & Measuring Instruments, Sensors, Monitors & Transducers

Capacitive Displacement Measurement System is modular, flexible.

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Press Release Summary:

July 18, 2014 - As modular, multi-channel measurement system for capacitive displacement sensors, capaNCDT 6200┬áprovides flexibility via controller that offers Ethernet and EtherCAT interfaces as well as integrated synchronization. Single components – controller, demodulator, sensor – are freely interchangeable and allow for customer-specific systems. Measurement system consists of one controller and respective demodulator for sensor, and controller can be extended to 4 channels.

MICRO-EPSILON AMERICA

8120 Brownleigh Dr., Raleigh, NC, 27617, USA

Original Press Release

New Flexibility for Capacitive Displacement Measurement

Press release date: July 18, 2014

The multi-channel measurement system for capacitive displacement sensors based on the modularity principle, capaNCDT 6200; has now been extended by the new controller DT6230. Compared to its “little brother”, the DT6230 does not only offer an Ethernet but also an EtherCAT interface as well as an integrated synchronisation. Thereby, the whole system offers more flexibility.

In combination with the demodulators DL6220 and DL6230, the new mid-range class is more flexible than any other system: The single components – controller, demodulator, sensor – are freely interchangeable and allow customer-specific systems to be provided from stock. With a unique modular design, sensor systems that have already been purchased can be enlarged easily.

The capaNCDT 6200 series is a unique modular multi-channel measurement system for capacitive displacement sensor and particularly stands out due to its excellent price/performance ratio. The measurement system consists of one controller and the respective demodulator for the sensor. The controller can be extended to 4 channels. All capacitive displacement sensors from Micro-Epsilon can be used with the capaNCDT 6200 controlle , which can measure thickness, tilt angle and vibrations in the sub-micrometre and nanometre range.

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