Product News: Test & Measuring Instruments
CMM Probe performs scanning and touch-trigger probing.
Press Release Summary:
December 13, 2002 - Model SP25M uses Renscan(TM) technology to provide scanning on coordinate measuring machines and vision systems. Measuring only 1 in. in diameter, probe can be mounted to motorized articulating heads, or fitted to extension bars to allow access to deep part features. Interchangeable scanning probe modules are available, each optimized to suit range of stylus lengths from 0.8-8 in. Model SP25M includes kinematic stylus changing and bump-stop crash protection.
Original Press Release
Renishaw Introduces the World's Most Compact and Versatile CMM Scanning Probe System
Press release date: December 1, 2002
Dual-purpose probe performs scanning and touch trigger probing for ultimate flexibility
December 2002 - Renishaw is introducing its next-generation SP25M scanning probe, a two-in-one probe that can perform scanning for form and touch-trigger sensing for size and position.
The compact SP25M uses innovative Renscan(TM) technology to provide exceptional flexibility, while maintaining excellent scanning performance on both traditional coordinate measuring machines and vision systems.
Measuring only 25 mm (1 in.) in diameter, the SP25M can be mounted to motorized articulating heads, such as Renishaw's PH10M, and may be fitted to a range of extension bars to allow access to deep part features. Its compact size and lightweight design provide excellent scanning performance using Renishaw's unique isolated optical metrology. This approach measures probe deflections independently, rather than using transducers mounted to stacked probe axes.
A set of interchangeable scanning probe modules is available, each optimized to suit a range of stylus lengths from 20 mm (0.8 in.) to 200 mm (8 in.). Like all Renishaw scanning probes, the SP25M features kinematic stylus changing and bump-stop crash protection for maximum robustness.
Modular system design allows the SP25M to be connected to Renishaw's TP20 probe module to perform touch-trigger probing routines, which is ideal for discrete point measurement or applications in which scanning is not appropriate. The system is compatible with the full range of TP20 probe modules, allowing fast stylus changing and six-way sensing.
A key advantage of the SP25M system is improved component feature access arising from its compact size and the ability to carry long stylus configurations. The probe's low volume also makes it a highly suitable contact sensor for vision systems, offering the combined benefits of touch probing and analog scanning.
For more information on the SP25M CMM scanning probe, contact Denis Zayia, CMM Business Manager, Renishaw Inc. Phone 847-286-9953. Fax 847-286-9974. Internet. www.renishaw.com
Inquiries should be directed to: Susan Wilm Marketing Assistant Renishaw Inc. 5277 Trillium Boulevard Hoffman Estates, IL 60192