Boundary-Scan Controller supports PCIe slot format.
November 20, 2009 -
DataBlaster JT 37x7/PCIe offers sustained test clock speeds of up to 40 MHz and uses Enhanced Throughput Technology(TM) to support memories with data-bus widths from 1 bit to 64 Kbit. Unit includes 4 synchronized test access ports (TAP) that support multiTAP test targets or gang programming of 4 TAP targets. It features QuadPOD(TM) with high-speed signal conditioning, logic threshold adjustments, and cable delay compensations. Flash image buffer memory is expandable to 128 Mbits.
(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
Original Press release
Jtag Technologies Inc
1006 Butterworth Ct
Stevensville, MD, 21666
USA
New PCI Express Boundary-Scan Controller
JTAG Technologies, a leading provider of IEEE Std. 1149.1 solutions for testing and programming high-density PCBs, announces a further extension of its line of high-performance boundary-scan IEEE Std. 1149.1 controllers. Known as the DataBlaster JT 37x7/PCIe the new unit offers support for the now popular PCI-express slot format found extensively in today's PCs. The PCIe bus is a high-speed serial replacement of the older parallel PCI bus.
Following industry demands JTAG Technologies have developed the new, boundary-scan controller to satisfy the burgeoning requirements for high speed In-System Programming (ISP) of flash memories and CPLDs and complex digital circuit testing. The new DataBlaster JT 37x7/PCIe offers the user sustained test clock speeds of up to 40MHz by use of JTAG Technologies proprietary ETT(TM) (Enhanced Throughput Technology) system and features a flash image buffer memory which may be expanded to 128 Mbits.
Supplied with the complementary QuadPOD(TM), also from JTAG Technologies, the new DataBlaster/PCIe offers four synchronised TAPs (Test Access Ports) able to support multi-TAP test targets (UUT's) or gang programming of four single TAP targets. QuadPOD is 'low-voltage ready' and the advanced technology also allows maximum test speeds at the target by incorporating high-speed signal conditioning, logic threshold adjustments and cable delay compensations in a compact, remote, extension module.
The scalable DataBlaster JT 37x7/PCIe range starts with the low-cost entry model JT 3707/PCIe, ideal for high-speed 40MHz test applications and in-system PLD programming. Companion models JT 3717/PCIe and JT 3727/PCIe, fitted with an ETT module for flash ISP, support high-throughput flash programming as well as test and PLD programming. The flexible nature of ETT allows it to support memories with various data-bus widths from 1-bit to 64Kbit.
DataBlaster/PCIe units are fully compatible with all revisions of JTAG Technologies test and ISP tools, such as JTAG ProVision and the former 'Classic' family of development and run-time packages.
About JTAG Technologies
JTAG Technologies is a market leader and technology innovator of boundary-scan software and hardware products and services, focusing on the development of boundary-scan technology. It was the first to bring to the market such important advances as automated test generation, automated flash and PLD programming via boundary-scan, and visualized boundary-scan analysis. Its customers include world leaders in electronics design and manufacturing such as Alcatel-Lucent, Ericsson, Flextronics, Honeywell, Medtronic, Motorola, Nokia, Philips, Raytheon, Rockwell-Collins, Samsung, and Sony. Its innovative boundary-scan products provide test development, test execution, coverage analysis and in-system programming applications. With an installed base of over 6,000 systems worldwide, JTAG Technologies serves the communications, medical electronics, avionics, defense, automotive, and consumer industries with offices throughout North America, Europe and Asia. JTAG Technologies headquarters are located in Eindhoven, The Netherlands.
JTAG Technologies is a registered trademark of JTAG Technologies, Inc. All other brand names or product names mentioned are trademarks or registered trademarks of their respective holder(s).
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