Atomic Force Microscopes incorporate KPFM mode.
August 16, 2012 -
Dimension Icon® and MultiMode® 8 atomic force microscopes (AFMs) are available with PeakForce Kelvin Probe Force Microscopy (KPFM) mode, which utilizes frequency-modulation detection to provide high spatial resolution Kelvin probe data. Building on PeakForce Tapping(TM) technology, solution provides directly correlated quantitative nanomechanical data to improve sensitivity of frequency-modulation measurement and eliminate artifacts in materials research and semiconductor applications.
Original Press release
Bruker Corporation
Bruker Nano Surfaces Division
Tucson, AZ, 85756
USA
Bruker Introduces New Nanoelectrical AFM Mode
PeakForce KPFM Enables Quantitative Nanoscale Surface Potential Measurements
SANTA BARBARA, CA - Bruker announced today the release of the new PeakForce Kelvin Probe Force Microscopy (KPFM) mode for its line of atomic force microscopes (AFMs). PeakForce KPFM(TM) utilizes frequency-modulation detection to provide the highest spatial resolution Kelvin probe data. It builds on Bruker's exclusive PeakForce Tapping(TM) technology to provide directly correlated quantitative nanomechanical data, which improves the sensitivity of the frequency-modulation measurement and eliminates artifacts. In addition, PeakForce KPFM provides a completely automated parameter setup with ScanAsyst®. The result is a significant improvement in quantitative surface potential data for materials research as well as semiconductor applications.
"Our research and industrial customers have increasing needs for quantitative nanoscale property measurements," said Mark R. Munch, Ph.D., President of Bruker Nano Surfaces Division. "Our new PeakForce KPFM mode combines leading-edge spatial resolution with unprecedented sensitivity and accuracy in work function measurements."
"We are committed to move AFM beyond just imaging contrast to quantitative electrical and mechanical property maps," added David V. Rossi, Executive Vice President and General Manager of Bruker's AFM Business Unit. "To enable this advance, we are building on our exclusive PeakForce Tapping technology with PeakForce QNM®, PeakForce TUNA(TM), and now PeakForce KPFM."
About PeakForce KPFM
The PeakForce KPFM accessory is an optional addition available for the Dimension Icon® and MultiMode® 8 AFMs. It includes the complete set of KPFM detection mechanisms (amplitude and frequency modulation), in conjunction with both TappingMode and Peak Force Tapping, as well as the ability to perform KPFM measurements over an extended voltage range. Its signature PeakForce KPFM mode combines FM-KPFM detection with PeakForce Tapping technology. This combination enables more sensitive potential detection with optimized probes. It eliminates the contamination of FM-KPFM signals with mechanical cross-talk, retaining more accurate measurements even on samples with significant variation in adhesion or modulus. Those variations can be mapped simultaneously and independently at highest spatial resolution using PeakForce QNM. The ScanAsyst concept has been extended to KPFM, providing fully automated parameter setup to guarantee optimized results.
About Bruker Corporation (NASDAQ: BRKR)
Bruker Corporation is a leading provider of high-performance scientific instruments and solutions for molecular and materials research, as well as for industrial and applied analysis. For more information about Bruker Corporation, please visit www.bruker.com.
Media Contact:
Stephen Hopkins, Marketing Communications
Bruker Nano Surfaces Division
3400 East Britannia Drive, Suite 150, Tucson, AZ 85706
T: +1 (520) 741-1044 x1022
E: steve.hopkins@bruker-nano.com
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