AFM System provides imaging at up to 300°C.
April 2, 2003 -
EnviroScope(TM) Atomic Force Microscope System combines hermetically sealed sample chamber with modular environmental controls to provide atomic force microcopy scanning under non-ambient vacuum, gas, and liquid environments. Scanner head is based on Dimension(TM) AFM head, and includes piezoelectric tube scanner, laser, and quadrature optical detector. EnviroScope comes with NanoScope® IIIa SPM controller or NanoScope IV controller.
(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
Original Press release
Veeco Instruments Inc. Corporate Headquarters
100 Sunnyside Blvd., Ste. B
Woodbury, NY, 11797
USA
Veeco Develops Environmental-Control AFM System for Imaging in Liquid, Inert Gas and in Vacuum up to 300°C
Santa Barbara, CA, March 26, 2002 - Veeco Instruments has announced the release of the Digital Instruments EnviroScope(TM) Atomic Force Microscope (AFM) System for a wide range of applications including advanced material science, electrochemistry, magnetic force microscopy, polymer and life science studies. This system combines a hermetically sealed sample chamber with modular environmental controls to provide atomic force microcopy scanning under non-ambient vacuum, gas, and liquid environments. In addition to inert and reactive environment research, the EnviroScope offers a full range of imaging modes for multipurpose application flexibility.
"This is the first Veeco scanning probe microscope that incorporates a sealed chamber and advanced environmental controls in such a convenient, easy-to-use platform," explains Steve Markakis, Environmental SPM Program Manager at Veeco Instruments. "With vacuum, gas, and liquid purge and exchange, as well as sample and environment heating and cooling, the system's environmental chamber allows users to observe sample reactions to a variety of complex environmental changes. I anticipate that the EnviroScope will become another extremely popular Digital Instruments characterization tool."
The EnviroScope scanner head is based on the low-noise Dimension(TM) AFM head, and includes a piezoelectric tube scanner, a laser, and a quadrature optical detector. The EnviroScope is also shipped with either the world's best-selling SPM controller, the NanoScope® IIIa, or the next-generation NanoScope IV controller, which features scanning that is up to ten times faster than competing products, higher lateral data resolution, higher sensitivity, and optimizes functionality, bandwidth, and flexibility.
Veeco Instruments Inc. is a worldwide leader in metrology tools and process equipment for the semiconductor, data storage, telecommunications/wireless, and scientific/research markets. Manufacturing and engineering facilities are located in New York, California, Colorado, and Arizona. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific. Additional information on Veeco can be found at www.veeco.com.
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