Quantcast
 
Search for: Search what?
Nov 9, 2009  
 Sections
Latest New Product News
Industry Market Trends
Green & Clean News
Association & Government News
Adhesives and Sealants
Agricultural and Farming Products
Architectural and Civil Engineering Products
Automatic ID
Chemical Processing and Waste Management
Cleaning Products and Equipment
Communication Systems and Equipment
Computer Hardware and Peripherals
Construction Equipment and Supplies
Controls and Controllers
Display and Presentation Equipment
Electrical Equipment and Systems
Electronic Components and Devices
Explosives, Armaments and Weaponry
Fasteners and Hardware
Fluid and Gas Flow Equipment
Food Processing and Preparation
Health, Medical and Dental Supplies and Equipment
HVAC
Labels, Tags, Signage and Equipment
Laboratory and Research Supplies and Equipment
Lubricants
Machinery and Machining Tools
Material Handling and Storage
Materials and Material Processing
Mechanical Components and Assemblies
Mechanical Power Transmission
Mining, Oil Drilling & Refining
Mounting and Attaching Products
Non-Industrial Products
Optics and Photonics
Packaging Products & Equipment
Paints and Coatings
Plant Furnishings and Accessories
Portable Tools
Printing and Duplicating Equipment
Retail and Sales Equipment
Robotics
Safety and Security Equipment
Sensors, Monitors and Transducers
Services
Software
Test and Measuring Instruments
Textile Industry Products
Thermal and Heating Equipment
Timers and Clocks
Transportation Industry Products
Vision Systems
Waste Handling Equipment
Welding Equipment and Supplies
 Press Releases
Products in the News
Company News
Mergers & Acquisitions
People in the News
Literature & Websites
 Resources
News Delivery Options
Browse Categories
Browse Companies
Mobile Edition
PR Resources
Licensing
Advertising
How to Write an effective Press Release
Trade Associations
Small Business Support
MEP
Advertisement
AFM includes SpotOn(TM) automated laser alignment capability.
AFM includes SpotOn(TM) automated laser alignment capability.

Click Here to Enlarge Picture

AFM includes SpotOn(TM) automated laser alignment capability.


November 20, 2008 - Achieving closed loop atomic resolution using sensors in all 3 axes, Cypher(TM) AFM includes integrated enclosure which provides acoustic and vibration isolation, as well as thermal control for image and measurement stability. Additional capabilities include interchangeable light source modules that allow laser spot sizes down to 3 µm for broad application and scan mode flexibility, as well as support for high-speed AC imaging with cantilevers smaller than 10 µm.

Acrobat PDF  Additional information provided by manufacturer

 See related product stories
System characterizes surface morphology at nanoscale.
AFMs come with modulated local thermal analysis option.
Atomic Force Microscope offers cooling/heating capabilities.
SEM can be used with wide range of samples.
Electron Microscope is offered with electron source module.
 See more product news in:
Optics and Photonics
 Tools for you
del.icio.us DIGG  
Facebook Reddit
StumbleUpon Twitter
Print This Page E-Mail Story
Watch_Company  Save Story
Contact company View Company Profile
Company web site 
More news from this company

Advertisement
More Tools and information
Search for suppliers of
Scanning Probe Microscopes
Atomic Force Microscopes
Join the forum discussion at:
 Tools of the Trade
 Newsletters
Your Gateway to a Fast Changing World
Product News Alerts
Receive similar stories and other customized news to keep you in the know on the products shaping industry.
Subscribe Free Today
Subscribe   View Sample

Industry Market Trends
Has Got It
  • Latest developments
  • Trends
  • Best practices
  • Opinions & Commentary
Get Ahead. Get IMT.
Subscribe Free Today
Subscribe   View Sample
 See more related product stories:
High Resolution SEM is suited for scientists and engineers.
AFM is designed for metrology applications.
Microscopes combine automated 3D chemical imaging with AFM.
SEM offers advanced defect monitoring capabilities.
Microscope takes nanoscale electromechanical measurements.
Atom Probe Microscope features high mass resolution.
Scanning Probe Microscope features high-resolution optics.
Scanning Electron Microscope handles broad range of samples.
Atomic Force Microscope uses nanoindenter module.
Microscope features laser pulse mode.
Module aids in taking conductive AFM measurements.
Microscopes enable in-plane anisotropic materials analysis.
Scanning Probe Microscope suits imaging applications to 300°C.
AFM System provides imaging at up to 300°C.
NSOM Microscope interfaces easily to detectors.
Scanning Probe Microscope includes hand-held tool.
Spectroscopy System aids in biology and materials research.


Asylum Research Introduces the Cypher(TM) AFM, the Industry's First New Small Sample AFM/SPM in over a Decade


Santa Barbara, CA, October 29, 2008 - Asylum Research, the technology leader in Atomic Force/Scanning Probe Microscopy (AFM/SPM), announced today that it is introducing the Cypher AFM, the industry's first completely new small sample AFM/SPM in over a decade. Cypher is the world's highest resolution AFM, providing more capability, more control, and more modularity with unprecedented ease of use. The Cypher AFM achieves closed loop atomic resolution using sensors in all three axes, combining the accuracy and control of closed loop with the power of atomic resolution for the most accurate images and measurements possible today.

Additional capabilities include SpotOn(TM) automated laser alignment with a mouse-click, interchangeable light source modules that allow laser spot sizes down to 3µm for broad application and scan mode flexibility, and support for high-speed AC imaging with cantilevers smaller than 10µm. The system includes an integrated enclosure which provides acoustic and vibration isolation, as well as excellent thermal control for image and measurement stability. The Cypher AFM will be introduced at MRS in Boston, December 2-4, and at other events worldwide.

"The new Cypher AFM is the result of years of engineering effort and sets the AFM/SPM bar to a new and much higher level. The entire system was designed from the ground up to provide superior capabilities and to generate the most accurate images and measurements possible. We believe the new Cypher system outclasses anything else on the market today and will help our customers generate new discoveries in the nano-scale materials and biological sciences," stated Mario Viani PhD, Cypher Product Manager.

Added Asylum President, Roger Proksch, "The AFM/SPM community has been waiting a long time for a next-generation system that goes beyond tweaks and add-ons to old technology. We've listened carefully to our customers and believe that the Cypher AFM meets or exceeds their requirements for today and has the modularity and expandability to support their future needs as well. Asylum's legendary support and applications team will continue to listen so that we can maintain our technology leadership into the future."

About Asylum Research

Asylum Research is the technology leader for atomic force and scanning probe microscopy (AFM/SPM) for both materials and bioscience applications. Asylum's product line offers advanced imaging and measurement capabilities for a wide range of samples, including Dual AC(TM) mode, iDrive, Q-control, electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force microscopy (PFM), magnetic force microscopy (MFM) with our unique variable field module, nanoindenting for true quantitative measurements, and a wide range of environmental accessories and application-ready modules. The MFP-3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback sensor technology. The MFP-3D offers both top and bottom sample viewing for easy integration with most commercially-available inverted optical microscopes. Asylum's new Cypher AFM is the world's first completely new small sample AFM/SPM in over a decade, and sets the new standard as the world's highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, rapid AC imaging with small cantilevers, Spot-On(TM) automated laser alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities. Ask us about our legendary product and applications support and our exclusive 6-month money-back satisfaction guarantee.

For additional information, contact

Terry Mehr, Director of Marketing Communications,

or Monteith Heaton, EVP, Marketing and Business Development,

Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117, 805-696-6466x224/227, Terry@AsylumResearch.com, Monte@AsylumResearch.com, www.AsylumResearch.com.


Contacts:

Marketing:
Terry Mehr Director of Marketing Communications
USA
Phone: 805-696-6466 ext 224
Send email  E-mail this person

Company Information:
Name: Asylum Research
Address: 6310 Hollister Ave.
City: Santa Barbara
State: CA
ZIP: 93117
Country: USA
Phone: 805-696-6466
http://www.asylumresearch.com


More New Product News from this company:
AFMs come with modulated local thermal analysis option.
Atomic Force Microscope offers cooling/heating capabilities.
Microscope takes nanoscale electromechanical measurements.
Atomic Force Microscope uses nanoindenter module.
Module aids in taking conductive AFM measurements.
AFM System offers nanolithography and manipulation feature.

Other News from this company:
London's Natural History Museum Chooses Asylum Research MFP-3D(TM) AFM
Asylum Research's MFP NanoIndenter Wins AVS Product Award
Asylum Research Sponsors AFM for Biosciences Events
Asylum Research Appoints Monteith Heaton as Executive Vice-President
Asylum Research Eliminates Half of Veeco Patent Claims
Asylum Research Acquires Majority Interest in Its European Distributor Atomic Force F&E GmbH
Asylum Research Opens East Coast Sales, Applications and Support Office
Asylum Research Licenses Magnetic Actuated Cantilever Technology



Click here for copyright permissions!
Copyright 2009 Thomas Publishing Company


 

Post a comment about this story

Name:
E-mail:
(your e-mail address will not be posted)
Comment title:
Comment:
 

Category Advertisements

Home  |  My ThomasNet News  |  Industry Market Trends  |  Submit Release  |  Advertise  |  Contact News  |  About Us
Brought to you by Thomasnet.com        Browse ThomasNet Directory

Copyright © 2009 Thomas Publishing Company
Terms of Use - Privacy Policy