October 2, 2008 -
Combining silicon drift detector with 45 kV X-ray tube and traceable Empirical Calibration, Model X-MET5100 enables light elements such as Mg, Al, and Si to be measured. X-MET5100 assures laboratory quality analysis of aluminum and titanium alloys, as well as copper, nickel, and steel. Restricted elements, lead in toys, contaminants in soil, and small concentrations in ores can be measured down to ppm level. Device is IP54 approved for dust and water splash protection.
Oxford Instruments launches a revolutionary hand-held XRF analyzer with Silicon Drift Detector
The new X-MET5100 X-ray fluorescence (XRF) analyzer takes hand-held analytical performance to a completely new level.
X-MET5100 combines Oxford Instrument's groundbreaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray tube. This cutting edge technology delivers fast, highly accurate measurement and enables light elements such as Mg, Al and Si to be measured without the need for complex vacuum pump or helium tank attachments - a truly huge step forward for hand-held X-ray fluorescence analysis.
PMI inspectors, scrap sorters and in particular the aerospace industry finally have the robust, XRF Light Element mobile testing tool they have been waiting for. The X-MET5100 assures laboratory quality analysis of Aluminum and Titanium alloys, as well as Copper, Nickel and Steel with Light Element capability and sensitivity that is unequalled.
The powerful combination of the SDD, 45 kV X-ray tube and traceable Empirical Calibration mean that X-MET5100 can accurately analyze and identify metal alloys in just 1 second. Restricted elements, lead in toys, contaminants in soil and small concentrations in ores can be accurately measured at speeds previously not possible. Trace element results, down to ppm level, can be achieved in just seconds. The unparalleled speed and accuracy of the X-MET5100 ensure high throughput for real-time results that can be trusted.
X-MET5100 compliments Oxford Instruments already highly successful X-MET5000 introduced for routine multi-element analysis. Both instruments are IP54 (NEMA 3) approved for dust and water splash protection and are built to withstand the harshest analytical conditions.
The X-MET5100 will be on show at the International Titanium Conference and Exhibition, Las Vegas, September 21-25, booth 315 and at the Aluminum World Trade Fair and Conference, Essen, Germany, 22-25 September, booth 1G11, Hall 1.
Oxford Instruments Industrial Analysis
OIIA offers a range of Analytical Instruments designed for demanding quality control applications. From materials analysis to thickness gauging, the Industrial Analysis products incorporate the latest in available technology, coupled with over 30 years of experience in designing, producing and supporting world class instruments.
X-MET handheld X-ray Fluorescence (XRF) analysers and our expanded range of ARC/Spark mobile Optical Emission Spectrometers (OES) are specifically designed for positive material identification, alloy analysis and the determination of hazardous materials for RoHS compliance. Our OES systems comprise: ARC-MET, FOUNDRY-MASTER, PMI-MASTER PRO, PMI-MASTER SORT, TEST MASTER.
Lab-X, Twin-X, ED2000 and MDX1000 XRF spectrometers span the price/performance range for routine chemical analysis. From Sulfur in petroleum products to the analysis of limestone, we can match exactly the correct spectrometer to your needs, as we offer the broadest range in the industry.
For thickness gauging applications we offer handheld magnetic and eddy current gauges to full function, high performance XR systems. Our X-Strata960 and X-Strata980 systems provide world-class performance for coating thickness measurement.
OIIA recently acquired WAS AG (Worldwide Analytical Systems), a leading German manufacturer and international supplier of Arc/Spark optical emission spectrometers and preparatory equipment used to analyse the chemical properties of metals. The acquisition forms part of our strategy to deliver added value and enhanced service to our customers.
Oxford Instruments plc
Oxford Instruments designs, supplies and supports high-technology tools, processes and solutions with a focus on physical science, bioscience, environmental and industrial research and applications. It provides solutions needed to advance fundamental nanoscience research and its transfer into commercial nanotechnology applications. Innovation has been the driving force behind Oxford Instruments' growth and success for over 40 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.
The first technology business to be spun out from Oxford University over forty years ago, Oxford Instruments is now a global company with over 1,300 staff worldwide and a listing on the London Stock Exchange (OXIG). Its objective is to be the leading provider of new generation tools and systems for the Physical Science and Bioscience sectors.
This involves the combination of core technologies in areas such as low temperature and high magnetic field environments, Nuclear Magnetic Resonance, X-ray electron and optical based metrology, and advanced growth, deposition and etching. Our products, expertise, and ideas address global issues such as energy, environment, terrorism and health and are part of the next generation of telecommunications, energy products, environmental measures, security devices, drug discovery and medical advances.
For further information, please contact
Sue Davenport,
Global Marketing Communications Manager
Oxford Instruments Industrial Analysis
Email: sue.davenport@oxinst.com
Analytical
Halifax Road
High Wycombe HP12 3SE UK
Tel: +44 (0) 1494 442255
Fax: +44 (0) 1494 461033
Email: analytical@oxinst.co.uk
Marketing:
Sue Davenport Global Marketing Communications Manager
USA E-mail this person Company Information: Name: Oxford Instruments Analytical Address: Halifax Road City: High Wycombe ZIP: HP12 3SE Country: United Kingdom Phone: +44 (0) 1494 442255 FAX: +44 (0) 1494 461033 http://www.oxford-instruments.com
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