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Wafer Loader can handle wafers as thin as 100 µm.


July 31, 2008 - Using chuck system to transfer wafers and featuring optimized arrangement of sensor beams, NWL200 Series Wafer Loader achieves reliable loading for inspection of semiconductors. Wafer-slot buttons on front panel enable users to select specific wafer in any slot with touch of a button, while large LCD screen allows operators to set conditions and check operating status. Users can also program recipes and backup data from any PC when loader is connected to LAN.

(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)

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Wafer Loader includes 14 in. monitor and keyboard.
Load Port handles 300 mm semiconductor wafers.


Nikon's New Wafer Loader NWL200 Series Is the First Ever Capable of Loading Wafers as Thin as 100 Micrometers


High Level of Safety and Reliability meets Requirements for Inspection of Next Generation Semiconductors

MELVILLE, N.Y., July 15 -- Accommodating a changing semiconductor manufacturing process where wafers continue to grow thinner, Nikon Instruments Inc., ( http://www.nikoninstruments.com/) announced its new wafer loader NWL200 Series, the first line-up of wafer loaders capable of loading wafers as thin as 100 micrometers. Using a new chuck system to transfer wafers, the NWL200 Series achieves highly-reliable loading suitable for inspection of next-generation semiconductors. Previous systems could not be counted on to safely load wafers thinner than 300 micrometers.

Thin wafers often undergo significant distortion in the cassette, making it necessary for the position sensors to be accurate to avoid damage by the arm. While this was difficult to do in the past, the optimized arrangement of the sensor beams in the NWL200 allows it to accurately detect the shape of the wafers in the cassette. Additionally, the optional edge-chipping detection function automatically detects wafer cracking. This enables macro inspections of all areas, adding to the support that was already available with earlier models.

"As advances in manufacturing processes have made wafers increasingly thin, safe wafer transfer has become essential, especially in the back-end microscope inspection process," said Mike Metzger, General Manager, Sales and Marketing, Nikon Instruments. "With the NWL200 Series, Nikon has provided a solution for ultra thin wafer transfer that meets the demands of the semiconductor industry, offering improved wafer-sensing functions that help companies optimize process yield."

Ergonomic efficiency has been designed into every aspect of the system. Operation keys and knobs are located within easy reach of the operator and the wafer cassette is positioned to help ease load/unload of the cassette. The overall efficiency of the wafer transfer reduces cycle time, achieving levels of throughput never seen before in any other system.

The NWL200 Series also offers outstanding operability features. New wafer-slot buttons on the front panel enable users to select a specific wafer in a slot with a touch of a button. At the same time, a large LCD screen allows operators to set conditions and check the operating status at a glance. Additionally, when the loader is connected to a LAN, users are able to program recipes and backup data from a PC.

ABOUT NIKON INSTRUMENTS INC.

Nikon Instruments Inc is a world leader in the development and manufacture of optical and digital imaging technology for biomedical and industrial applications. Now in its 90th year, Nikon provides complete optical systems that offer optimal versatility, performance and productivity. Cutting-edge instruments include microscopes, precision measuring equipment, digital imaging products and software. Nikon Instruments is the microscopy and digital imaging arm of Nikon Inc., the world leader in digital imaging, precision optics and photo imaging technology. For more information, visit www.nikoninstruments.com. Product-related inquiries may be directed to Nikon Instruments at 800-52-NIKON.

Source: Nikon Instruments

Web site: http://www.nikonusa.com/

http://www.nikoninstruments.com/


Contacts:

Public Relations:
Peppercom
Beth Starkin
USA
Phone: 212-931-6108
Send email  E-mail this person

Company Information:
Name: Nikon Inc.
Address: 1300 Walt Whitman Road,
City: Melville
State: NY
ZIP: 11747
Country: USA
Phone: 631-547-8500
FAX: 631-547-0306
http://www.nikonusa.com


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Digital SLR Camera combines speed and precision.
Inverted Materials Microscope optimizes digital imaging.
External Camera Flash offers ISO 200 guide number of 48/157.5.
Zoom Microscopes target industrial and OEM markets.
Auto-Focus Unit integrates with Eclipse LV microscopes.
Inspection Device detects variations in wafers.
D-SLR Camera features 12.1 megapixel FX-format CMOS sensor.
Camera Lenses offer perspective control.

Other News from this company:
Nikon Small World Entry Deadline Is April 30th
Nikon Instruments Partners with Koshland Science Museum to Create the Museum's First-Ever 'Microbe Lab'
Mr. Yoshinobu Ishikawa Appointed President and CEO of Nikon Instruments Inc.
Nikon® Introduces the Affordable New 55-200mm f/4-5.6G IF-ED AF-S DX VR Zoom-Nikkor Lens with Vibration Reduction
Nikon's Most Technologically Advanced Compact Digital Camera Ever! New 7.1 Megapixel COOLPIX S7c
New Industrial Dealer Announcement: Top Nikon Dealer Is Expanding to Texas
Nikon Introduces the New Digital Sight L2 and U2 Series of Camera Heads and Control Units
Brilliant New Nikon Coolpix Style Series Adds in-Camera Slideshows with Your Music, and a Beautiful Wave Design
Nikon Introduces All-New Capture NX Software
Nikon Unveils New Web Portal for Confocal Microscopy
Nikon Delivers New Accessories for the Eclipse 80i
Nikon Introduces COOLSCOPE LOW-MAG Low Magnification for a Wider Field of View
Nikon Announces LiveScan Next Generation Swept Field Confocal Microscope
Nikon Delivers True Spectral Imaging with Digital Eclipse C1si
Nikon Eliminates Focus Drift in Live Cell Microscopy with the New TE2000-PFS
Nikon's New DXM1200C Digital Photomicrographic Camera Captures Ultra Low Light Images



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