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High Resolution SEM is suited for scientists and engineers.
High Resolution SEM is suited for scientists and engineers.

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High Resolution SEM is suited for scientists and engineers.


July 18, 2008 - With optional environmental enclosure to isolate instrument from thermal and acoustic interferences, Magellan XHR SEM enables rapid 3D surface imaging at different angles and at resolutions below 1 nm. Magellan 400 is optimized for scientific research, while Magellan 400L is optimized for semiconductor labs. Magellan 400L has load-lock feature that speeds-up sample throughput, and includes retractable solid state backscatter electron detector and S2 compliance kit.

(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)

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Microscope is designed for electrophysiological experiments.
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FEI Introduces New Category of Extreme High Resolution Scanning Electron Microscopy


New Magellan SEM First to Enable Rapid 3D Surface Imaging at Sub-Nanometer Resolution

Hillsboro, Ore./July 7, 2008; With its announcement today of the Magellan(TM) Family, FEI Company (Nasdaq: FEIC) introduced a new class of instruments called extreme high-resolution scanning electron microscopes (XHR SEMs). The Magellan XHR SEM allows scientists and engineers to quickly see things they could not see before, such as 3D surface images at many different angles and at resolutions below one nanometer (about the size of ten hydrogen atoms, side-by-side). Most importantly, the Magellan XHR SEM images samples at very low beam energies, avoiding distortions otherwise caused by the beam penetrating into the material below.

"The Magellan XHR SEM is the most significant electron optics innovation since FEI introduced the Titan(TM) Family three years ago," said Dr. Rob Fastenau, FEI's executive vice president, marketing and technology. "Magellan is in a class by itself, just as Titan is for transmission electron microscopes, and our innovative Helios NanoLab(TM) family is for DualBeam(TM) systems. Magellan is the only family of instruments to make sub-nanometer resolution accessible in a practical sense to non-experts and without restriction on samples-constraints that have previously limited the utility and acceptance of other systems. As the performance benchmark in its category, Magellan is another demonstration of FEI's deep commitment to being the leading innovator of high-performance solutions in all of our markets."

Sub-nanometer resolution has critical value in scientific research and industrial R&D. In addition, it is an absolute requirement in process development, monitoring and control applications in advanced semiconductor manufacturing. The Magellan Family extends this capability to applications that were previously impossible or impractical with conventional SEM, transmission electron microscope (TEM) or focused ion beam (FIB) systems.

For example, the ability to provide sub-nanometer resolution over a broad range of beam energies, from less than one kilovolt (kV) to 30kV, allows semiconductor manufacturers to see critical detail on complex three-dimensional structures in 32nm nodes and below, with unprecedented clarity and contrast. Researchers in materials science will now have the ability to generate high-resolution, surface-sensitive images of carbon nanotubes, nanowires and catalysts without the image distortions caused by electrical charging from higher energy electron beams. Across the board, the Magellan Family extends the range of nanoscale imaging and analysis, with the speed and ease-of-use of traditional SEMs.

The Magellan Family's performance derives from the integration of new electron optical elements, proprietary electron gun technology, a highly accurate five-axis piezo-ceramic stage and high stability platform with fully configurable analytical chamber. The stage readily accommodates large samples or multiple smaller samples, while providing fast, accurate navigation and unequaled stability.

The Magellan Family comes in two models: The Magellan 400 is optimized for scientific research while the Magellan 400L is optimized for semiconductor labs. The semiconductor lab model comes with a load-lock feature that speeds-up sample throughput, and includes a retractable solid state backscatter electron detector (SSBSED) and S2 compliance kit. Both models have an optional, full environmental enclosure to isolate the instrument from thermal and acoustic interferences, ensuring peak performance while relaxing site requirements and facility preparation costs. The Magellan Family is available for purchase now, with initial shipments planned to begin in September 2008.

About FEI Company
FEI (Nasdaq: FEIC) is the world leader in pioneering technologies and applications that deliver imaging solutions for 3D characterization, analysis and modification/prototyping with resolutions down to the sub-Angstrom level. Our customers, working in advanced research and manufacturing, are supported by field-experienced applications specialists. They have open access to FEI's prestigious global user network so they can succeed in accelerating nanoscale discovery and contribute to better living through new product commercialization. FEI's NanoPorts in North America, Europe and Asia provide centers of technical excellence where our world-class community of customers and specialists collaborate on the ongoing development of new ideas and innovative solutions. FEI has sales and service operations in more than 50 countries around the world. More information can be found at: www.fei.com.


Contacts:

Public Relations:
MindWrite Communications, Inc.
Sandy Fewkes
USA
Phone: 408-224-4024
FAX: 408-224-4024
Send email  E-mail this person

Company Information:
Name: FEI Company
Address: 5350 NE Dawson Creek Dr.
City: Hillsboro
State: OR
ZIP: 97124
Country: USA
Phone: 503-726-7500
FAX: 503-726-7509
http://www.feicompany.com


More New Product News from this company:
Direct Electron Detector handles beam-sensitive materials.
Electron Microscope targets semiconductor manufacturing.
Microscopy System analyzes full wafers up to 300 mm.
Automated System measures micro- and nano-fibers.
SEM can be used with wide range of samples.
Scanning Electron Microscope offers sub-nanometer resolution.
Software Package automates strain analysis.
Automated Analyzer optimizes mineral processing operations.
Electron Microscope is offered with electron source module.

Other News from this company:
FEI Adds Dual-Axis Automation to Leading Electron Tomography Solution for Life Science Research
FEI Connectivity Solutions Improve and Accelerate TEM Imaging for Semiconductor Manufacturing
FEI Opens China NanoPort
FEI Annouces Joint Research Program with the FOM Foundation
First Titan(TM) S/TEM Installed in Sweden
FEI Introduces FEI.com for Owners Featuring FEI Connect
Team Project Achieves Microscopy Breakthrough
FEI Unveils World's First Table-Top Scanning Electron Microscope for Advancing Science Education
California Nanosystems Institute at UCLA Selects Three Fei Systems
FEI Expands Helios Nanolab(TM) Family for Semi Market
FEI Receives $11.5 Million Order from Technical University of Denmark
FEI Company Sells Knights Technology Unit to Magma
University of Ulster Opens FEI Center For Advanced Imaging
Imperial College London Unveils UK's First Titan (TM) S/TEM
Mexico's IMP Opens New Microscopy Center With FEI Tools
FEI Company and Malvern Instruments Team
FEI Receives Titan(TM) Order from Japanese Steelmaker
FEI's Titan(TM) S/Tem Achieves Low KV Milestone
Don R. Kania Named President and Chief Executive Officer of FEI Company
FEI Launches Certified Tools Program Globally



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