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Memory Tester supports up to 256 DDR3 devices.


August 5, 2009 - Offering parallel test capability of up to 256 devices, T5503 8448 Channel Test Head is able to test DDR3-SDRAM, GDDR3, and GDDR4 devices and more at test speeds upt to 3.2 Gbps. It is compatible with M6242 Dynamic Test Handler, providing solution for high-volume back-end testing. Optional pin card enables use with stacked DRAM.

 See related product stories
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Advantest Launches Expanded-Capacity T5503 Memory Test System


Advantest's New DDR3 Memory Test System Configuration Offers Industry's Highest Throughput, 256-DUT Parallel Test Capacity

SANTA CLARA, CA, May 29, 2009 - Advantest Corporation (TSE: 6857, NYSE: ATE), a leading supplier of automatic test equipment (ATE) to semiconductor manufacturers worldwide, today announced availability of its new, expanded configuration T5503 high-speed memory test system, boasting the industry's highest parallel test capability of up to 256 DDR3 devices - double that of the previous model. The expanded configuration test system, known as the T5503 8448 Channel Test Head, is currently shipping.



High-Speed Memory Providers Demand High-Speed Test Equipment
Broadband communications are now widely used in households and businesses throughout the globe and expectations are growing for higher quality and larger capacity applications including video, audio, and on-line content. The demand for low-power, very high-speed memory to drive these applications is prompting the near-term transition from DDR2-SDRAM to DDR3-SDRAM. DDR3's increased performance, coupled with lower power requirements, promise to measurably enhance the capabilities of equipment such as PCs, notebooks and servers, as well as advanced consumer products such as game consoles and HDTV.

Accompanying this shift to DDR3-SDRAM is a corresponding requirement from device manufacturers for higher-speed and more accurate test capabilities, and an insistence on lowered costs for mass production of these new high-speed devices. Advantest's T5503 8448 Channel Test Head addresses these needs, delivering superior throughput and lowered test costs for high-speed manufacturing.

The new, expanded configuration of the T5503 reinforces Advantest's market leadership in the memory test solution arena by delivering a massively parallel 256 DUT test capacity and the industry's highest uptime and utilization. Coupled with Advantest's M6242 handler the T5503 provides a DDR3 test cell that delivers both performance and yield as well as lowest cost of volume production test.

Features and Benefits

(1) Parallel test of up to 256 DDR3-SDRAM devices

The T5503 8448 Channel Test Head doubles the parallel test capacity of the earlier model T5503, making it an ideal test solution for volume production of high-speed memory.

(2) Compatible with M6242 Dynamic Test Handler

Its compatibility with Advantest's most advanced test handler, the M6242, makes the T5503 part of a total solution for high-volume back-end test.

(3) Optional configuration enables 256-DUT parallel test capacity for stacked DRAM

Bare-die stacking technology significantly increases the pin count of DDR3-SDRAM devices. An optional pin card is available for the expanded T5503 that preserves its 256-DUT parallel test capacity even for stacked high-speed DRAM.

Specifications

T5503

Target Test Devices: DDR3-SDRAM, GDDR3, GDDR4, etc.

Parallel Test Capacity: Max. 256 DUTs

Maximum Test Speed: 3.2Gbps

Further Inquiries

Enquiries should be directed to the Sales Promotion Department at 81-3-3214-7500

About Advantest

Advantest Corporation is the world's leading automatic test equipment supplier to the semiconductor industry, and also produces electronic instruments and systems. A global company, Advantest has long offered total ATE solutions, and serves the industry in every component of semiconductor test: tester, handler, mechanical and electrical interfaces, and software. Its logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor production lines in the world. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. Among them, Advantest America, Inc. is based in Santa Clara, CA., Advantest Europe GmbH is based in Munich, Germany, and Advantest Taiwan Inc. is based in Hsinchu, Taiwan. More information is available at http://www.advantest.com/

Company Information:
Name: Advantest America Corp.
Address: 3201 Scott Blvd.
City: Santa Clara
State: CA
ZIP: 95054
Country: USA
Phone: 408-988-7700
FAX: 408-987-0691
http://www.advantest.com


More New Product News from this company:
Memory Test System offers 768 DUT parallel test capacity.
DDR3 Test System has 256 DUT parallel test capacity.
Test System targets analog IC with up to 32 pins.
Memory Test System offers speeds of 266 MHz/533 Mbps.
RF Test Cell System offers scalability to 128 RF ports.
LCD Panel IC Tester is optimized for throughput and accuracy.
Mixed-Signal Test System targets automotive device market.
Dynamic Test Handler speeds DRAM production.
Memory Test System addresses high-volume DDR3-SDRAM devices.

Other News from this company:
Advantest's Integrated SoC Tester/Handler Test Cell Wins 2008 Best in Test Award
Advantest Demonstrates Comprehensive New Integrated Test Cell Solution for High-Volume Consumer Market SoCs at Semicon West
Advantest and Wavecrest Co-Develop Jitter Analysis Tool for Test of Complex Internet IC Technology
Advantest Showcases T2000 Open Architecture SoC Test Solutions at Semicon West; Introduces Industry's First High Performance, Low Cost Mixed-Signal Test Module



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