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Software aids XRF spectrometer-based, standardless analysis.
March 25, 2009 -
As SuperQ software suite module, Omnian standardless analysis package is designed to be used with Axios sequential XRF spectrometer. It is intended for characterization and analysis of unknown samples or situations where certified standards that match specific sample characteristics are not available. Adaptable solution provides multiple problem-solving capabilities that deal with sample quantification, screening and failure analysis, as well as comparison.
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Panalytical Launches Omnian: the New Benchmark for Standardless Analysis
PITTCON 2009 (8-13 March, Chicago, USA) will see the launch of PANalytical's new standardless analysis package, Omnian. This latest module in the company's proven SuperQ software suite is designed to be used with the Axios sequential X-ray fluorescence (XRF) spectrometer.
Omnian provides the ideal answer for characterization and analysis of unknown samples, or in situations where certified standards that match specific sample characteristics are not available.
Omnian can handle a wide variety of sample types such as solids, pressed powders, fused beads, loose powders and liquids. The software is adaptable, depending on user experience or the desired mode of operation. With its problem-solving power it deals with analytical challenges including sample quantification, screening and failure analysis, as well as the comparison of different materials.
Omnian is set to become the new benchmark in these important applications. It is designed to provide fast, reliable quantification in the default 'black box' mode. However, the data collected is comprehensive and can be reviewed more extensively.
The system adjusts automatically to sample and matrix effects as well as sample thickness, volume and 'Dark-Matrix' composition. It can be fine-tuned for increased accuracy by using Adaptive Sample Characterization (ASC).
Omnian is supported by PANalytical's worldwide network of support and service specialists. For more information, visit www.panalytical.com/omnian
About PANalytical
PANalytical is the world's leading supplier of analytical instrumentation and software for X-ray diffraction (XRD) and X-ray fluorescence spectrometry (XRF), with more than half a century of experience. The materials characterization equipment is used for scientific research and development, for industrial process control applications and for semiconductor metrology.
PANalytical, founded in 1948 as part of Philips, employs around 1000 people worldwide. Its headquarters are in Almelo, the Netherlands. Fully equipped application laboratories are established in Japan, China, the USA, and the Netherlands. PANalytical's research activities are based in Almelo (NL) and on the campus of the University of Sussex in Brighton (UK). Supply and competence centers are located on two sites in the Netherlands: Almelo (development and production of X-ray instruments) and Eindhoven (development and production of X-ray tubes). A sales and service network in more than 60 countries ensures unrivalled levels of customer support.
The company is certified in accordance with ISO 9001:2000 and ISO 14001.
The product portfolio includes a broad range of XRD and XRF systems and software widely used for the analysis and materials characterization of products such as cement, metals and steel, nanomaterials, plastics, polymers and petrochemicals, industrial minerals, glass, catalysts, semiconductors, thin films and advanced materials, pharmaceutical solids, recycled materials and environmental samples.
Visit our website at www.panalytical.com for more information about our activities.
PANalytical is part of Spectris plc.
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User comments about this story
EXPLANATION ON STANDARDLESS ANALYSIS IN XRF SPECTR
I really wish and will appreciate if you could explain in details how standardless analysis coul be achieved in XRF spectrometers
By ADEBAYO ALEGBEMI on Jul 14, 2009 12:20
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