January 6, 2009 - Using Magellen(TM) extreme high-resolution SEM, scientists and engineers can see 3D surface images at many different angles and at resolutions below 1 nm. Unit images samples at low beam energies, avoiding distortions otherwise caused by beam penetrating into material below.

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FEI Presents New Extreme High Resolution Scanning Electron Microscope at Pittcon 2009

FEI extends SEM to applications that were previously impossible or impractical

FEI's new Magellan(TM) extreme high-resolution scanning electron microscope (XHR SEM) allows scientists and engineers to quickly see 3D surface images at many different angles and at resolutions below one nanometer (about the size of ten hydrogen atoms, side-by-side). Most importantly, the Magellan XHR SEM images samples at very low beam energies, avoiding distortions otherwise caused by the beam penetrating into the material below.

FEI delivers the most innovative solutions for imaging, characterization and prototyping at the nanoscale. The company's most advanced TEM, SEM, and DualBeam(TM) solutions were created specifically for materials science, life science, and mining. Please visit FEI at Pittcon 2009 in booth 1642 to learn more about the Magellan and other high-resolution microscopy techniques.

Company Information:
Name: FEI Company
Address: 5350 NE Dawson Creek Dr.
City: Hillsboro
State: OR
ZIP: 97124
Country: USA
Phone: 503-726-7500
FAX: 503-726-7509
http://www.feicompany.com

More New Product News from this company:
	Direct Electron Detector handles beam-sensitive materials.
	Electron Microscope targets semiconductor manufacturing.
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	Automated System measures micro- and nano-fibers.
	SEM can be used with wide range of samples.
	Software Package automates strain analysis.
	Automated Analyzer optimizes mineral processing operations.
	Electron Microscope is offered with electron source module.
	High Resolution SEM is suited for scientists and engineers.

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Scanning Electron Microscope offers sub-nanometer resolution.

FEI Presents New Extreme High Resolution Scanning Electron Microscope at Pittcon 2009

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