Benchtop XRF System suits PCB WEEE/RoHS applications.
November 18, 2008 -
XRay ComPact eco Benchtop XRF system provides non-destructive measurement of total Pb, Hg, Cr, Br, and Cd in materials. XRF spectrometers can be configured with gas-proportional, Si-PIN, or Silicon Drift type detectors and primary beam filtration. System provides Pb sensitivity and measurement confidence required at 1,000 ppm action level. Mechanical or optical X-ray beam collimation, in conjunction with video camera alignment, allows confirmation of specific analysis areas and features.
Matrix Metrologies Introduces New XRF Tool for Printed Circuit Board WEEE/RoHS Applications
HOLBROOK, NY - September, 2008 - Matrix Metrologies, Inc., a supplier of film measurement equipment, introduces a new line of XRF tools for Compliance Testing and Monitoring of prohibitive metals for the EU directives RoHS/WEEE for the Circuit board and packaging electronics and Plating industries. The new XRay ComPact eco Benchtop XRF system provides non-destructive measurement of total Lead ( Pb), Mercury ( Hg), Chromium (Cr), Bromine (Br), and Cadmium (Cd) in almost any material and allow for lead content quantification for reverse RoHS applications including military and aerospace demands requiring 2-5 % minimum lead content. In addition, Matrix offers certified reference standards that can be used for tool audit and measurement integrity management. The new XRF tools can also measure the standard Circuit and packaging applications including Au/Ni/Cu, Immersion coatings of Au, Ag and Sn, Matte Sn, Sn-Pb on leads pads and bumps, and gold electro less nickel stacks.
Matrix XRF spectrometers can be configured with gas-proportional, Si-PIN, or Silicon Drift type detectors and primary beam filtration to provide rapid, non-destructive verification of RoHS Pb-free compliance providing the Pb sensitivity and measurement confidence required at the 1000-ppm action level, as well as, the precise determination of eutectic levels of Pb when specified. Mechanical or Optical X-ray beam collimation in conjunction with video camera alignment allows confirmation of specific analysis areas and features.
The Matrix RoHS analyzer is part of Matrix Metrologies complete family of handheld and benchtop x-ray fluorescence thickness and composition and WEEH/RoHS compliance testing measurement tools.
Matrix Metrologies, headquartered in Holbrook, New York, is a supplier of X-ray measurement equipment and services used for film thickness and composition measurement, restricted element concentration determination for WEEH/RoHS compliance testing of hazardous substances, trace element and bulk element composition measurement and molecular identification of crystalline substances commonly employed in the metal finishing, microelectronics and pharmaceutical industries. Matrix offers over twenty five years experience in metrology analysis, XRF instrumentation recertification and repair and supplies a complete line of NIST traceable calibration standards and recertification services.
General Information:
Frank Reilly
USA
Phone: 631-472-2400
FAX: 631-472-2424 Company Information: Name: Matrix Metrologies, Inc. Address: 101-5 Colin Dr. City: Holbrook State: NY ZIP: 11741 Country: USA Phone: 631-472-2400 FAX: 631-472-5661 http://www.matrixmetrologies.com
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