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Test Socket Contact features self-cleaning design.
Test Socket Contact features self-cleaning design.

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Test Socket Contact features self-cleaning design.


October 21, 2008 - Suited for testing QFNs, MLFs, and other leadless devices, Synergetix Dyno Contact(TM) features monolithic design, which scrubs across surface of device lead, penetrating contaminants through hundreds of thousands of insertions. Unit is plated with Endura Plating process, which offers resistance to intermetallic contamination. Contact provides 500,000 mechanical life cycles and contact resistance under 20 mW when tested against matte-tin device.

(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)

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 See more related product stories:
Burn-in Sockets are designed for devices up to 6.5 mm2.
Interposers suit wafer-level chip scale package testing.
Contacts can handle temperatures of -65 to 400°C.
BGA Socket has cycle life of 500,000 insertions.
Test Sockets accommodate devices with pitches down to 0.3 mm.
BGA Socket accommodates devices up to 6.5 mm².
SFF Stamped Contact features life cycle of 3,000 operations.
Test Socket is designed for devices up to 13 sq mm.
Center Probe Test Socket handles devices up to 13 mm².
Contact suits single and multi-mode fiber applications.
Clamshell Burn-In Socket accommodates QFN packages.
RF Sockets suit devices with pitches as low as 0.40 mm.
Double-Sided Press-Fit Contacts suit mezzanine applications.
Contacts suit high-speed interconnect applications.
Test Socket suits devices from 28 to 40 mm².
Thermocouple Contacts are used with D-subminiature connectors.
IC Socket tests high-speed devices.
Medical Connector Contacts offer current ratings from 3-30 A.
Test Socket suits devices from 28-40 mm².
Test and Burn-In Socket suits applications up to 1 GHz.


IDI Introduces Synergetix® Dyno(TM) Contact for QFN Testing


KANSAS CITY, KS - Interconnect Devices Inc., the world's leading manufacturer of spring contact probes, test sockets, and custom interconnect solutions announces the official release of the patent pending Synergetix Dyno(TM) Contact for the test of QFNs, MLFs, and other leadless devices.

The Dyno test socket employs an innovative wiping contact design that ensures low and consistent contact resistance and higher first pass yields in even the harshest and most demanding applications. This contact design marks a new milestone at IDI in the QFN market and will revolutionize the testing of leadless devices.

The key advancement of this new contact is its monolithic design which scrubs across the surface of the device lead, penetrating even the most tenacious contaminants through hundreds of thousands of insertions. Because of its design, the contact is nearly self-cleaning, requiring only minimal intervention over its long cycle life.

The Dyno(TM) Contact, now available for use in Synergetix Test Sockets, features several other significant benefits including;

- Contacts plated with IDI's Endura Plating process known for resistance to intermetallic contamination in lead free device testing.

- The Contacts compatible with most existing offset load boards.

- IDI's flagship 101267 probes can be utilized as a ground pad in the center of the device for testing requirements.

- Contact resistance constantly under 20 mW when tested against a matte-tin device.

- Mechanical life cycles of 500,000.

- The Dyno's unique design prevents board scrub damaging test boards.

"The patent pending Dyno Contact is a revolutionary breakthrough in high-performance QFN testing and its reliability will be unmatched, " stated Mike Kirkman, President and CEO.

IDI is a leader in the design and manufacture of custom interconnects including high performance test sockets for the semiconductor industry and product connectors for the medical, military, aerospace, and telecommunications industries. For more information contact IDI at (913) 342-5544, visit our website at www.idinet.com (for probes and connectors) or www.synergetix.com (for test sockets).

Company Information:
Name: Interconnect Devices, Inc.
Address: 5101 Richland Ave.
City: Kansas City
State: KS
ZIP: 66106
Country: USA
Phone: 913-342-5544
FAX: 913-342-7043
http://www.idinet.com


More New Product News from this company:
Interposers suit wafer-level chip scale package testing.
Long Stroke Probes are designed for optimal accuracy.

Other News from this company:
IDI Publishes New Brochure on Synergetix Brand Test Sockets
Medical Contacts and Connectors for Harsh Environments to Be Presented at the MD&M Show
IDI Publishes New Coaxial Probes Catalog
IDI Web Site Honored in Awards Competition
New Catalog Features Spring Probe Battery Contacts



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