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Electron Backscatter Detector tests diffration levels.
July 31, 2008 -
Able to obtain orientation mapping data using EDAX OIM software at rates up to 150 indexed patterns/sec, DigiView IV can also be used for phase identification using Genesis and Delphi software applications. Detector uses bellows-based insertion and retraction system for operation while under vacuum and for live-imaging. Features include orientation mapping and calculations, including crystal orientation, phase analysis, as well as grain size and boundary information.
(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.) |
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EDAX Launches Latest Generation of Electron Backscatter Diffraction Detectors
DigiView IV Broadens EDAX Portfolio of X-Ray Microanalysis Instruments
MAHWAH, NJ - EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has launched the DigiView IV, the latest generation electron backscatter detector (EBSD).
"The DigiView IV is designed to serve a wide range of EBSD applications," explains Del Redfern, Manger of Product Marketing for EDAX. "It can obtain orientation mapping data using EDAX's proprietary OIM software at rates up to 150 indexed patterns per second, with improved sensitivity and contrast. It also can also be used for Phase Identification using the Genesis and Delphi software applications and produce high-resolution images.
"The DigiView IV is the perfect complement to our market-leading OIM software, bringing all of the advanced features of orientation mapping and calculations, including crystal orientation, phase analysis along with grain size and boundary information to the materials characterization scientist," adds Redfern.
"The DigiView IV fits seamlessly into the EDAX family of materials characterization tools, effortlessly integrating with our market-leading EDS detectors and our technology-leading WDS systems," he notes.
"The DigiView IV detector uses a bellows-based insertion and retraction system for operation while under vacuum and for live-imaging for maximum vacuum and system integrity," concludes Redfern.
EDAX is the acknowledged leader in Energy Dispersive Microanalysis, X-ray Fluorescence and Electron BackScatter Diffraction instrumentation. It designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.
Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.
EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with 2007 sales of more than $2.1 billion.
For further information about EDAX, contact us at:
EDAX
91 McKee Drive, Mahwah, NJ 07430
Tel: (201) 529-4880 · Fax: (201) 529-3156
E-mail: info.edax@ametek.com
Website: www.edax.com
Company Information:
Name: EDAX, Inc.
Address: 91 McKee Drive
City: Mahwah
State: NJ
ZIP: 07430
Country: USA
Phone: 201-529-4880
FAX: 201-529-3156
http://www.edax.com
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