RF Production Probe Card utilizes membrane probe technology.
April 9, 2008 -
Designed to aid in high-volume wafer testing of RF filters and switches for mobile handsets, 20 GHz P30 Pyramid Probe card has scalable architecture and is sized to enable multi-site testing. Solution's lithographic probes alleviate uncontrolled impedance and Microscrub(TM) creates small scrub mark that minimizes material displacement. Applications include multi-die testing for RF wireless, high-speed digital in SiPs, SOCs, and leading edge parametrics.
Cascade Microtech's New P30 Pyramid Probe® Production Probe Card Lowers Cost of High-Volume Wafer Testing of RF Switches and Filters
BEAVERTON, Ore., April 2, 2008 -- To address the critical need to reduce the cost of high-volume testing of RF devices for the mobile handset market, Cascade Microtech introduced today a new Pyramid Probe card that brings high performance RF production test capability with over 50 percent cost of ownership savings over current approaches.
Cascade Microtech's new 20 GHz P30 Pyramid Probe card lowers semiconductor manufacturers' cost of high-volume wafer testing of RF filters and switches by offering superior probe performance and longer life at a lower cost. Using unique membrane probe technology, Pyramid Probe cards assure semiconductor manufacturers of higher yields, lower maintenance and minimal down time, resulting in lower overall cost of ownership.
"Paced by the explosive wireless infrastructure build-out in developing countries and widespread proliferation of wireless devices, RFIC production -- especially for filters and switches -- is growing at a rapid rate. Our customers look to Cascade Microtech to help them compete in this highly cost-sensitive marketplace," said Geoff Wild, chief executive officer, Cascade Microtech. "In today's ever-changing economic environment, reducing the cost of test for these critical cell phone components is of great value to our customers."
Using Cascade Microtech's exclusive Pyramid Plus(TM) membrane manufacturing process, the P30 brings unmatched performance to the market for low pin-count RF devices at a reduced cost of ownership. Unlike other probe technologies, the P30's lithographic probes are highly accurate, alleviating uncontrolled impedance that is characteristic of other probe types, and their compact size enables multi-site testing. With the lowest contact resistance of any probe card, customers using the Pyramid Probe Technology report up to five percent better device yields.
Less accurate needle and spring probes require the device manufacturer to design undesirably large IC pads to accommodate a large scrub area, resulting in excess capacitance. The P30's patented Microscrub(TM) creates a smaller scrub mark, reducing the material displacement by 15 times, causing a dramatic reduction in particles created during wafer testing. Needle probes also need regular realignment, resulting in down-time during production testing. The P30 Pyramid probes never need to be realigned.
Scalable architecture
Incorporating a scalable architecture to support testing from low pin-count filters to high pin-count multi-port RF System-on-Chips (SOC) applications, the Pyramid Plus architecture provides a roadmap for future applications. Configurations ranging from single device to multi-DUT (Device Under Test) improve test cell efficiency, further reducing the overall cost of testing.
Pricing and availability
The P30 Pyramid Probe card for RF filter and RF switch test is available for order immediately. Current delivery time is four weeks for re-orders. Volume pricing is available.
About Pyramid Probe Cards
Pyramid probe cards are rugged, robust, and well suited for the rigors of high-performance production wafer sort. Industry-leading signal integrity and mechanical alignment capabilities make Pyramid probe cards the perfect fit for multi-die testing for RF wireless, high-speed digital in SiPs, SOCs and leading edge parametrics.
About Cascade Microtech
Cascade Microtech, Inc. (NASDAQ:CSCD) is a worldwide leader in the precise electrical measurement and test of integrated circuits (ICs) and other small structures. For technology businesses and scientific institutions that need to evaluate small structures, Cascade Microtech delivers access to, and extraction of, electrical data from wafers, integrated circuits (ICs), IC packages, circuit boards and modules, MEMS, biological structures, electro-optic devices and more.
Cascade Microtech's leading-edge semiconductor production test consumables include unique probe cards and test sockets that reduce manufacturing costs of high-speed and high-density semiconductor chips. Information about Cascade Microtech can be found on the Web at http://www.cascademicrotech.com/.
CONTACT: Debra Seifert of McClenahan Bruer Communications, +1-503-546-1000, debra@mcbru.com, for Cascade Microtech, Inc.; or Cali Sartor of Cascade Microtech, Inc., +1-503-601-1000, cali_sartor@cmicro.com
Contacts:
Public Relations:
McClenahan Bruer Communications
Debra Seifert
USA
Phone: 503-546-1000 E-mail this person
General Information:
Cali Sartor
USA
Phone: 503-601-1000 E-mail this person Company Information: Name: Cascade Microtech Inc. Address: 2430 N.W. 206th Ave. City: Beaverton State: OR ZIP: 97006 Country: USA Phone: 800-854-8400 FAX: 503-601-1010 http://www.cmicro.com
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