Archive News Story
(Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
XRF Imaging Microscope offers 10 µm resolution.
June 8, 2007 -
Featuring motorized XYZ control, XGT Series can detect and quantify concentrations in order of 50-100 ppm. SmartMap software allows full hyperspectral imaging to be configured and run. At each pixel of XRF image, full spectrum is acquired and stored, providing instant access to complete elemental information across sampling region. Modules such as auto peak labeling, spectral searching, FPM and calibrated quantification, phase analysis, and report generation are provided.
Archive Press Release
(Products mentioned in this Archive Press Release may or may not be available from the manufacturer.)
Release date: May 16, 2007
XGT Series XRF Imaging Microscope with 10 µm Resolution
HORIBA Jobin Yvon is pleased to offer the XGT series of x-ray fluorescence (XRF) microscopes, featuring improved sensitivity, motorised XYZ control, vacuum options and a new dedicated acquisition and analysis software package.
XRF microscopy has been widely embraced for elemental analysis in applications as broad as forensic science, pharmaceutics, geology, museums, archaeology, electronics and life sciences. These fields benefit from non-destructive elemental analysis and imaging, with ultra-narrow spot sizes allowing qualitative and quantitative characterisation of particles and features down to less than 10 µm in size.
Revised coupling between the x-ray generator and mono-capillary x-ray guide tubes provides up to twice the sensitivity previously possible, enabling concentrations in the order of 50-100 ppm to be routinely detected and quantified. In addition, the new full vacuum chamber option offers a three fold enhancement in sensitivity for the light elements (Na to S).
The new SmartMap software builds on the easy experiment set up of the previous platform, but now allows full hyperspectral imaging to be quickly configured and run. At each and every pixel of the XRF image a full spectrum is acquired and stored, providing instant access to complete elemental information across the sampling region. Elemental images can be generated post-acquisition and adjusted at will, ensuring that the potential of this information rich data cube can be fully harnessed.
This intuitive software leads the user through project set up, experiment configuration, acquisition and data analysis, and modules such as auto peak labelling, spectral searching, FPM and calibrated quantification, phase analysis and report generation are easily accessed.
The XGT series XRF microscope technical performance is unrivalled, and yet is complemented by the most accessible software available.
For more information, please contact Dina Murphy, Sales and Marketing Administrator
MµA Division, HORIBA Jobin Yvon, Inc., 3880 Park Ave, Edison, NJ, 08820, USA
(732) 494-8660, E-mail: dina.murphy@jobinyvon.com, Web: www.jobinyvon.com/microanalysis
Contacts:
Sales:
Dina Murphy Sales and Marketing Administrator
USA
Phone: 732-494-8660 E-mail this person Company Information: Name: Horiba Jobin Yvon Inc. Address: 3880 Park Avenue City: Edison State: NJ ZIP: 08820 Country: USA Phone: 732-4948660 FAX: 732-49-5125 http://www.jobinyvon.com
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