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Field Emission Gun suits 3D research and development.


March 5, 2007 - Eliminating boundaries imposed by existing high vacuum systems, DualBeam(TM) Quanta(TM) 3D FEG features high-current ion column for rapid, site-specific cross-sections of samples to reveal sub-surface structures and features. System's electron source optimizes SEM imaging, while electron beam current enables high throughput spectroscopy.

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Electron Microscope combines high resolution and analysis.
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Microscopy System analyzes full wafers up to 300 mm.
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 See more related product stories:
Automated System measures micro- and nano-fibers.
SEM can be used with wide range of samples.
Scanning Electron Microscope offers sub-nanometer resolution.
Electron Microscope is offered with electron source module.
High Resolution SEM is suited for scientists and engineers.
Microscope enables chemical research at the atomic scale.
Electon Microscope offers up to 100 kV accelerating voltage.
SEM offers advanced defect monitoring capabilities.
S/TEM System offers sub-Angstrom imaging capabilities.
Scanning Electron Microscope handles broad range of samples.
Microscope bridges optical and scanning electron microscopy.
Microscope and Software facilitate mineral processing.
FIB/SEM Systems are designed for semiconductor labs.
FIB/SEM System offers nanoscale imaging and analysis.
Electron Microscope has all-digital design.
Electron Microscope offers nanoscale analysis of samples.
CD-SEM is suited for critical dimension metrology.


FEI Announces New FIB/SEM DualBeam - Quanta 3D FEG


HILLSBORO, Ore./February 21, 2007- FEI Company (NASDAQ: FEIC) today released a powerful analytical DualBeam(TM) for advanced 3D research and development, the Quanta(TM) 3D FEG. Combining FEI's latest advances in ion and electron optics and the unique environmental SEM technology of FEI's Quanta family of products, the new system eliminates the boundaries imposed by traditional high vacuum systems. The Quanta 3D FEG expands FEI's range of DualBeam solutions for NanoResearch and Industry, NanoBiology and NanoElectronics.

The advances incorporated in the Quanta 3D FEG provide users with new levels of versatility and flexibility. The system features FEI's high current ion column for rapid, site-specific cross-sections of samples to reveal sub-surface structures and features while the system's advanced electron source design delivers improved SEM imaging. Further, increased electron beam current enables higher throughput spectroscopy.

"While the Quanta 3D FEG expands our customers' boundaries in NanoResearch it also opens new opportunities in industrial markets with applications that can significantly improve the productivity of industrial users and provides life scientists with advanced cryo DualBeam capabilities," commented Bruno Janssens, FEI's Vice President and General Manager of FEI's NanoResearch and Industry Market Division. "Continuing technology innovations building upon FEI's fourteen years of DualBeam leadership have enabled us to respond to the increasing demand for high-throughput applications across a wide range of industries."

The Quanta 3D FEG will be featured in FEI's exhibit at NanoTech 2007 in Tokyo this week (Booth C-30). Visitors to Pittcon in Chicago (February 26-March 1) will be able to experience the features and benefits of the system in person by scheduling a demo in FEI's booth (#4013) or by reserving a demonstration appointment online at www.fei.com/Pittcon2007.

About FEI
FEI (NASDAQ: FEIC) is a global leader in providing innovative instruments for nanoscale imaging, analysis and prototyping. FEI focuses on delivering solutions that provide groundbreaking results and accelerate research, development and manufacturing cycles for its customers in Semiconductor and Data Storage, Academic and Industrial R&D, and Life Sciences markets. With R&D centers in North America and Europe, and sales and service operations in more than 50 countries around the world, FEI's Tools for Nanotech(TM) are bringing the nanoscale within the grasp of leading researchers and manufacturers. More information can be found online at: www.fei.com.


Contacts:

Public Relations:
MindWrite Communications, Inc.
Sandy Fewkes
USA
Phone: 408-224-4024
Send email  E-mail this person

Company Information:
Name: FEI Co.
Address: 7451 N.W. Evergreen Pkwy.
City: Hillsboro
State: OR
ZIP: 97124-5830
Country: USA
Phone: 503-640-7500
FAX: 503-640-7509
http://www.feicompany.com/


More New Product News from this company:
Direct Electron Detector handles beam-sensitive materials.
Electron Microscope targets semiconductor manufacturing.
Microscopy System analyzes full wafers up to 300 mm.
Automated System measures micro- and nano-fibers.
SEM can be used with wide range of samples.
Scanning Electron Microscope offers sub-nanometer resolution.
Software Package automates strain analysis.
Automated Analyzer optimizes mineral processing operations.
Electron Microscope is offered with electron source module.
High Resolution SEM is suited for scientists and engineers.

Other News from this company:
FEI Adds Dual-Axis Automation to Leading Electron Tomography Solution for Life Science Research
FEI Connectivity Solutions Improve and Accelerate TEM Imaging for Semiconductor Manufacturing
FEI Opens China NanoPort
FEI Annouces Joint Research Program with the FOM Foundation
First Titan(TM) S/TEM Installed in Sweden
FEI Introduces FEI.com for Owners Featuring FEI Connect
Team Project Achieves Microscopy Breakthrough
FEI Unveils World's First Table-Top Scanning Electron Microscope for Advancing Science Education
California Nanosystems Institute at UCLA Selects Three Fei Systems
FEI Expands Helios Nanolab(TM) Family for Semi Market
FEI Receives $11.5 Million Order from Technical University of Denmark
FEI Company Sells Knights Technology Unit to Magma
University of Ulster Opens FEI Center For Advanced Imaging
Imperial College London Unveils UK's First Titan (TM) S/TEM
Mexico's IMP Opens New Microscopy Center With FEI Tools
FEI Company and Malvern Instruments Team
FEI Receives Titan(TM) Order from Japanese Steelmaker
FEI's Titan(TM) S/Tem Achieves Low KV Milestone
Don R. Kania Named President and Chief Executive Officer of FEI Company
FEI Launches Certified Tools Program Globally



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