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Archive News Story
(Products mentioned in this Archive News Story may or may not be available from the manufacturer.)

Field Emission Gun suits 3D research and development.

March 5, 2007 - Eliminating boundaries imposed by existing high vacuum systems, DualBeam(TM) Quanta(TM) 3D FEG features high-current ion column for rapid, site-specific cross-sections of samples to reveal sub-surface structures and features. System's electron source optimizes SEM imaging, while electron beam current enables high throughput spectroscopy.

Related categories: Electrical Equipment and Systems | Laboratory and Research Supplies and Equipment | Optics and Photonics

Archive Press Release
(Products mentioned in this Archive Press Release may or may not be available from the manufacturer.)

Release date: February 21, 2007

FEI Announces New FIB/SEM DualBeam - Quanta 3D FEG

HILLSBORO, Ore./February 21, 2007- FEI Company (NASDAQ: FEIC) today released a powerful analytical DualBeam(TM) for advanced 3D research and development, the Quanta(TM) 3D FEG. Combining FEI's latest advances in ion and electron optics and the unique environmental SEM technology of FEI's Quanta family of products, the new system eliminates the boundaries imposed by traditional high vacuum systems. The Quanta 3D FEG expands FEI's range of DualBeam solutions for NanoResearch and Industry, NanoBiology and NanoElectronics.

The advances incorporated in the Quanta 3D FEG provide users with new levels of versatility and flexibility. The system features FEI's high current ion column for rapid, site-specific cross-sections of samples to reveal sub-surface structures and features while the system's advanced electron source design delivers improved SEM imaging. Further, increased electron beam current enables higher throughput spectroscopy.

"While the Quanta 3D FEG expands our customers' boundaries in NanoResearch it also opens new opportunities in industrial markets with applications that can significantly improve the productivity of industrial users and provides life scientists with advanced cryo DualBeam capabilities," commented Bruno Janssens, FEI's Vice President and General Manager of FEI's NanoResearch and Industry Market Division. "Continuing technology innovations building upon FEI's fourteen years of DualBeam leadership have enabled us to respond to the increasing demand for high-throughput applications across a wide range of industries."

The Quanta 3D FEG will be featured in FEI's exhibit at NanoTech 2007 in Tokyo this week (Booth C-30). Visitors to Pittcon in Chicago (February 26-March 1) will be able to experience the features and benefits of the system in person by scheduling a demo in FEI's booth (#4013) or by reserving a demonstration appointment online at www.fei.com/Pittcon2007.

About FEI
FEI (NASDAQ: FEIC) is a global leader in providing innovative instruments for nanoscale imaging, analysis and prototyping. FEI focuses on delivering solutions that provide groundbreaking results and accelerate research, development and manufacturing cycles for its customers in Semiconductor and Data Storage, Academic and Industrial R&D, and Life Sciences markets. With R&D centers in North America and Europe, and sales and service operations in more than 50 countries around the world, FEI's Tools for Nanotech(TM) are bringing the nanoscale within the grasp of leading researchers and manufacturers. More information can be found online at: www.fei.com.

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Public Relations:
MindWrite Communications, Inc.
Sandy Fewkes
USA
Phone: 408-224-4024

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Company Information:
Name: FEI Co.
Address: 7451 N.W. Evergreen Pkwy.
City: Hillsboro
State: OR
ZIP: 97124-5830
Country: USA
Phone: 503-640-7500
FAX: 503-640-7509
http://www.feicompany.com/

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Related Stories:
Jul 18, 2008	High Resolution SEM is suited for scientists and engineers.
Jul 1, 2008	Microscope enables chemical research at the atomic scale.
Mar 7, 2008	Focused Ion Beam Column features high resolution.
Jan 16, 2008	Electon Microscope offers up to 100 kV accelerating voltage.
Jan 14, 2008	SEM offers advanced defect monitoring capabilities.
Oct 23, 2007	S/TEM System offers sub-Angstrom imaging capabilities.
Aug 17, 2007	Scanning Electron Microscope handles broad range of samples.
Dec 14, 2006	FIB/SEM Systems are designed for semiconductor labs.
Dec 13, 2004	CD-SEM is suited for critical dimension metrology.

More New Product News from this company:
Aug 9, 2007	Cryogenic Freezing Tool features touchscreen user interface.
Jul 6, 2007	Microscope bridges optical and scanning electron microscopy.
Jul 5, 2007	High Resolution Microscope magnifies up to 20,000x.
Jul 3, 2007	Circuit Edit/Validation System uses ion column technology.
Jun 28, 2007	STEM System analyzes multiple wafer samples.
Apr 12, 2007	Microscope and Software facilitate mineral processing.
Sep 1, 2006	FIB/SEM System offers nanoscale imaging and analysis.
Aug 10, 2006	Focused Ion Beam System provides circuit edit platform.
Aug 31, 2005	Electron Microscope has all-digital design.
Mar 16, 2005	Electron Microscope offers nanoscale analysis of samples.

Other News from this company:
Jul 15, 2008	FEI Connectivity Solutions Improve and Accelerate TEM Imaging for Semiconductor Manufacturing
Sep 06, 2007	Team Project Achieves Microscopy Breakthrough
Jan 09, 2007	California Nanosystems Institute at UCLA Selects Three Fei Systems
Nov 30, 2006	FEI Expands Helios Nanolab(TM) Family for Semi Market
Nov 27, 2006	FEI Receives $11.5 Million Order from Technical University of Denmark
Oct 25, 2006	University of Ulster Opens FEI Center For Advanced Imaging
Oct 03, 2006	Mexico's IMP Opens New Microscopy Center With FEI Tools
Sep 12, 2006	FEI Company and Malvern Instruments Team
Sep 04, 2006	FEI Receives Titan(TM) Order from Japanese Steelmaker
Jul 31, 2006	FEI's Titan(TM) S/Tem Achieves Low KV Milestone
Jul 24, 2006	Don R. Kania Named President and Chief Executive Officer of FEI Company
Jul 10, 2006	FEI Launches Certified Tools Program Globally
Jun 13, 2006	FEI Earns Spot in Semi Industry 2006 10 Best Supplier List
Jun 12, 2006	FEI Prepares Shipments of U.S. Team Project Systems
Jun 05, 2006	Russia Opens New Nanotech Center with FEI Tools
May 16, 2006	FEI's Titan(TM) S/TEM Installed at France's LETI
May 11, 2006	Japan Electronics Manufacturer Selects FEI System for In-Fab Root Cause Analysis
Apr 19, 2006	McMaster University Orders Two FEI Titan(TM) S/TEMs
Mar 02, 2006	FEI Sponsors 2006 Safer Nano Conference
Jan 31, 2006	FEI's Titan(TM) S/TEM Receives Industry Honors

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