|
|
Advertisement
|
|
Probe System tests wafers up to 300 mm.
December 20, 2006 -
Designed for high-temperature, multi-site testing, Model PM300WLR features large programmable microscope movement and cable handling solutions that facilitate use. Contact stability is guaranteed at temperatures up to 400°C and test times are minimized using multi-site probe cards. Design of probe system minimizes gas consumption, which is important for devices that must be tested in inert gas environments.
(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.) |
|
|
| |
| |
|
|
|
Newsletters |
Your Gateway to a Fast
Changing World
Product News Alerts |
 |
Receive similar stories and other customized
news to keep you in the know on the products shaping
industry. |
Subscribe Free Today
Subscribe View
Sample |
Industry
Market Trends
Has Got It |
- Latest developments
- Trends
- Best practices
- Opinions & Commentary
|
 |
Get Ahead.
Get IMT.
Subscribe Free Today
Subscribe View
Sample |
|
|
|
|
SUSS MicroTec Introduces the PM300WLR
The World's First Dedicated 300mm Wafer-Level Reliability Probe System
TOKYO, Japan, December 6, 2006 - SUSS MicroTec AG has announced the latest innovation in wafer-level reliability (WLR) testing. The PM300WLR is the first dedicated probe system for wafers up to 300mm that enables semiconductor manufacturers to quickly obtain critical results about the reliability of the device under test (DUT). These results are a vital piece of feedback for design and process improvement.
In order to test the reliability of the DUT, it must be subjected to temperature and electrical stress over long periods of time. This was traditionally done after the device had been packaged - an expensive and time-consuming process. By doing reliability test at wafer level, the costs of packaging are saved and the test results can be delivered much sooner.
The PM300WLR is specifically designed for ergonomic, high-temperature, multi-site testing. Contact stability is guaranteed at temperatures up to 400°C and test times are significantly reduced using multi-site probe cards. A large programmable microscope movement and clever cable handling solutions heighten ease of use. The advanced design of the PM300WLR also delivers additional savings by reducing gas consumption, which is especially important for devices that must be tested in inert gas environments.
"We are seeing increasing demand for WLR testing at 300mm," said Dr. Stojan Kanev, International Product Manager, Test Systems Division, SUSS MicroTec. "Semiconductor manufacturers want a solution that provides reliability information for their devices without waiting for weeks. The PM300WLR delivers that solution and provides extra value by reducing the cost of test."
For more information, please contact:
Joshua M. Preston
Marketing and Communications Manager
SUSS MicroTec Test Systems
Tel: +49 (0) 35240 73-0
E-Mail: info@suss.com
For further correspondence send to:
SUSS MicroTec, Inc.
228 Suss Drive
Waterbury Center, VT 05677 U.S.A.
Attn: Electronic Marketing Dept.
Louise Jones
SUSS MicroTec Inc.
Sales & Marketing Specialist
ljones@suss.com
800-685-7877, Ext. 218
Visit us on the web at www.suss.com
Contacts:
Sales:
Louise Jones Sales & Marketing Specialist
USA
Phone: 800-685-7877 ext 218
 E-mail this person
Marketing:
Joshua M. Preston Marketing and Communications Manager
INTL
Phone: +49 (0) 35240 73-0
E-mail this person
Company Information:
Name: SUSS MicroTec Inc.
Address: GITC 1-18-2, Hakusan
City: Yokohama
Country: Japan
Phone: +81-45-931-5600
http://www.suss.jp/
|
|
|
|
|
 |
ThomasNet News Advertisers
|
|
|
del.icio.us
DIGG
Facebook
Reddit
StumbleUpon
Twitter
![[Get Copyright Permissions]](http://license.icopyright.net/images/icopy-w.gif){kind=small}
