Archive News Story
(Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
Digitizer Cards come in 2, 4, or 8 channel configurations.
October 5, 2006 -
Using multiple 16-bit ADCs for true simultaneous sampling, UF2-4600 Series PCI/PCI-X Cards are available with max sampling rates from 200 kS/s to 3 MS/s. Signal memory is 32 MSamples, but can be expanded to 2 GSamples through DIMM module onboard. Signals can be recorded to card memory and then offloaded, or continuously streamed at up to 225 MBytes/sec to PC host. Cards support single-ended and reduced noise differential input termination, without reduction of channel count.
Archive Press Release
(Products mentioned in this Archive Press Release may or may not be available from the manufacturer.)
Release date: September 12, 2006
Strategic Test Releases 8 Channel 3 MS/s 16-bit A/D Digitizer Cards for PC's
Twelve new UltraFast UF2 series PCI/ PCI-X cards offer increased dynamic range and both single-ended and differential input termination.
Woburn, MA - September 12, 2006. Strategic Test Corp has released twelve new Digitizer cards in the UF2-4600 series. Using multiple 16-bit ADC's for true simultaneous sampling, the cards are available with a choice of maximum sampling rates from 200 kS/s to 3 MS/s and 2, 4 or 8 channel configurations - enabling the user to select the most cost-effective solution. 32 MSamples of signal memory is provided as standard, but can be expanded to 2 GSamples through a proprietary DIMM module onboard. As with all UltraFast cards the signals can be recorded to card memory and then offloaded, or continuously streamed at up to 225 MBytes per second to the PC host.
Bob Giblett, President, commented, "During product development special attention was paid to the quality of the input gain section and the A/D converters. This results in very low noise and distortion on all input ranges and achieves effective resolution of up to 14.5 ENOB."
The card supports both single-ended and reduced noise differential input termination, without reduction of channel count. Each channel contains an independent amplifier that allows the user to program each channel with the best voltage range to match each sensor. Eight ranges are provided from ±10 V to ±50 mV. A self-calibration feature ensures the removal of any voltage offsets prior to recording.
Large synchronous systems can be configured with up to 16 cards for 128 simultaneous channels. Trigger conditions can be set on multiple cards combined with AND/OR, a feature often used in production test processes.
The cards are supplied with drivers for Microsoft Windows and Linux, with free downloads of future OS version drivers such as Windows Vista. Drivers for MATLAB, LabVIEW, VEE, DASYLab and LabWindows/CVI are optionally available.
The Ultrafast UF2-4600 cards are available immediately and prices range from $3190 for the UF2-4620 2 channel 200 kS/s card, to $11990 for the 8 channel 3 MS/s version. Volume discounts and OEM customization prices are available on request.
About Strategic Test
With a product range of more than 150 high-speed Digitizer, Arbitrary Waveform Generator and high-speed Digital I/O PCI, 3U PXI and 6U CompactPCI cards, Strategic Test Corporation is one of the leading suppliers of high-speed PC-based instruments. The UltraFast cards are designed at the R&D facility in northern Germany and distributed through our offices in Woburn (MA) and Stockholm (Sweden).
The first high-speed measurement card for PC's was designed in 1989. The current UF2 range is the forth design generation and uses the PCI-X 66 MHz/32-bit PCI bus to provide data transfer rates of up to 225 MB/s for shorter test times. With up to 4 GBytes of card memory and up to 16 channels per card, the UF2 series has the deepest memory on a single card and offers some of the lowest cost/channel Digitizer, AWG and Digital I/O cards available. Strategic Test's clients include global electronics, semiconductor, defense, telecommunications and medical instrument companies, government funded research labs and universities in five continents.
For further information please contact:
Bob Giblett
President
Strategic Test Corporation
12 Alfred Street, Suite 300
Woburn, MA 01801-1915
Tel: (617)621-0080
Fax: (617)621-1414
Email: media@strategic-test.com
http://www.strategic-test.com
Contacts:
General Information:
Stategic Test Corporation
Bob Giblett President
12 Alfred Street, Suite 300
Woburn MA 01801-1915
USA
Phone: 617-621-0080
FAX: 617-621-1414 E-mail this person Company Information: Name: Strategic Test Corporation Address: 12 Alfred Street, Suite 300 City: Woburn State: MA ZIP: 01801-1915 Country: USA Phone: 617-621-0080 FAX: 617-621-1414 http://www.strategic-test.com
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