Quantcast
 
Search for: Search what?
Jan 9, 2009  
 Sections
Latest New Product News
Industrial Market Trends
Green & Clean News
Association & Government News
Adhesives and Sealants
Agricultural and Farming Products
Architectural and Civil Engineering Products
Automatic ID
Chemical Processing and Waste Management
Cleaning Products and Equipment
Communication Systems and Equipment
Computer Hardware and Peripherals
Construction Equipment and Supplies
Controls and Controllers
Display and Presentation Equipment
Electrical Equipment and Systems
Electronic Components and Devices
Explosives, Armaments and Weaponry
Fasteners and Hardware
Fluid and Gas Flow Equipment
Food Processing and Preparation
Health, Medical and Dental Supplies and Equipment
HVAC
Labels, Tags, Signage and Equipment
Laboratory and Research Supplies and Equipment
Lubricants
Machinery and Machining Tools
Material Handling and Storage
Materials and Material Processing
Mechanical Components and Assemblies
Mechanical Power Transmission
Mining, Oil Drilling & Refining
Mounting and Attaching Products
Non-Industrial Products
Optics and Photonics
Packaging Products & Equipment
Paints and Coatings
Plant Furnishings and Accessories
Portable Tools
Printing and Duplicating Equipment
Retail and Sales Equipment
Robotics
Safety and Security Equipment
Sensors, Monitors and Transducers
Services
Software
Test and Measuring Instruments
Textile Industry Products
Thermal and Heating Equipment
Timers and Clocks
Transportation Industry Products
Vision Systems
Waste Handling Equipment
Welding Equipment and Supplies
 Press Releases
Products in the News
Company News
Mergers & Acquisitions
People in the News
Literature & Websites
 Resources
News Delivery Options
Browse Categories
Browse Companies
Mobile Edition
PR Resources
Licensing
Advertising
How to Write an effective Press Release
Trade Associations
Small Business Support
MEP
Advertisement
Nanovoltmeter eliminates noise in low-voltage measurements.
Nanovoltmeter eliminates noise in low-voltage measurements.

Click Here to Enlarge Picture

Nanovoltmeter eliminates noise in low-voltage measurements.


July 21, 2004 - Model 2182A enables user to make resistance measurements, pulsed I-V measurements, and differential conductance measurements. It can make 15 nV peak-to-peak measurements at 1 sec response times and 40–50 nV p-p measurements at 60 msec times. Built-in Delta Mode coordinates measurements with reversing current source at up to 24 Hz with 3 nVrms/root-Hz noise. Synchronized to line frequency, unit can provide 110 dB rejection to noise.

(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)

 See related product stories
Digital Voltmeters feature daylight readable design.
Power Warning Device features dual redundant circuitry.
Voltmeter can take readings on capacitive test points.
Multifunctional Instrument suits rough, mobile applications.
Digital Voltmeter and Phasing Set is accurate to 1%.
 See more product news in:
Test and Measuring Instruments
 Tools for you
del.icio.us DIGG  
Facebook Reddit
StumbleUpon  
Print This Page E-Mail Story
Watch_Company  Save Story
Contact company View Company Profile
Company web site 
More news from this company

Advertisement
More Tools and information
Search for suppliers of
Voltmeters
 Newsletters
Your Gateway to a Fast Changing World
Product News Alerts
Receive similar stories and other customized news to keep you in the know on the products shaping industry.
Subscribe Free Today
Subscribe   View Sample

Industrial Market Trends
Has Got It
  • Latest developments
  • Trends
  • Best practices
  • Opinions & Commentary
Get Ahead. Get IMT.
Subscribe Free Today
Subscribe   View Sample
 See more related product stories:
Voltmeter has analog style LCD display.
Digital Panel Meter has blue LED backlighting.
Voltmeters come in LCD and LED styles.
LED Voltmeter suits space-constrained applications.
Tiny Voltmeter has selectable decimal point.
Voltmeter never needs batteries.
Voltmeter can work underwater.

Keithley Launches Model 2182A Nanovoltmeter for Eliminating Noise in Low Voltage Measurements

Cleveland, Ohio – July 14, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, today introduced its Model 2182A nanovoltmeter, which is optimized for making low noise measurements in research, metrology, nanotechnology, superconductivity, and other low voltage/resistance applications.

The Model 2182A brings a powerful new set of capabilities to researchers when used in conjunction with Keithley’s recently introduced models 6220 DC current source and 6221 AC/DC current source; users now are able to make resistance measurements, pulsed I-V measurements, and differential conductance measurements faster and more accurately than previously possible, in many cases eliminating the need for an expensive lock-in amplifier or AC resistance bridge. The combination is also useful in many nanotechnology applications because of its ability to measure resistance while dissipating very little power in the device under test (DUT).

Major Features/Benefits. The Model 2182A is able to minimize DC drift and noise common to low voltage measurements with rapid measurement speeds beyond what is achievable by previous nanovoltmeters or sensitive DMMs. The instrument is able to make 15nV peak-to-peak measurements at one-second response times and 40-50 nV p-p measurements at 60 millisecond times.

The unit features a built-in Delta Mode to coordinate measurements with a reversing current source (one-button operation when used with Keithley models 6220/6221) at up to 24Hz with 3nVrms/root-Hz noise, creating a system optimized for precision measurements of low resistance materials or devices. The new delta mode operation alternates nearly three times faster than its predecessor model, reducing measurement noise by nearly a factor of two. In addition, the new delta mode incorporates a new cancellation method that reduces the effects due to changing thermoelectric voltages by a factor of ten compared to its predecessor.

By synchronizing to line frequency, the Model 2182A provides 110dB rejection to noise at line frequency and minimizes the effect of AC common-mode currents. The unit offers two channels for measuring voltage or temperature. Or, the second channel can be used for reading the ratio of an unknown resistance directly to a reference resistor. Built-in thermocouple calculations for types J, K, N, T, E, R, S, and B are provided.

Combined with Keithley’s New Models 6220/6221 Current Sources. Integrating the Model 2182A with either of Keithley’s new current sources, models 6220 or 6221, creates a powerful test system capable of acting as a single instrument. When linked with the Ethernet-enabled Model 6221, the combined system effectively operates as an Internet-controlled nanovoltmeter system, allowing customers to control both sourcing and measuring through a single Internet IP address.

Some of the most important capabilities of the Model 2182A, when combined with the models 6220 or 6221, include:

• Wide measurement range, from 10 nano-ohms (lowest noise) to 1 Gohms.

• Differential conductance, an increasingly common measurement for characterizing semiconductor and nanotechnology materials, can be performed 10x faster and with lower noise by the Models 622X and 2182A than by existing solutions, including lock-in amplifiers and AC resistance bridges.

• When combined with the Model 6221, the Model 2182A can support pulsed resistance and pulsed I-V measurements with pulses as short as 50 microseconds, even at low currents. Short pulses mean less power put into the DUT, particularly important in very small devices where even a small amount of power may be enough to destroy the device or produce an invalid reading. To eliminate DC offsets and line frequency noise in these sensitive pulse measurements, the 6221/2182A pulsed mode utilizes both line synchronization and delta-mode techniques.

Price and Availability. The Keithley Model 2182A Nanovoltmeter is priced at $2803 (US). Delivery is eight weeks ARO.

For More Information. For more information on Keithley's Model 2182A, or any of its measurement instruments, contact the company at:

Telephone: 888-534-8453440-248-0400

FAX: 440-248-6168

E-mail: product_info@keithley.com

Internet: www.keithley.com

Address: Keithley Instruments, Inc.

28775 Aurora Road

Cleveland, OH 44139-1891

About Keithley. With more than 50 years of measurement expertise, Keithley Instruments (www.keithley.com) has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency) geared to the specialized needs of electronics manufacturers for high performance production testing, process monitoring, product development, and research. By building upon our strength in electrical measurement solutions for research, Keithley has become a production test technology leader for the semiconductor, wireless, optoelectronics, and other precision electronics segments of the worldwide electronics industry. The value we provide to our customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput, and yield of their products.

Products and company names listed are trademarks or trade names of their respective companies.

Contacts:

General Information:
Ellen Modock
USA
Phone: 440-498-2746
Send email  E-mail this person

Company Information:
Name: Keithley Instruments, Inc.
Address: 28775 Aurora Rd.
City: Cleveland
State: OH
ZIP: 44139 1891
Country: USA
Phone: 800-552-1115
FAX: 440-248-6168
http://www.keithley.com


More New Product News from this company:
Software targets bench-top component test applications.
Programmable SIgnal Generator performs 6 key functions.
Battery/Charger Simulator is used for testing portable devices.
Instruments provide I-V characterization.
Semiconductor Characterization System has diverse functions.
Plug-In Cards expand system switch/multimeter functionality.
Waveform Creator has object-oriented GUI optimized for MIMO.
Signal Analysis Tools provide WiMAX testing capabilities.
Software speeds wafer level reliability testing.
Software provides semiconductor test and characterization.

Other News from this company:
Keithley Partners with Stratosphere Solutions to Enable Advanced Process Characterization at Sub-65nm
Keithley Releases New 2008 Test And Measurement Product Guide
Keithley Joins WiMAX Forum®
Keithley Receives NorthCoast 99 Distinction as Great Workplace
Keithley - Industry-Leading Capabilities for MIMO RF Signal Generators and Analyzers
Keithley Makes C-V/I-V/Pulse Testing Faster, Simpler, and More Economical with New Integrated C-V Module and Software in Market-Leading 4200-SCS
Keithley's German Service Center Joins List of ISO 17025 Accredited Laboratories
Keithley and CNSI Announce Nanotechnology Measurement Partnership
Keithley Announces Advanced Parametric Probe Card Availability
Keithley Announces Joint Development Partnership with France's CEA LETI Laboratory to Pursue Advanced Nanotechnology and Semiconductor Materials Research
Keithley Instruments Recognized for Excellence by Texas Instruments
Keithley Publishes New Data Acquisition, Measurement, and Control Handbook
Keithley Instruments Named Finalist for EDN Magazine Innovation Award
Keithley Receives Best in Test Award from Test & Measurement World Magazine
Keithley Recognized for Outstanding Customer Satisfaction in Semiconductor Industry
Keithley Receives Product of the Year Award from Electronic Products Magazine
Keithley Introduces PXI Products for Hybrid Test Systems in Production Applications
Keithley Plays Key Role in New IEEE Test Standards for Carbon Nanotubes
Keithley Recognizes 60 Year Milestone of Innovation
Keithley Opens New Offices in Asia to Optimize Local Applications and Customer Support



Click here for copyright permissions!
Copyright 2009 Thomas Publishing Company

Newsroom Advertisers



Home  |  My Newsroom  |  Industrial Market Trends  |  Submit Release  |  Advertise  |  Contact NewsRoom  |  About Us
Brought to you by Thomasnet.com        Browse ThomasNet Directory

Copyright © 2009 Thomas Publishing Company
Terms of Use - Privacy Policy