3D Benchtop Robotic Scanning System identifies EMI noise sources.September 2, 2010 -
EM-ISight compact system identifies location of EMI noise sources to precision of ±0.05 mm. It employs DENSO 5- or 6-axis articulated robot that allows horizontal, vertical, and rotational scanning of device in situ, resulting in 3D measurement profile. System's dynamic-touch feature automatically determines position of test probe above each component. Allowing testing to JIS T060-1-1-2 and IEC 60601-1-1-2, it offers frequency range of 100 kHz to 6 GHz and test area of up to 700 sq mm.
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Original Press release
APREL Laboratories
51-T Spectrum Way
Nepean, ON, K2R1E6
USA
New APREL Laboratories 3-D EMI Scanning Measurement System
OTTAWA, Ontario, Canada - APREL Laboratories EM-ISight is a compact, benchtop robotic scanning system that can identify the location of problematic EMI noise sources to a precision of ±0.05 mm. The system allows testing to JIS T060-1-1-2 and IEC 60601-1-1-2, in support of Voluntary Control Council for Interference by Information Technology Equipment (VCCI) standards.
Unlike conventional systems, which use Cartesian robots to position their measurement probes, the EM-ISight employs a DENSO five- or six-axis articulated robot that allows horizontal, vertical and rotational scanning of a device in situ, resulting in a complete 3-D measurement profile. Also unlike conventional systems, the EM-ISight has a dynamic-touch feature that automatically determines the position of the test probe above each component, eliminating the need for time-consuming manual setup.
The system's broad frequency range of 100 kHz to 6 GHz, along with its large test area of up to 700 sq. mm, accommodates a wide range of applications, including PCBs, ICs, RFID circuits, mobile-handset LCDs, antenna design, GPS optimization, noise-source identification and board layout.
The EM-ISight is designed to be used as a primary EMI test instrument for research and development, preliminary conformity testing, or quality control. By correlating existing measured data to that measured by the EM-ISight, engineers can be confident that their design will pass standardization testing and are thus able to reduce costly chamber measurements. A dynamic database and result-retrieval option allows multiple users in remote locations to view test data throughout the entire design process.
For more information, visit http://aprel.com/newsite/em-isight.html.
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