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Machinery suit Electron Backscatter Diffraction.


April 7, 2003 - Electron Backscatter Diffraction (EBSD) System models OIM 2000, OIM 4000, and OIM 7000 include EBSD cameras, data collection, and analysis software that provides various tools for characterizing crystalline microstructures. Units also incorporate ChI-Scan, which takes advantage of simultaneously collected EDS and EBSD data to handle multi-phase samples.

(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)

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X-Ray Diffractometer performs single crystal analysis.
Electron Backscatter Detector tests diffration levels.
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EDAX Launches OIM 2000, 4000 And 7000 Systems For Electron Backscatter Diffraction (EBSD)

March 2003

Mahwah, NJ - EDAX Inc - a leader in X-ray microanalysis, X-ray fluorescence and electron diffraction instrumentation - introduces the next generation of Electron Backscatter Diffraction (EBSD) Systems - the OIM 2000, OIM 4000 and OIM 7000.
“EDAX is pleased to offer a new range of EBSD systems. Our TSL products already are widely regarded as the leading edge in EBSD analysis,” explains Del Redfern, Micro Characterization Tools Product Manager for EDAX. “We have continually improved the functionality and enhanced the usability features of our systems. Our OIM systems represent the next logical evolution of our products.”

“There is a need for a variety of systems in the EBSD marketplace from introductory analytical packages to high-end advanced research level systems. Our OIM 2000, 4000 and 7000 systems are designed to meet the needs of a wide range of EBSD users,” notes Redfern.

“The OIM 2000/4000/7000 Series includes state of the art EBSD cameras, fast and accurate data collection, and analysis software that provides a wide range of tools for characterizing crystalline microstructures,” he adds.

“The release of the OIM Series also coincides with the release of ChI-Scan - an application that takes advantage of simultaneously collected EDS and EBSD data to more accurately handle multi-phase samples. With ChI-Scan and other optional applications, we are able to build a system that meets users’ current requirements and offers an upgrade path for future expansion,” comments Redfern.

EDAX - the acknowledged leader in Energy Dispersive Microanalysis, X-ray Fluorescence and Electron Backscatter Diffraction instrumentation - designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metal, geological, biological, material and ceramic markets. Since its founding in 1962, EDAX has used its knowledge and experience to develop ultra sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial analytical problems.

EDAX is a unit of AMETEK Process & Analytical Instruments, a division of AMETEK, Inc., a leading global manufacturer of electronic instruments and electric motors with annual sales of more than $1billion.

For further information about EDAX, contact us at:

EDAX Inc.

91 McKee Drive, Mahwah, NJ 07430

(201) 529-4880 - - (201) 529-3156

edax.info-americas@ametek.com • edax.info-international@ametek.com

www.edax.com
Company Information:
Name: EDAX, Inc.
Address: 91 McKee Drive
City: Mahwah
State: NJ
ZIP: 07430
Country: USA
Phone: 201-529-4880
FAX: 201-529-3156
http://www.edax.com


More New Product News from this company:
XRF Spectrometer features motorized turret.
X-ray Microanalysis System generates accurate results.
Electron Backscatter Detector tests diffration levels.
Microanalysis System combines EDS, EBSD, and WDS.
Microanalysis Software includes Free Draw feature.
Microanalysis Software displays up to 36 images.
Analyzer measures coatings of small to mid-sized parts.
Machine measures coating thickness of large parts.
Software facilitates FDA 21 CFR Part 11 compliance.

Other News from this company:
EDAX Launches Apollo XV SDD
EDAX Announces Performance Enhancements for the Hikari Electron Backscatter Detector
EDAX Launches Apollo SDD
Ametek Names Rodrigo Rubiano As Business Unit Manager For EDAX
AMETEK Pittman Inc. and Avnet Electronics Marketing Sign Distribution Agreement
AMETEK Forms Ultra Precision Technologies Division
Department Of Homeland Security Selects Ametek To Supply Portable Radiation Detection System
AMETEK Electromotory S.R.O. Marks 10th Anniversay
Edax Showcases New HIKARI Electron Backscatter Detector at Microscopy and Microanalysis 2006
Edax Showcases Texs HP, Parallel Beam X-ray Spectrometer at Semicon West
Edax and Carl Zeiss SMT Showcase New OIM(TM) 3d EBSD at Microscopy and Microanalysis 2006
Ametek Introduces the Ortec Detective-EX-100 - Latest Advancement in Hand-Held Radiation Identifiers
EDAX and xk INC Announce the Release of SLICE



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