Latest New Product News from Multitest
Pick and Place Handler features integrated 2D code reader.Multitest San Jose, CA 95134
Aug 14, 2012 To ensure 100% device traceability and lot integrity, Model MT2168 is available with optional 2D code reader, which identifies each single package. Package ID can then be used to verify data with lot information that has been provided to handler by manual HMI input or via scanned bar code. Additionally, ID of each device under test can be read by tester via RS232 or IEEE interface. Using package ID, test result can be unambiguously assigned to DUT ID.
High Power IC Handler delivers plug and yield solution.Multitest San Jose, CA 95134
Jul 26, 2012 Supporting features of ecoAmp Kelvin contactor, MT9928 gravity handler delivers temperature performance and positioning accuracy that ensure reliable tri-temp testing as well as optimal test yield. Temperature accuracy of ±2.0°C and stability of ±0.5°C are maintained across entire -55 to +155°C range, and soak booster cuts soak time by 50% if standard soak capacity is insufficient.
PCB Electrical Test System handles 3D packages.Multitest San Jose, CA 95134
Jul 16, 2012 Multitest Plug & Yield system, for in-process test in 3D assembly, consists of InStrip3D PCB handling machine and test interface board. Product requires minimum contact force, with inclusion of vertical spring contacting solution, to avoid stress on sensitive bare dies. Supporting fine-pitch, high layer count PCBs, system can support 0.4 mm pitch array application in high pin count multi-site configuration.
Device Carrier offers loading and unloading configurations.Multitest San Jose, CA 95134
Jun 22, 2012 Offering solution for stable, high parallel test handling of semiconductors and sensors in packages down to 1.2 x 1.2 mm, InCarrier(TM) is available in variety of configurations for loading from tube, bowl, or tray and for unloading into tube, bulk, or metal mag in any combination. System consists of tray/carrier into which singulated ICs are loaded to be tested in InStrip® parallel strip test handler. Tested ICs are then unloaded into final packaging and shipping medium.
Gravity Test Handler is offered with bowl feed option.Multitest San Jose, CA 95134
May 30, 2012 For temperature tests of small devices such as MLF2 and SOT, MT9928 xm gravity test handler is available with bowl feed module. Combination supports up to 8 contact sites, and module allows for facilitated kit change in 30-60 min. Designed ergonomically with operating height of less than 130 cm, module uses one bowl feeder for 1-4 tracks and includes vision system and optional ionizer.
Kelvin Contactor meets needs of high-power applications.Multitest San Jose, CA 95134
May 15, 2012 Developed to respond to requirements of high voltage/high current test, ecoAmp(TM) features electrical performance of 500+ A with maximum inductance of 4.5 nH for 0.5 mm pitch. Product is based on Multitest Cantilever technology, offers mechanical performance with lifespan of 1 million insertions, and is applicable across complete temperature range of -60 to +175°C.
Test/Calibration Cart suits quad-site MEMS applications.Multitest San Jose, CA 95134
Mar 26, 2012 Test and calibration cart for MT9510 is intended for pick-and-place applications. MEMS solutions are available for strip test and singulated package test on Multitest InStrip® with optional InCarrier(TM), gravity test handlers MT93xx/MT9928, or MT9510XP tri-temp pick-and-place handler. Leveraging contact site dimension of MT9510 x16, quad-site test solution is available for MEMS on pick-and-place handlers. Based on same MEMS cart as MT9928, MT9510 x16/MEMS setup uses both technologies.
Other Company News From Multitest
May 01, 2013
Continuous Innovation in Packaging and Manufacturing Processes: How to Ensure Best Quality and Process Control at Competitive Cost?
May 01, 2013
Multitest ecoAmp(TM): Kelvin Contactor for High-Power Applications Proves Performance
Apr 01, 2013
Make It Fast - Make It Easy with Multitest's MT9510 Access+ Contacting Unit Holder
Mar 01, 2013
Melexis Chooses Multitest's MT9510 Test Handler for Gesture Recognition IC
Feb 01, 2013
Multitest's Solution for 3D Packages Wins NPI Award
Feb 01, 2013
Multitest to Exhibit Integrated Test Solutions at BiTS 2013
Dec 01, 2012
MEMS Oscillators - Great Growth Potential and Superior Performance Multitest Equipment Fully Supports the Advantages
Oct 01, 2012
Powerful Performance Is Required: MT2168 for High-Power Applications
Oct 01, 2012
Multitest's Q-Tip for Mercury(TM) Contactor Offers the Best First Pass Yield Over the Full Tri-Temp Range
Sep 01, 2012
BlueLine(TM) Contactors: Highest Multitest Performance for Third-Party Test Handlers
Aug 01, 2012
Multitest at SEMICON Taiwan 2012: Leading Solutions for High Parallel Test of SoCs, MEMS and 3D Packages
Jul 01, 2012
Multitest Introduces Signal Integrity and Power Glossary
Apr 01, 2012
Multitest InStrip® - Continuously Growing Installed Base: Reliable High Parallel Handling Solution for a Broad Range of Applications
Apr 01, 2012
MT9928 Gravity Feed Test Handler - Multitest Ships Its 1800th Conversion Kit
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