Latest New Product News from Taylor Hobson, Inc.
Roundness Tester handles high-throughput applications.Taylor Hobson, Inc. West Chicago, IL 60185
Dec 11, 2012 Suitable for shop floors and inspection rooms, Surtronic R-Series Roundness and Form Testers use orientation mechanism that lets operator position part for measurement in as little as 20 sec. Centering attachment enhances throughput further by eliminating need to re-center when measuring series of similar parts. Designed for measuring high-volume bearing parts and for QC applications, instruments take fully ISO-compliant measurements with ±25 nm accuracy and 6 nm gauge resolution.
Multifunction Metrology Instrument has 0.3 nm resolution.Taylor Hobson, Inc. West Chicago, IL 60185
Jul 27, 2012 Talyrond 500 Series measures roundness, form, and surface finish of cylindrical or round parts. Rotary, vertical, and horizontal datums offer optimal precision for reproducing part shape, while measurements can be exported to statistical process control systems. Included frictionless air bearing spindle and precision column maximize accuracy of roundness, cylindricity, and straightness data. Unit's calibration routine allows measurement of angle, radius, and form with respect to part axis.
Dual Axis Digital Autocollimator incorporates CCD technology.Taylor Hobson, Inc. West Chicago, IL 60185
Jun 15, 2012 Utilizing optical analysis software, Ultra Series provides simultaneous 2-axis straightness measurement of machine tool slides. Device automatically measures both X and Y directions at each measurement position along slideway. With additional accessories, system can also set and check twist, parallelism, and squareness. Ultra Series offers measurement range of 1,800 sec with 0.2 sec accuracy, while high-precision version offers 300 sec range with 0.1 sec accuracy.
Multifunctional Interferometer analyzes thick and thin films.Taylor Hobson, Inc. West Chicago, IL 60185
Jun 09, 2010 Developed to photovoltaic and semiconductor application requirements, Talysurf CCI SunStar merges non-contact dimensional measurement capability with thin and thick film analysis technology. Coherence correlation interferometer, with one measurement, can obtain information on film thickness (5 µm to 300 nm or less), interface roughness, pinhole defects, and de-lamination. Auto-range and auto-fringe-find functions, 4-million-pixel camera, and closed-loop Z scanning mechanism are standard.
Roundness/Cylindricity System measures large-diameter parts.Taylor Hobson, Inc. West Chicago, IL 60185
Feb 19, 2009 Talyrond XL employs vertical column that sits on precision-bearing rails and can be adjusted and fixed in radial direction to suit diameter of part under test. This roundness and cylindricity measurement system accommodates large-diameter (up to 1,000 mm) and large-radial-swing components. Hi-res inductive gauge is attached to radial arm with 300 mm of travel, and frictionless air-bearing spindle is mounted onto 3-footed steel base to ensure thermal and structural stability.
Optical 3D Profiler utilizes 1 million pixel image sensor.Taylor Hobson, Inc. West Chicago, IL 60185
Jul 31, 2008 Based around Coherence Correlation Interferometry technique, Talysurf CCI Lite provides non-contact 3D surface texture, step height, and micro dimensional measurement. All types of rough, smooth, or highly reflective materials, including glass, metal, photo resist, polymer, liquid inks, and pastes, can be measured. System also provides automatic pattern measurement as well as X, Y, and Z stitching. Z stage is closed loop over full 100 mm range for high accuracy.
Roundness Tester measures ultra high precision parts.Taylor Hobson, Inc. West Chicago, IL 60185
Apr 25, 2008 Equipped with high-precision spindle, slide way for movement along spindle axis, and another slide way for movement toward or through spindle axis, Talyrond 395 provides roundness as well as linear and circumferential roughness measurement. Unit can measure component circumferentially using diamond stylus and 72,000 radial data points, or in axial direction with 200,000 data points. With automatic centering and leveling, TR395 assures flawless alignment regardless of measurement direction.
Automated Optical 3D Profiler features 10 pm resolution.Taylor Hobson, Inc. West Chicago, IL 60185
Mar 24, 2006 As 3D surface-texture, step-height, and micro-dimensional measurement system, Talysurf CCI 6000 combines microscope-quality surface imaging with surface profiler measuring capability. It performs non-contact 3D measurement of components with all types of surfaces and materials up to 300 mm² in size. Measurement interferometer uses correlation algorithm to find coherence peak and phase position of interference pattern produced by selectable bandwidth of light.
Measurement System determines roundness and cylindricity.Taylor Hobson, Inc. West Chicago, IL 60185
Mar 24, 2006 Able to perform roundness measurement of sub-micron components, Talyrond 295 incorporates diamond-turned, air-bearing spindle and uses glass hemisphere with roundness deviation of less than or equal to 10 nm and individual slope values of less than 2 nm/7.2°. It delivers fully automatic sub-micron analysis of form and geometry. Features include 1.2 nm resolution Talymin 5 gauge head, interchangeable probe arms, 0.2 µm vertical axis straightness, and 0.1 µm positioning resolution.
Roughness Tester simultaneously calculates 10 parameters.Taylor Hobson, Inc. West Chicago, IL 60185
May 25, 2005 Freestanding or bench-mounted, portable battery-powered Surtronic 25 features stylus lift mechanism that allows vertical adjustment of 50 mm and rotation of pick-up to different measuring positions, including right angle or inverted measurements. With 2 buttons, user can scroll through menus and make selections before pressing MEASURE key. Multifunction port permits printer connection or export to PC for further surface finish analysis using Talyprofile software.
Click below for more Product News from Taylor Hobson, Inc.
Other Company News From Taylor Hobson, Inc.
Aug 15, 2012
University of Arkansas Employs Talysurf Profiler to Develop Next Generation of Photovoltaic Cells
Jun 22, 2006
Taylor Hobson Supports First UK Centre of Excellence in Metrology for Micro and Nano Technologies
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