Latest New Product News from Keithley Instruments, Inc.
Characterization Software supports automated wafer-level testing.Keithley Instruments, Inc. Cleveland, OH 44139 1891
Apr 02, 2013 Automated Characterization Suite (ACS) v5.0 combines multiple instruments into unified test environment and offers high power device libraries designed for use with Model 2651A (high current) and Model 2657A (high voltage) System SourceMeter® SMU instruments. This enables automated wafer-level testing of high-power semiconductor devices such as power MOSFETs, IGBTs, BJTs, and diodes. Hardware scan, recognition, and configuration management support comes standard.
Digital Multimeter features 5 ˝ digit dual line display.Keithley Instruments, Inc. Cleveland, OH 44139 1891
Dec 03, 2012 Suitable for portable, bench, and rackmount system applications, Model 2110 performs 15 measurement functions and 7 math functions. Unit has 0.012% 1-year basic DC voltage accuracy and 0.020% 1-year basic resistance accuracy up to 100 kΩ range. Providing up to 50,000 readings/sec, meter includes TMC-compliant USB 2.0 interface for use with SCPI test commands and GPIB option for use in system applications. Included PC software enables graphing and data sharing in Microsoft® Word and Excel.
Curve Tracers characterize devices up to 3,000 V and 100 A.Keithley Instruments, Inc. Cleveland, OH 44139 1891
Nov 08, 2012 Designed for characterizing high power semiconductor devices, including those based on silicon carbide and gallium nitride technology, Parametric Curve Tracer solutions come in 7 instrumentation, software, and test fixture configurations. All configurations offer flexibility to add new measurement channels as users' needs evolve, and include Windows-compatible ACS Automated Characterization Suite Basic Edition software, which provides control and analysis tools.
Picoammeter offers dual ±30 V non-floating bias sources.Keithley Instruments, Inc. Cleveland, OH 44139 1891
Oct 23, 2012 Housed in 2U half-rack enclosure, Model 6482 measures currents from 2 nA to 20 mA in decade steps with 1 fA resolution. Two independent picoammeter/source channels allow simultaneous 6 ˝ digit measurements across both channels. At 4 ˝ digit resolution, users can take up to 900 readings/sec on each channel. Model 6482 can provide ratio or delta measurements between 2 completely isolated channels, and these functions can be accessed via front panel or GPIB interface.
Programmable DC Power Supplies feature isolated output channels.Keithley Instruments, Inc. Cleveland, OH 44139 1891
Oct 17, 2012 Providing 0.03% basic voltage accuracy and 0.1% basic current readback accuracy, Model 2220-30-1 features 2 output channels, each capable of 30 V/1.5 A/45 W output, while Model 2230-30-1 offers two 30 V/1.5 A/45 W output channels, plus one 6 V/5 A/30 W output channel, typically used for powering digital circuits. Rear-panel remote sense terminals on each channel compensate for voltage drops in power supply leads to ensure that correct voltage is delivered to load terminals of DUT.
Programmable DMM displays 2 measurements simultaneously.Keithley Instruments, Inc. Cleveland, OH 44139 1891
Sep 27, 2012 Featuring dual display, 5 ˝-digit Model 2110 measures DC voltage up to 1,000 V and current to 10 A, AC voltage up to 750 V and current to 10 A, 2- and 4-wire resistance to 100 MΩ, temperature, frequency from 10 Hz to 300 KHz, and capacitance from 1 nF to 100 µF. System features external triggering, built-in reading buffer, and programmable A-D converter and filter settings that optimize SNR. With USB-only or USB/GPIB control options, Model 2110 integrates into test systems with other instruments.
SMU Instruments serve benchtop and R/D applications.Keithley Instruments, Inc. Cleveland, OH 44139 1891
Sep 27, 2012 Series 2600B System SourceMeter® SMU (Source Measurement Unit) Instruments include single- and dual-channel models that combine capabilities of power supply, current source, 6 ˝ digit multimeter, arbitrary waveform generator, pulse generator, and electronic load. While Models 2635B and 2636B offer resolution up to 0.1 fA, all models provide USB 2.0 connectivity, Model 2400 software emulation, various PC communication busses, and embedded plug-and-play I-V testing.
Parametric Test System offers extended measurement capabilities.Keithley Instruments, Inc. Cleveland, OH 44139 1891
Apr 11, 2012 Supported by KTE v5.4, S530 Parametric Test System can be configured for 48-pin full Kelvin switching and with integrated options for pulse generation, frequency measurements, and low voltage measurements. Switch matrix directs signals between instruments and test pins, providing sub-picoamp measurement resolution and low current guarding all the way to probe pin. With sample rate of up to 400 MSPS, oscilloscope system option provides measurements from 10 kHz to 20 MHz.
Semiconductor Source Meter suits high power testing.Keithley Instruments, Inc. Cleveland, OH 44139 1891
Apr 03, 2012 Optimized for testing diodes, FETs, and IGBTs, Model 2657A High Power System SourceMeter® Instrument can source and sink up to 180 W of DC power at up to 3,000 V. Unit's 6˝-digt measurement engine enables 1 fA current measurement resolution to support low-leakage requirements of power semiconductor devices. Model 2657A provides choice of digitizing or integrating measurement modes for characterizing both transient and steady-state behavior, including rapidly changing thermal effects.
Parametric Test Systems offer fully automatic operation.Keithley Instruments, Inc. Cleveland, OH 44139 1891
Jan 26, 2011 Available to semiconductor industry, S530 Parametric Test Systems feature high-throughput switch mainframe, full Kelvin measurements at probe card, and hardware protection modules. Low-current version, featuring 2-8 SMU (source measure unit) channels, is used for measuring characteristics such as sub-threshold leakage, gate leakage, etc., while high-voltage version has 3-7 SMU channels and is used for breakdown and leakage tests demanded by GaN, SiC, and Si LDMOS power devices.
Click below for more Product News from Keithley Instruments, Inc.
Other Company News From Keithley Instruments, Inc.
Mar 05, 2013
Keithley Parametric Curve Tracer Honored as a 2012 "Product of the Year"
Feb 05, 2013
Keithley's Model 2657A High Power System SourceMeter® Instrument Named One of EDN's 2012 Hot 100 Products
Apr 27, 2011
Keithley Publishes E-Handbook on Precision Low Current, High Resistance Measurements
Apr 12, 2011
Keithley Publishes E-Guide to High Performance Digital Multimeters
Mar 16, 2011
Free Keithley Web-Based Seminar Explores Graphene Characterization Techniques
Feb 15, 2011
Keithley Releases Four New ""How-To"" Videos on Operating Electrometers
Feb 07, 2011
Free Keithley Webinar Teaches Fundamentals of Hall Effect Measurements
Dec 08, 2010
Keithley Instruments Acquired by Danaher Corporation
Dec 07, 2010
Keithley Instruments Releases 11 New 'How-To' Videos on Configuring and Operating Source-Measure Units
Dec 02, 2010
Free Keithley Webinar Teaches Fundamentals of Bias Temperature Instability Measurement Methods
Nov 19, 2010
Keithley Instruments' Shareholders Approve Merger Agreement
Nov 15, 2010
Free Keithley Web-Based Seminar Teaches Optimum Methods and Techniques for Making Electrical Resistivity Measurements
Nov 02, 2010
Zoughi to Receive 2011 IEEE Joseph F. Keithley Award for Contributions to Microwave and Millimeter Wave Measurement Techniques
Oct 21, 2010
Free Keithley Web-Based Seminar Reveals How to Conquer Challenging High Brightness LEDs Measurements
Oct 08, 2010
Nobel Winners in Physics Used Keithley Instrumentation in Prize-Winning Research
Sep 29, 2010
Danaher to Acquire Keithley Instruments
Sep 09, 2010
Free Keithley Web-Based Seminar Exposes the Secrets to Ensuring Accurate I-V Measurements
Nov 24, 2008
Keithley to Develop RF WiMAX Production Test Solution for Fujitsu Microelectronics' New WiMAX PCMCIA Card and WiMAX USB Dongle Devices
Feb 11, 2008
Keithley Partners with Stratosphere Solutions to Enable Advanced Process Characterization at Sub-65nm
Jan 30, 2008
Keithley Releases New 2008 Test And Measurement Product Guide
Dec 13, 2007
Keithley Joins WiMAX Forum®
Nov 16, 2007
Keithley Receives NorthCoast 99 Distinction as Great Workplace
Oct 15, 2007
Keithley - Industry-Leading Capabilities for MIMO RF Signal Generators and Analyzers
Oct 09, 2007
Keithley Makes C-V/I-V/Pulse Testing Faster, Simpler, and More Economical with New Integrated C-V Module and Software in Market-Leading 4200-SCS
Oct 01, 2007
Keithley's German Service Center Joins List of ISO 17025 Accredited Laboratories
Sep 20, 2007
Keithley and CNSI Announce Nanotechnology Measurement Partnership
Jul 18, 2007
Keithley Announces Advanced Parametric Probe Card Availability
Jul 18, 2007
Keithley Announces Joint Development Partnership with France's CEA LETI Laboratory to Pursue Advanced Nanotechnology and Semiconductor Materials Research
Jul 12, 2007
Keithley Instruments Recognized for Excellence by Texas Instruments
Mar 14, 2007
Keithley Publishes New Data Acquisition, Measurement, and Control Handbook
Feb 27, 2007
Keithley Instruments Named Finalist for EDN Magazine Innovation Award
Feb 15, 2007
Keithley Receives Best in Test Award from Test & Measurement World Magazine
Jan 31, 2007
Keithley Recognized for Outstanding Customer Satisfaction in Semiconductor Industry
Jan 17, 2007
Keithley Receives Product of the Year Award from Electronic Products Magazine
Nov 14, 2006
Keithley Introduces PXI Products for Hybrid Test Systems in Production Applications
Mar 07, 2006
Keithley Plays Key Role in New IEEE Test Standards for Carbon Nanotubes
Jan 17, 2006
Keithley Recognizes 60 Year Milestone of Innovation
Oct 17, 2005
Keithley Opens New Offices in Asia to Optimize Local Applications and Customer Support
Sep 01, 2005
Hamilton Receives 2005 IEEE Joseph F. Keithley Award for Outstanding Contributions in the Field of Electrical Measurement
Aug 30, 2005
Keithley Wins 19th Prestigious R&D 100 Award
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