Characterization Software supports automated wafer-level testing.

Keithley Instruments, Inc.    Cleveland, OH 44139 1891
Apr 02, 2013 Automated Characterization Suite (ACS) v5.0 combines multiple instruments into unified test environment and offers high power device libraries designed for use with Model 2651A (high current) and Model 2657A (high voltage) System SourceMeter® SMU instruments. This enables automated wafer-level testing of high-power semiconductor devices such as power MOSFETs, IGBTs, BJTs, and diodes. Hardware scan, recognition, and configuration management support comes standard.

Digital Multimeter features 5 ½ digit dual line display.

Keithley Instruments, Inc.    Cleveland, OH 44139 1891
Dec 03, 2012 Suitable for portable, bench, and rackmount system applications, Model 2110 performs 15 measurement functions and 7 math functions. Unit has 0.012% 1-year basic DC voltage accuracy and 0.020% 1-year basic resistance accuracy up to 100 kΩ range. Providing up to 50,000 readings/sec, meter includes TMC-compliant USB 2.0 interface for use with SCPI test commands and GPIB option for use in system applications. Included PC software enables graphing and data sharing in Microsoft® Word and Excel.

Curve Tracers characterize devices up to 3,000 V and 100 A.

Keithley Instruments, Inc.    Cleveland, OH 44139 1891
Nov 08, 2012 Designed for characterizing high power semiconductor devices, including those based on silicon carbide and gallium nitride technology, Parametric Curve Tracer solutions come in 7 instrumentation, software, and test fixture configurations. All configurations offer flexibility to add new measurement channels as users' needs evolve, and include Windows-compatible ACS Automated Characterization Suite Basic Edition software, which provides control and analysis tools.

Picoammeter offers dual ±30 V non-floating bias sources.

Keithley Instruments, Inc.    Cleveland, OH 44139 1891
Oct 23, 2012 Housed in 2U half-rack enclosure, Model 6482 measures currents from 2 nA to 20 mA in decade steps with 1 fA resolution. Two independent picoammeter/source channels allow simultaneous 6 ½ digit measurements across both channels. At 4 ½ digit resolution, users can take up to 900 readings/sec on each channel. Model 6482 can provide ratio or delta measurements between 2 completely isolated channels, and these functions can be accessed via front panel or GPIB interface.

Programmable DC Power Supplies feature isolated output channels.

Keithley Instruments, Inc.    Cleveland, OH 44139 1891
Oct 17, 2012 Providing 0.03% basic voltage accuracy and 0.1% basic current readback accuracy, Model 2220-30-1 features 2 output channels, each capable of 30 V/1.5 A/45 W output, while Model 2230-30-1 offers two 30 V/1.5 A/45 W output channels, plus one 6 V/5 A/30 W output channel, typically used for powering digital circuits. Rear-panel remote sense terminals on each channel compensate for voltage drops in power supply leads to ensure that correct voltage is delivered to load terminals of DUT.

Programmable DMM displays 2 measurements simultaneously.

Keithley Instruments, Inc.    Cleveland, OH 44139 1891
Sep 27, 2012 Featuring dual display, 5 ½-digit Model 2110 measures DC voltage up to 1,000 V and current to 10 A, AC voltage up to 750 V and current to 10 A, 2- and 4-wire resistance to 100 MΩ, temperature, frequency from 10 Hz to 300 KHz, and capacitance from 1 nF to 100 µF. System features external triggering, built-in reading buffer, and programmable A-D converter and filter settings that optimize SNR. With USB-only or USB/GPIB control options, Model 2110 integrates into test systems with other instruments.

SMU Instruments serve benchtop and R/D applications.

Keithley Instruments, Inc.    Cleveland, OH 44139 1891
Sep 27, 2012 Series 2600B System SourceMeter® SMU (Source Measurement Unit) Instruments include single- and dual-channel models that combine capabilities of power supply, current source, 6 ½ digit multimeter, arbitrary waveform generator, pulse generator, and electronic load. While Models 2635B and 2636B offer resolution up to 0.1 fA, all models provide USB 2.0 connectivity, Model 2400 software emulation, various PC communication busses, and embedded plug-and-play I-V testing.

Parametric Test System offers extended measurement capabilities.

Keithley Instruments, Inc.    Cleveland, OH 44139 1891
Apr 11, 2012 Supported by KTE v5.4, S530 Parametric Test System can be configured for 48-pin full Kelvin switching and with integrated options for pulse generation, frequency measurements, and low voltage measurements. Switch matrix directs signals between instruments and test pins, providing sub-picoamp measurement resolution and low current guarding all the way to probe pin. With sample rate of up to 400 MSPS, oscilloscope system option provides measurements from 10 kHz to 20 MHz.

Semiconductor Source Meter suits high power testing.

Keithley Instruments, Inc.    Cleveland, OH 44139 1891
Apr 03, 2012 Optimized for testing diodes, FETs, and IGBTs, Model 2657A High Power System SourceMeter® Instrument can source and sink up to 180 W of DC power at up to 3,000 V. Unit's 6½-digt measurement engine enables 1 fA current measurement resolution to support low-leakage requirements of power semiconductor devices. Model 2657A provides choice of digitizing or integrating measurement modes for characterizing both transient and steady-state behavior, including rapidly changing thermal effects.

Parametric Test Systems offer fully automatic operation.

Keithley Instruments, Inc.    Cleveland, OH 44139 1891
Jan 26, 2011 Available to semiconductor industry, S530 Parametric Test Systems feature high-throughput switch mainframe, full Kelvin measurements at probe card, and hardware protection modules. Low-current version, featuring 2-8 SMU (source measure unit) channels, is used for measuring characteristics such as sub-threshold leakage, gate leakage, etc., while high-voltage version has 3-7 SMU channels and is used for breakdown and leakage tests demanded by GaN, SiC, and Si LDMOS power devices.