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Agilent Technologies, Inc.
5301 Stevens Creek Blvd.
Santa Clara, CA, 95051
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Detailed Contact Information:
Agilent Technologies to Demonstrate Test and Measurement Solutions in Coherent Communication at ECOC
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Company Information:
Agilent Technologies, Inc.
5301 Stevens Creek Blvd. Santa Clara , CA 95051
USA
Phone: 408-345-8886
FAX: 408-345-8474
http://www.agilent.com
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Latest New Product News from Agilent Technologies, Inc.
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Spectroscopy System provides nanoscale identification, analysis.Agilent Technologies, Inc.
Santa Clara, CA 95051
May 23, 2013
Intended for life science and materials science applications, AFM/Raman system integrates Agilent 6000ILM AFM (atomic force microscope) and HORIBA XploRA INV (inverted Raman microscope). Functionality lets researchers exceed optical diffraction limit to achieve nanoscale resolution as they perform Raman spectroscopy. Capabilities include AFM/Raman co-localization, tip-enhanced Raman spectroscopy for transparent samples, and AFM force-volume spectroscopy.
 Automated Switching Solution tests multilane digital buses.Agilent Technologies, Inc.
Santa Clara, CA 95051
May 21, 2013
Used for testing each lane of multilane digital bus interfaces (DisplayPort, HDMI, PCIe®, MIPI™ D-PHY/M-PHY), automated switching solution comprises switch matrix software options for Infiniium compliance applications and preconfigured switch matrix hardware models that work with applications. Supported switch matrix hardware models include Agilent U3020AS26 and BitifEye BIT-2100 Series. Solution works with Infiniium Series oscilloscopes and is available on compliance applications.
RF Vector Signal Generators offer in-depth signal simulation.Agilent Technologies, Inc.
Santa Clara, CA 95051
May 13, 2013
With MXG and EXG X-Series, user can apply channel corrections directly to fixtures and devices under test. Proprietary ASIC, in concert with Agilent USB power sensor, allows automatic amplitude and phase flatness corrections or equalization. Connectivity options enable realistic complex-modulated direct digital stimulus and digital upconversion using N5102A digital signal interface module. By allowing automatic leveling for external RF amplifiers, power servo enhancement accelerates verification.
Test Software automates Verizon's IMS VoIP compliance test plan.Agilent Technologies, Inc.
Santa Clara, CA 95051
May 13, 2013
Used in conjunction with Agilent PXT and 8960 wireless communications test sets, N5973A Interactive Functional Test Automation software includes scripts that provide full automation for voice-over-LTE functional tests such as call setup and teardown, call waiting, and handovers to eHRPD. Solution enables developers and operators to repeatedly generate measurement reports in accordance with Verizon IMS VoIP compliance test plan.
Simulation Software supports GPS, GLONASS, Galileo, Beidou.Agilent Technologies, Inc.
Santa Clara, CA 95051
Apr 26, 2013
Agilent N7609B Signal Studio for GNSS software offers real-time and scenario generator options, including PFP for GPS, SFP for GLONASS, UFP for Galileo, and WFP for Beidou. Users can simulate stationary/moving receivers, and functionality also supports custom scenario creation/editing. There are 40 channels for line-of-sight and multipath signals available for any combination of GPS, GLONASS, and Beidou satellite navigation systems; 16 additional channels are available for Galileo system.
SAS-3 Test Software covers 12 Gbps transmitter measurements.Agilent Technologies, Inc.
Santa Clara, CA 95051
Apr 18, 2013
Intended for Infiniium 90000 series oscilloscopes, N5412C Serial Attached SCSI - 3 (SAS-3) compliance test software provides design and validation engineers with means to verify physical-layer transmitter compliance for SAS 1.5, 3, 6, and 12 Gbps silicon, expanders, port multipliers, as well as high-density and solid-state disk drives. Automated solution integrates SAS3_EYEOPENING script, performs range of tests, and displays results in flexible report format.
Oscilloscope Software decodes protocol packets.Agilent Technologies, Inc.
Santa Clara, CA 95051
Mar 27, 2013
Designed to run on Infiniium 9000A and 9000 H-Series oscilloscopes as well as 90000A, 90000 X-, and 90000 Q-Series, N8824A Software decodes protocol packets for MIPI RFFE v1.10 specification. R&D design and validation teams can use software to address startup debugging and to examine traffic between RF front-end devices. Using decoder with oscilloscope also allows engineers to meet accurate timing requirements associated with RFFE packets.
 Multiport Optical Power Meters are optimized for sensitivity.Agilent Technologies, Inc.
Santa Clara, CA 95051
Mar 21, 2013
Programmable with SPCI commands, both 2-channel N7747A and 4-channel N7748A enable engineers to make parallel multiport measurements and monitor weak signals and small signal changes. Instruments can detect power levels down to -110 dBm and log data at intervals down to 25 µsec with up to 1 million points per channel. Equally large data buffer supports simultaneous measurement and data transfer. USB 2.0, LAN, and GPIB interfaces are included as standard.
 Multi-wavelength Meter has 2 year recalibration period.Agilent Technologies, Inc.
Santa Clara, CA 95051
Mar 21, 2013
With ±0.2 ppm absolute wavelength accuracy and ±0.15 ppm differential accuracy, Agilent 86122C is suited for optical communication testing. Wavelength range of 1,270–1,650 nm covers all fiber-to-the-home, metro, and long-haul transmission systems, while ability to simultaneously measure spectra of up to 1,000 laser lines exceeds requirements for fully populated DWDM systems. Measurement applications for optical SNR, wavelength, and power drift are built in.
 Atomic Force Microscope supports multiple stages for versatility.Agilent Technologies, Inc.
Santa Clara, CA 95051
Mar 18, 2013
Along with fully addressable and programmable 200 x 200 mm stage and stage adapter for imaging small samples, 5600LS supports 300 x 300 mm stage for handling larger semiconductor wafer samples and multisample 2 in. wafer stage suited for research involving optoelectronics and LEDs. Motorized stage accommodates single sample up to 200 mm dia x 30 mm tall or up to 9 small samples with 200 mm vacuum chuck; probes are positioned to image and map specimens with 0.5 µm precision.
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