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GOEPEL electronics LLC
9737 Great Hills Trail, Ste. 170
Austin, TX, 78759

Detailed Contact Information:
Evaluation Board for CION LX facilitates test and development.   Return to story
Company Information:
GOEPEL electronics LLC
9737 Great Hills Trail, Ste. 170
Austin , TX  78759   USA
Phone: 512-782-2500
FAX: 512-502-3076
http://www.goepelusa.com
  
 
Latest New Product News from GOEPEL electronics LLC
Products or services this company supplies:
 
Click links to find other companies which supply the same products or services.
Evaluation Board for CION LX facilitates test and development.

Evaluation Board for CION LX facilitates test and development.

GOEPEL electronics LLC    Austin, TX 78759
Jun 02, 2014 Designed to demonstrate technical test capabilities of CION LX JTAG controllable Tester on Chip (ToC), CION LX Evaluation Board (EVB) lets users verify all operating modes as well as develop applications and test scenarios. Circuit pins are accessible via connectors, and board also provides such additional resources as LEDs and adjustable clock generator up to 170 MHz. Control of features is carried out via JTAG port, and TAP connector allows direct access via Boundary Scan controllers.
Interface Card supports boundary scan and processor emulation.

Interface Card supports boundary scan and processor emulation.

GOEPEL electronics LLC    Austin, TX 78759
Mar 14, 2014 Available for SCANFLEX® Boundary Scan hardware platform, Model TIC122 features programmable multi-bus interface enabling nearly unlimited compatibility with standardized and proprietary microprocessor debug protocols and simultaneously supporting all Boundary Scan standards. Active test head is specifically developed for in-fixture utilization with adaptive streaming technology VarioTAP®. In addition to bus signals, it provides emulation signals that can be integrated in streaming procedure.
Parallel Test and Programming Kit targets gang applications.

Parallel Test and Programming Kit targets gang applications.

GOEPEL electronics LLC    Austin, TX 78759
Dec 10, 2013 Offering complete solution for applications based on Embedded System Access (ESA) technologies, SFX Gang Test Module Kit may be used for parallel test and programming of up to 16 or 32 different assemblies with integrated Mass Interconnect Interface. Kit comprises 3 interconnected modules – TAP transceiver, multipurpose parallel I/O unit, and power management unit – that have onboard Mass Interconnect Interfaces and are centrally controlled.
Inline Production System supports programming and board test.

Inline Production System supports programming and board test.

GOEPEL electronics LLC    Austin, TX 78759
Dec 09, 2013 Designed for in-system programming and board test based on Embedded System Access technologies, RAPIDO™ can utilize planar downholders in sandwich construction to safely handle ultra-thin, rigid-flexible boards with contact gaps up to 50 mil. All fixtures are equipped with intelligent module for identification and data storage, ensuring compatibility between fixture and target board. In addition, bandwidth, UUT, and test program can be automatically configured to avoid manual faults.

IP Model Library fosters integration of Xilinx Kintex7 FPGAs.

GOEPEL electronics LLC    Austin, TX 78759
Nov 06, 2013 Promoting ChipVORX® technology utilization, IP model library for Xilinx® Kintex7 FPGA family enables fully automatic usage of native design-integrated FPGA for execution of various at-speed test and programming tasks utilizing JTAG interface and special softcores. Without detailed FPGA knowledge, users can test DDR(x) memories, measure cycle frequencies, verify high-speed I/O by BERTs and eye diagram visualization, as well as program Flash memories at high speed.
Boundary Scan Test System handles complex projects.

Boundary Scan Test System handles complex projects.

GOEPEL electronics LLC    Austin, TX 78759
Jul 17, 2013 Comprising hardware and software, SCANFLEX® Designer Studio is designed for test and debug tasks in complex projects in both design and production stages. Hardware is preconfigured for utilization of Embedded System Access technologies, and can be extended by additional I/O modules for further test and programming tasks. Offered in 3 versions, bundle's performance level may be upgraded from pure test to in-system programming of moderate Flash and PLDs, up to operations with layout visualization.
JTAG Boundary Scan Tester features desktop form factor.

JTAG Boundary Scan Tester features desktop form factor.

GOEPEL electronics LLC    Austin, TX 78759
May 07, 2013 Combining all test electronics and basic mechanics, modular JULIET™ series supports all Embedded System Access (ESA) technologies for high-speed, in-system programming of Flash, PLD, and MCU as well as structural and functional at-speed board test. In addition to Boundary Scan, unit supports such test strategies as Processor Emulation and Chip Embedded Instruments respectively based on VarioTAP® and ChipVORX® technologies. Universal adaptors are supplied as standard.
Inline Production System programs non-volatile memories.

Inline Production System programs non-volatile memories.

GOEPEL electronics LLC    Austin, TX 78759
May 02, 2013 Developed for in-system programming of non-volatile memories such as Flash, MCUs, and PLDs, RAPIDO™ RPS3000-S32XL provides surface for multi-board panels up to 500 x 500 mm. System, based on Embedded System Access (ESA) technologies and SCANFLEX® architecture with Short Wire Interface for up to 32 sites, supports double-sided probing for up to 3,000 nails. Functionality also allows for combination of programming tasks with various test strategies.
Boundary Scan Controller features wireless LAN interface.

Boundary Scan Controller features wireless LAN interface.

GOEPEL electronics LLC    Austin, TX 78759
Oct 29, 2012 Providing Triple Stream/Dual Band WLAN interface for theoretical transmission speed up to 450 Mbps, SFX/WSL1149-(x) Series enables wireless utilization of Embedded System Access technologies for testing, programming, and debugging of complex chips, boards, and systems. Controller is compatible with IEEE standard 802.11a/b/g/n and provides both USB 2.0 and Gigabit Ethernet interfaces. Three models of different performance classes can be configured by software, enabling TCK frequencies up to 80 MHz.

Model Libraries support Altera Arria®V FPGA devices.

GOEPEL electronics LLC    Austin, TX 78759
Sep 06, 2012 Consisting of Intellectual Properties for implementation and control of chip embedded instruments, ChipVORX® models enable multitude of FPGA-assisted test and programming functions, such as programming of parallel NOR and NAND-Flash, frequency measurement, and high-speed programming of serial Boot Flash. Within ChipVORX framework, instruments are temporarily loaded, configured, and finally controlled as soft macros via standard IEEE 1149.1 TAP into FPGA.


Click below for more Product News from GOEPEL electronics LLC

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Other Company News From GOEPEL electronics LLC

Apr 30, 2014

GOEPEL Electronic Extends IEEE1445 Interface for Connection to Board Level Simulation


Mar 04, 2014

GOEPEL Electronic will Present a Real Firework of Innovation at SMT/Hybrid/Packaging Show in Nuremberg/Germany


Dec 11, 2013

Cooperation between GOEPEL Electronic and Teradyne Enables New Boundary Scan Integration Solutions


Oct 23, 2013

Deep AOI Insight at Productronica


Sep 09, 2013

GOEPEL Electronic and iSYSTEM Develop Integrated Platform for Software and Hardware Validation and Test


Mar 15, 2013

Electronic and Optical Test and Measurement Equipment under One Roof


Nov 13, 2012

Boundary Scan Integration into New Generation of TEST-OK Functional Test Equipment


Nov 06, 2012

GOEPEL Electronic Demonstrates first ChipVORX® Prototype Instruments for Bit Error Rate Tests (BERT)


Jun 22, 2012

Extended Integration of GOEPEL electronic's Boundary Scan into Rohde & Schwarz TSVP Platform


Jun 07, 2012

Platform Cable USB II from Xilinx


Feb 28, 2012

GOEPEL Electronic Demonstrates First Evaluation Kit for Embedded System Access


Feb 07, 2012

Accelerated Distribution of AXI Systems in Asia


Nov 15, 2011

GOEPEL Electronic Accelerates Processor Emulation Tests on Real-Time Level


Nov 15, 2011

GOEPEL Electronic and Telefunken Semiconductor Force Utilization of System Level JTAG Applications


Oct 29, 2011

Focus on "Get the Total Coverage!"


Oct 19, 2011

GOEPEL Electronic Increases Engagement in Open Source Initiative goJTAG by New Demo Kit


Oct 10, 2011

GOEPEL Electronic Demonstrates IJTAG (IEEE P1687) Support in SYSTEM CASCON(TM)


Aug 30, 2011

GOEPEL Electronic Provides New Test and Programming Strategies for Texas Instruments DaVinci Media Processors


Jul 28, 2011

Made in Germany: Industry leading X-Ray and Optical Test Equipment Now Available in the US


Jul 12, 2011

GOEPEL Electronic Supports Picochip in Testing Next Generation 'Small Cell' Baseband Chips


Jul 09, 2011

FPGA Embedded ChipVORX® IP Enables Ultra Fast Flash Programming


Mar 09, 2011

GOEPEL Electronic Extends BSDL Testbench to Multi Chip Modules and 3D Chips


Feb 08, 2011

GOEPEL Electronic to Exhibit Industry Leading Test Equipment at APEX 2011


Jan 11, 2011

GOEPEL Electronic Continues Webinar Series on Automated Optical Inspection


Dec 20, 2010

In-System Emulation Technology VarioTAP® Meets TigerSHARC® DSP from Analog Devices(TM)


Dec 20, 2010

Boundary Scan Test Vector Migration into SPEA 3030 Board Testers


Nov 30, 2010

Vector Link Connects Agilent In-Circuit Tester with JTAG/Boundary Scan Software Platform SYSTEM CASCON(TM)


Oct 20, 2010

GOEPEL Electronics and Geotest to Host Seminars in the Baltimore and Washington DC Area


Sep 30, 2010

In-System Emulation Technology VarioTAP® Powers Energy Micro® EFM32 Gecko MCU with Serial Wire Debug (SWD) from ARM®


Sep 14, 2010

Cooperation between GOEPEL Electronic and IPextreme Accelerates Support of IEEE1149.7 (cJTAG)


Aug 25, 2010

In-System Emulation Technology VarioTAP® Extended to Freescale ColdFire Architecture


Apr 06, 2010

Boundary Scan Module Extends Structural Test Coverage to DDR3 Memory Interfaces


May 05, 2009

Reliable Detection of Critical Faults Independent from the PCB Layout


May 05, 2009

Vector Link Combines Teradyne® In-Circuit Tester with Boundary Scan Software Platform SYSTEM CASCON(TM)


Nov 06, 2006

Boundary Scan Platform SCANFLEX® Successfully Integrated into Teradyne In-Circuit Tester


Oct 26, 2006

GOEPEL electronic Demonstrates First VarioCore-IP(TM) for Universal Programming and Testing Applications






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