Metrology Tool provides composition and thickness measurement.

Solar Metrology    Holbrook, NY 11714
Nov 24, 2009 Consisting of atmospheric in-line x-ray fluorescence metrology tool platform, System SMX-ILH provides composition and thickness measurements for thin film solar PV metal film stacks on flexible roll to roll substrates such as stainless steel, aluminum, and polyimide or rigid substrates such as float glass. Remote SMX-ILH models are designed to measure in one static location or across gradient. Typical measurement applications include Mo thickness and all CIGS combinations.

XRF System measures thickness of photovoltaic depositions.

Solar Metrology    Holbrook, NY 11714
Sep 28, 2009 Utilizing X-ray fluorescence, it-situ System SMX-ISI provides composition and thickness measurements for thin film solar PV metal film stacks on flexible roll to roll substrates such as stainless steel, aluminum, and polyimide or rigid substrates such as float glass. Typical measurement applications include Mo thickness and all CIGS combinations. System can be integrated into any vacuum deposition tool, vacuum process station, or point of vacuum process line.

XRF Glass Panel Sampling Tool suits CIGS/CdTe PV panel film.

Solar Metrology    Holbrook, NY 11714
Mar 06, 2009 Featuring 600 x 1,200 mm lateral X/Y range of measurement, SMX-FPV is designed for near-line film composition and thickness control of CIGS and CdTe film stacks. It also provides process control of active, contact, and TCO layers. Detailed analysis of full photovoltaic panels is possible, including copper and gallium ratio determination as well as panel gradient analysis. Areas of use include research and process development, in-process monitoring, and post-process QC.

XRF Analyzer has 600 x 1,200 mm lateral xy measurement range.

Solar Metrology    Holbrook, NY 11714
Dec 02, 2008 Designed for in-line film composition and thickness control of CIGS and CdTe film stacks, SMX-ILH can measure rigid glass substrates as well as flexible stainless steel and polyimide roll-to-roll substrates. It provides process control of active, contact, and TCO layers and is capable of insertion into printed, electrochemical, and thermal deposited film processes. Optional proprietary Thermal shield allows for film control at panel temperatures of up to 300°C.