Latest New Product News from Goepel Electronics, Ltd
Embedded Instruments automate differential clock signal test.Goepel Electronics, Ltd Austin, TX 78759
Apr 01, 2014 Used for universal frequency measurement based on FPGA soft macros, ChipVORX® models consist of modular IP capable of controlling chip embedded instruments. Products allow FPGA-assisted testing of differential clock signals as well as measurement of frequencies directly inside system application. This lets user verify dynamics of signals and increase test coverage, where workflow is fully automated by software. Counter function is also available.
FPGA Embedded Instruments support multi-channel BERT.Goepel Electronics, Ltd Austin, TX 78759
Mar 14, 2014 Offering IP-based technology for implementation, access, and control of chip embedded instruments via IEEE Std. 1149.x/JTAG, ChipVORX® also supports FPGA embedded instruments in form of softcores. System takes over complete process flow, including Target FPGA programming, IP to pin configuration, instrument control, data processing, and final IP unloading. Users can evaluate transmission channel quality via parallel measurement of bit error rate on all channels simultaneously.
Validation/Test Platform supports Intel® Quark SoCs.Goepel Electronics, Ltd Austin, TX 78759
Mar 14, 2014 SYSTEM CASCON™ supports Intel® Quark SoCs based on utilization of native debug ports as control interface for platform debugging, electric validation, and production tests. This lets Intel Quark-centric boards with limited physical access and high speed signals be tested structurally and functionally. Integrated SDE offers tool suite, GUI, and graphical project development for synergistic utilization of all ESA technologies, enabling use without nail or probe access (non-invasive).
IDE Software supports 4th Gen Intel® Core(TM) processors.Goepel Electronics, Ltd Austin, TX 78759
Aug 07, 2013 With comprehensive tool suite and graphical project development for synchronized utilization of ESA technologies, SYSTEM CASCON™ provides validation and test of complex processor boards. Integrated software development environment enables test, programming, and debug operations without nail or probe access. In addition to JTAG/Boundary Scan/ IEEE 1149.x, key elements of ESA philosophy are Processor Emulation Test, Chip Embedded Instrumentation, Core Assisted Programming, and FPGA Assisted Test.
Frame Grabber tests video data in infotainment systems.Goepel Electronics, Ltd Austin, TX 78759
Jun 14, 2013 Featuring modular architecture, Video Dragon tests high-speed LVDS connections and HDMI interfaces. When utilized as frame grabber, device records and analyzes single images and video sequences in raw-data format or as compressed files. Frame rate includes up to 60 images/sec at max color depth of 24 bits. Utilizing serializer in module port, Video Dragon turns into frame generator that may generate and transmit single images, image sequences, and video streams to target device to be tested.
TAP Transceiver provides 16 parallel test access ports.Goepel Electronics, Ltd Austin, TX 78759
Feb 27, 2013 Featuring integrated power supply, 19 in. rackmount SFX-TAP16/G-RM is designed for testing and programming of up to 16 electronic assemblies in parallel. Architecture supports Embedded System Access technologies, including boundary scan, processor emulation, and chip-embedded instrumentation, enabling basic paradigm change without mechanical probe access. SCANFLEX module was developed specifically for gang applications, whereby various test and programming strategies can be combined.
Boundary Scan Test System targets entry level users.Goepel Electronics, Ltd Austin, TX 78759
Feb 27, 2013 In addition to Mixed Signal I/O module, PicoTAP Designer Studio includes PicoTAP Boundary Scan controller, which is powered via USB and can be plugged directly into I/O module. Hardware/software bundle also contains CION Module FXT-96/A and SYSTEM CASCON™ Basic/SX Development Station. Performance level can be extended from pure test in base version to additional applications such as in-system programming of small Flash and PLD or memory and cluster test.
Inline Production System combines programming, test strategies.Goepel Electronics, Ltd Austin, TX 78759
Dec 12, 2012 For high-speed programming as well as board test, RAPIDO™ RPS3000-(x) models are based on Embedded System Access (ESA) technologies and support double-sided probing for up to 3,000 nails. Non-volatile memories – Flash, MCUs, PLDs – can be on-board programmed, and SCANFLEX® architecture with Short Wire Interface for up to 32 sites makes it is possible to combine programming tasks with test strategies such as Boundary Scan, Processor Emulation, Chip Embedded Instruments, or Functional Test.
AOI System inspects THT components and solder joints.Goepel Electronics, Ltd Austin, TX 78759
Dec 07, 2012 Enabled by integration before wave soldering oven, OptiCon THT-Line enables parallel inspection of mounted components before soldering processes as well as PCB solder joints during return transport in THT production line. Camera system with focal range up to 80 mm inspects PCB component side, enabling detected faults to be rectified before soldering process. For solder joint inspection, scanner system integrated into lower transport area checks PCBs during return transport.
Contacting Solution facilitates assembly test.Goepel Electronics, Ltd Austin, TX 78759
Dec 05, 2012 G-TAP is used for contacting of electronic assemblies, in particular JTAG bus, for testing and programming. Module can be utilized in stand-alone operations and as integrated solution in existing electronic and optical test systems. Inline solution can compensate PCB position tolerances of up to 1 mm, automatically adapting to UUT. This enables utilization in test systems not designed for probe contacting. Containing 11 signals, precondition is special Pad design on assembly.
Click below for more Product News from Goepel Electronics, Ltd
Other Company News From Goepel Electronics, Ltd
Feb 18, 2014
Extensive Test and Communication Solutions at Automotive Testing Expo India 2014
Nov 06, 2012
Joined Forces to Provide Chip Level Debug in Board and System Environments
Oct 15, 2012
GOEPEL Electronic Combines Boundary Scan with FlexRIO from National Instruments
Oct 10, 2012
GOEPEL Electronic Accelerates Graphical Boundary Scan Project Development for Multi Board Designs
|Home | My ThomasNet News® | Industry Market Trends® | Submit Release | Advertise | Contact News | About Us|
Brought to you by Thomasnet.com
Browse ThomasNet Directory|