Latest New Product News from Goepel Electronics, Ltd
Universal Processor Emulation is available for TI AM355x series.Goepel Electronics, Ltd Austin, TX 78759
Jul 17, 2014 VarioTAP® technology is available for universal processor emulation for Texas Instruments AM355x products of Sitara™ series. Configuration provides design-integrated test and programming instruments via native debug port. Respective VarioTAP® model, as part of IP library, contains all relevant access information for respective target processor. Users can select processor corresponding to their design and then test and validate connected hardware unit as well as program Flash memories.
3D Inspection System is capable of sintering paste evaluation.Goepel Electronics, Ltd Austin, TX 78759
Jul 16, 2014 With hardware and software adaptions, SPI-LINE 3D electronic solder paste inspection system handles inspection of printed sintering paste in electronic assemblies manufacturing. High-speed 3D camera head can capture thin sintering paste layers with precision, while integrated algorithms enable evaluation of sintered paste printing in addition to accurate and rapid measurement of height, volume, and offset of applied sintering paste. UI also facilitates test program generation.
ISP Flash Program Generator conserves time and effort.Goepel Electronics, Ltd Austin, TX 78759
Jul 09, 2014 Supporting all ISP (In-System Programming) options, Automated Flash Program Generator (AFPG) automatically generates scripts for universal ISP of non-volatile memory, such as flash devices, and MCUs with integrated flash via boundary scan. Mounted devices are programmed in native environment instead of as individual components before assembly. Tool provides graphical definition of command sequence, possibilities for bad block handling, multi-site support, and corresponding block library.
Boundary Scan Module facilitates DDR3-DIMM socket testing.Goepel Electronics, Ltd Austin, TX 78759
Jul 01, 2014 Once plugged into test socket, CION Module SO-DIMM204-3/ECC allows structural test coverage of DDR3 memory interfaces. All signal pins, as well as almost all Ground-Pins, can be tested via Boundary Scan. Equipped with CION™ Boundary Scan ASIC, module can be connected to any Test Access Point (TAP) and lets user detect link failures. Tests take fractions of seconds, and even parallel testing of multiple memory interfaces is possible.
Embedded Instruments automate differential clock signal test.Goepel Electronics, Ltd Austin, TX 78759
Apr 01, 2014 Used for universal frequency measurement based on FPGA soft macros, ChipVORX® models consist of modular IP capable of controlling chip embedded instruments. Products allow FPGA-assisted testing of differential clock signals as well as measurement of frequencies directly inside system application. This lets user verify dynamics of signals and increase test coverage, where workflow is fully automated by software. Counter function is also available.
FPGA Embedded Instruments support multi-channel BERT.Goepel Electronics, Ltd Austin, TX 78759
Mar 14, 2014 Offering IP-based technology for implementation, access, and control of chip embedded instruments via IEEE Std. 1149.x/JTAG, ChipVORX® also supports FPGA embedded instruments in form of softcores. System takes over complete process flow, including Target FPGA programming, IP to pin configuration, instrument control, data processing, and final IP unloading. Users can evaluate transmission channel quality via parallel measurement of bit error rate on all channels simultaneously.
Validation/Test Platform supports Intel® Quark SoCs.Goepel Electronics, Ltd Austin, TX 78759
Mar 14, 2014 SYSTEM CASCON™ supports Intel® Quark SoCs based on utilization of native debug ports as control interface for platform debugging, electric validation, and production tests. This lets Intel Quark-centric boards with limited physical access and high speed signals be tested structurally and functionally. Integrated SDE offers tool suite, GUI, and graphical project development for synergistic utilization of all ESA technologies, enabling use without nail or probe access (non-invasive).
IDE Software supports 4th Gen Intel® Core(TM) processors.Goepel Electronics, Ltd Austin, TX 78759
Aug 07, 2013 With comprehensive tool suite and graphical project development for synchronized utilization of ESA technologies, SYSTEM CASCON™ provides validation and test of complex processor boards. Integrated software development environment enables test, programming, and debug operations without nail or probe access. In addition to JTAG/Boundary Scan/ IEEE 1149.x, key elements of ESA philosophy are Processor Emulation Test, Chip Embedded Instrumentation, Core Assisted Programming, and FPGA Assisted Test.
Frame Grabber tests video data in infotainment systems.Goepel Electronics, Ltd Austin, TX 78759
Jun 14, 2013 Featuring modular architecture, Video Dragon tests high-speed LVDS connections and HDMI interfaces. When utilized as frame grabber, device records and analyzes single images and video sequences in raw-data format or as compressed files. Frame rate includes up to 60 images/sec at max color depth of 24 bits. Utilizing serializer in module port, Video Dragon turns into frame generator that may generate and transmit single images, image sequences, and video streams to target device to be tested.
TAP Transceiver provides 16 parallel test access ports.Goepel Electronics, Ltd Austin, TX 78759
Feb 27, 2013 Featuring integrated power supply, 19 in. rackmount SFX-TAP16/G-RM is designed for testing and programming of up to 16 electronic assemblies in parallel. Architecture supports Embedded System Access technologies, including boundary scan, processor emulation, and chip-embedded instrumentation, enabling basic paradigm change without mechanical probe access. SCANFLEX module was developed specifically for gang applications, whereby various test and programming strategies can be combined.
Click below for more Product News from Goepel Electronics, Ltd
Other Company News From Goepel Electronics, Ltd
May 06, 2014
AOI Series with Shadow-Free 3D Measurement Technology
Feb 18, 2014
Extensive Test and Communication Solutions at Automotive Testing Expo India 2014
Nov 06, 2012
Joined Forces to Provide Chip Level Debug in Board and System Environments
Oct 15, 2012
GOEPEL Electronic Combines Boundary Scan with FlexRIO from National Instruments
Oct 10, 2012
GOEPEL Electronic Accelerates Graphical Boundary Scan Project Development for Multi Board Designs
|Home | My ThomasNet News® | Industry Market Trends® | Submit Release | Advertise | Contact News | About Us|
Brought to you by Thomasnet.com
Browse ThomasNet Directory|