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FEI Co.
5350 NE Dawson Creek Dr.
Hillsboro, OR, 97124

Detailed Contact Information:
Dual Beam System provides semiconductor failure analysis.   Return to story
Company Information:
FEI Co.
5350 NE Dawson Creek Dr.

Hillsboro , OR  97124   USA
Phone: 503-726-7500
FAX: 503-726-7509
http://www.feicompany.com
  
 
Latest New Product News from FEI Co.
Products or services this company supplies:
 
Click links to find other companies which supply the same products or services.
Sample Holder for In Situ TEM can heat samples to over 1000°C.

Sample Holder for In Situ TEM can heat samples to over 1000°C.

FEI Co.    Hillsboro, OR 97124
May 21, 2014 Suited for scientists studying structure-function relationship of materials, NanoEx™-i/v sample holder can be integrated with FEI transmission electron microscopes (TEMs) to observe effects of heating and electrical bias on nanostructured materials during in situ experiments. Holder is optimized to accept various sample geometries, from nanoparticles to thin FIB-prepared lamellae, and includes MEMS-based heating element as well as contacts for applying electrical bias.
TEM Sample Preparation Workflow promotes high throughput.

TEM Sample Preparation Workflow promotes high throughput.

FEI Co.    Hillsboro, OR 97124
Nov 06, 2013 Suitable for use in transmission electron microscopy (TEM) analysis, ExSolve™ can prepare site-specific, 20 nm thick TEM lamella on whole wafers up to 300 mm dia. Solution can sample many sites per wafer in fully automated process inside fab, and wafer TEM prep (WTP) increases speed of sample preparation. This provides semiconductor and data storage manufacturers with access to data needed to verify and monitor process performance. FOUP handling capability is standard.
FIB/SEM Systems facilitate imaging of challenging materials.

FIB/SEM Systems facilitate imaging of challenging materials.

FEI Co.    Hillsboro, OR 97124
Jul 23, 2013 DualBeam focused ion beam/scanning electron microscope (FIB/SEM) systems provide imaging and analysis of diverse samples. With electron optics suited for investigating such challenging materials as insulating or magnetic materials, Scios™ DualBeam™ is positioned for accelerated 2D and 3D characterization. Helios NanoLab™ 660 DualBeam, with its patterning engine, MultiChem™ gas delivery system, and Tomahawk™ ion optics, provides capabilities for fabricating prototypes of complex nanodevices.
FIB SEM System investigates materials at nanometer scale.

FIB SEM System investigates materials at nanometer scale.

FEI Co.    Hillsboro, OR 97124
Jul 09, 2013 Combining high-resolution scanning electron microscope with focused ion beam milling, Helios NanoLab™ 660 DualBeam™ is used to investigate structure and function of materials at nanometer scale, create prototypes of micro and nano electro-mechanical systems, and prepare ultrathin samples for atomic scale imaging and analysis in TEM. NanoBuilder™ 2.0 nanoprototyping toolset automatically fabricates 3D prototypes of nano- and microscale devices from computer-generated models.
Wafer Analysis System quickly diagnoses root cause of defects.

Wafer Analysis System quickly diagnoses root cause of defects.

FEI Co.    Hillsboro, OR 97124
Jun 13, 2013 With automated front opening universal pod, Helios NanoLab™ 1200AT DualBeam™ System can be located inside semiconductor wafer lab, where SEM imaging and focused ion beam milling are used to extract ultrathin samples of targeted structures for examination in TEM. System can create site-specific TEM samples thin enough to capture single transistor at 10 nm node, from wafers up to 300 mm in diameter. By moving 1200AT close to wafer process line, process development and ramp are accelerated.
Particulate Analyzer monitors automotive part cleanliness.

Particulate Analyzer monitors automotive part cleanliness.

FEI Co.    Hillsboro, OR 97124
Apr 02, 2013 Combining scanning electron microscope and X-ray spectrometer, ASPEX CleanCHK™ Analyzer monitors automotive part cleanliness by providing particulate data within minutes. Advanced software routines automatically detect and count particles and analyze particle size, shape, and composition. Designed for use on production floor, analyzer offers automated sample set-up, calibration, and analysis; menu-based operation; and ability to report results in several industry standard formats.
Transmission Electron Microscope aids structural biology research.

Transmission Electron Microscope aids structural biology research.

FEI Co.    Hillsboro, OR 97124
Feb 05, 2013 Part of integrated workflow, Tecnai Arctica™ incorporates automation, pioneered on FEI’s flagship Titan Krios™ TEM, to elucidate 3D structure of biological macromolecules and molecular complexes. Cryo-sample autoloader, combined automated target identification, and low dose imaging enable unattended acquisition of large SPA data sets. UI and automation of routine operations and set up procedures lower threshold of operator expertise.

Dual Beam System provides semiconductor failure analysis.

Dual Beam System provides semiconductor failure analysis.

FEI Co.    Hillsboro, OR 97124
Nov 26, 2012 Combining scanning electron microscope for imaging and focused ion beam for milling and deposition, Helios NanoLab™ 450 F1 DualBeam™ System provides semiconductor manufacturers with optimal images of device architectures. STEM detector delivers material contrast, while FlipStage™ 3 flips sample between thinning and STEM viewing positions, and rotation axis permits viewing from either side. To support automated lift-out, EasyLift™ nanomanipulator provides precise motorized sample manipulation.
Automated Mineralogy Analyzer offers turn-key operation.

Automated Mineralogy Analyzer offers turn-key operation.

FEI Co.    Hillsboro, OR 97124
Nov 19, 2012 Extending mineral liberation analysis, MLA EXpress™ provides graphic, mineralogical, and textural information from ore needed to make decisions in diverse mining operations. Bench-top unit. Automated mineralogy involves scanning electron microscope (SEM) and X-ray spectrometer, used to obtain microscopic view of structure and composition of ore. There are multiple analytical modes available, and detector and pulse counting technologies maximize count rates.
Surface Inspection System offer analytical and imaging modes.

Surface Inspection System offer analytical and imaging modes.

FEI Co.    Hillsboro, OR 97124
Oct 02, 2012 Versa 3D™ DualBeam™ is available with UniColore (UC) monochromated electron source, which improves fine surface detail imaging capabilities at low accelerating voltages without compromising analytical performance at high voltages and beam currents. By decreasing energy spread among beam electrons, UC source reduces chromatic aberration and permits beam to be focused into smaller spot. Analytical mode offers beam currents up to 100 nA, and imaging mode offers resolution of 1.4 nm at 1 kV.


Click below for more Product News from FEI Co.

Next News Stories



Other Company News From FEI Co.

Jun 24, 2014

Singapore Researchers Use FEI Titan S/TEM to Link Plasmonics with Molecular Electronics


Jun 23, 2014

University of Maastricht Adds Complete Correlative Workflow from FEI to Its Institute of Nanoscopy


Jun 17, 2014

Diamond Light Source Purchases Multiple Electron Microscopes from FEI


Jun 02, 2014

FEI and University of Manchester Announce Collaboration Agreement for Metals Research


Mar 10, 2014

Simon Fraser University Completes Installation of Electron Microscopes from FEI


Oct 24, 2013

FEI Announces the Installation of Tecnai Arctica Cryo-TEM at Nanyang Technological University in Singapore


Sep 09, 2013

Monash University Orders High-End Transmission Electron Microscope from FEI for Integrated Structural Biology


Aug 01, 2013

FEI Revolutionizes the World of TEM with the Introduction of Three New Systems


Apr 24, 2013

FEI Achieves Milestone for Automated Mineralogy Products


Dec 03, 2012

FEI QEMSCAN WellSite Expands to Onsite Core Analysis with System Delivery to Kirk Petrophysics


Sep 12, 2012

FEI Announces New NanoManipulator and Gas Injector Solutions for Industry-Leading DualBeam Systems


Sep 04, 2012

University of Manchester Installs New Ultra-Powerful Microscope from FEI


Jun 07, 2012

FEI Receives Bookings Worldwide from Oil & Gas Companies


Feb 29, 2012

Highly Advanced Transmission Electron Microscope from FEI Inaugurated at the Ernst Ruska-Centre in Germany


Sep 13, 2011

FEI, OHSU Partner to Create a 'Living Lab for Cell Biology' with High-Performance Electron Microscopes for Disease Research


May 26, 2011

FEI Provides 3D Analysis System to Whiting Oil and Gas Corporation


May 11, 2011

FEI Installs Advanced Electron Microscopes at nanoGUNE Nanoscience Research Center


Apr 21, 2011

FEI Hits Production Milestone for Helios NanoLab DualBeam


Feb 22, 2011

FEI and CEA-Leti Enter Joint Agreement to Characterize Advanced Semiconductor Materials


Jan 05, 2011

FEI Wins Multi-System Order from CANMET Materials Technology Laboratory


Nov 15, 2010

FEI Launches New Website for Natural Resources


Oct 14, 2010

FEI Releases New Guide to Electron Microscopy


Sep 28, 2010

FEI and Nanonics Enter into Collaborative Agreement


Jun 29, 2010

FEI Commissions Titan S/TEM at Institute of Nanoscience of Aragon


Nov 03, 2008

FEI Adds Dual-Axis Automation to Leading Electron Tomography Solution for Life Science Research


Jul 15, 2008

FEI Connectivity Solutions Improve and Accelerate TEM Imaging for Semiconductor Manufacturing


Jan 18, 2008

FEI Opens China NanoPort


Dec 18, 2007

FEI Annouces Joint Research Program with the FOM Foundation


Nov 15, 2007

First Titan(TM) S/TEM Installed in Sweden


Sep 24, 2007

FEI Introduces FEI.com for Owners Featuring FEI Connect


Sep 06, 2007

Team Project Achieves Microscopy Breakthrough


Feb 27, 2007

FEI Unveils World's First Table-Top Scanning Electron Microscope for Advancing Science Education


Jan 09, 2007

California Nanosystems Institute at UCLA Selects Three Fei Systems


Nov 30, 2006

FEI Expands Helios Nanolab(TM) Family for Semi Market


Nov 27, 2006

FEI Receives $11.5 Million Order from Technical University of Denmark


Nov 20, 2006

FEI Company Sells Knights Technology Unit to Magma


Oct 25, 2006

University of Ulster Opens FEI Center For Advanced Imaging


Oct 18, 2006

Imperial College London Unveils UK's First Titan (TM) S/TEM


Oct 03, 2006

Mexico's IMP Opens New Microscopy Center With FEI Tools


Sep 12, 2006

FEI Company and Malvern Instruments Team


Sep 04, 2006

FEI Receives Titan(TM) Order from Japanese Steelmaker


Jul 31, 2006

FEI's Titan(TM) S/Tem Achieves Low KV Milestone


Jul 24, 2006

Don R. Kania Named President and Chief Executive Officer of FEI Company


Jul 10, 2006

FEI Launches Certified Tools Program Globally


Jul 10, 2006

FEI Launches Certified Tools Program Globally


Jun 13, 2006

FEI Earns Spot in Semi Industry 2006 10 Best Supplier List


Jun 12, 2006

FEI Prepares Shipments of U.S. Team Project Systems


Jun 05, 2006

Russia Opens New Nanotech Center with FEI Tools


May 16, 2006

FEI's Titan(TM) S/TEM Installed at France's LETI


May 11, 2006

Japan Electronics Manufacturer Selects FEI System for In-Fab Root Cause Analysis


Apr 19, 2006

McMaster University Orders Two FEI Titan(TM) S/TEMs


Mar 13, 2006

FEI's Automated 3D Crystallography Featured at PITTCON


Mar 02, 2006

FEI Sponsors 2006 Safer Nano Conference


Jan 31, 2006

FEI's Titan(TM) S/TEM Receives Industry Honors


Dec 13, 2005

FEI Company and PDF Solutions® Release Powerful New Semiconductor Defect Analysis Solution


Nov 20, 2005

FEI Completes Installation of First In-Line DA 300HP DualBeam(TM) in Japan






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