Latest New Product News from Asset InterTech Inc.
PXI Controller supports 4 test technologies.Asset InterTech Inc. Richardson, TX 75080
May 07, 2013 Operating from PC and PXI chassis, ScanWorks® PXI-1000 can apply boundary-scan tests based on IEEE 1149.1/6 standards (JTAG), processor- and FPGA-controlled tests, and access instruments embedded in chips via IEEE P1687 Internal JTAG (IJTAG) standard. Controller comes with single-port interface pod for connecting ScanWorks to board being tested; up to 8 controllers can be installed in one PXI chassis for testing multiple circuit boards simultaneously.
IJTAG Tool Suite helps debug SoCs, test circuit boards.Asset InterTech Inc. Richardson, TX 75080
Mar 29, 2013 ScanWorks® IJTAG Test lets engineers access, control, and automate operations of test and measurement instruments embedded in chips. Suite supports IEEE P1687 Internal JTAG (IJTAG) standard for embedded instrumentation, providing method for debugging designs by standardizing how engineers control and access instruments embedded on chip. IJTAG Test tools can read ICL and PDL, and GUI lets engineers drag-and-drop instruments and specific operations to automatically develop test routines.
I/O Validation Tools support Intel Atom micro server designs.Asset InterTech Inc. Richardson, TX 75080
Aug 16, 2012 Taking advantage of Intel's embedded instrumentation technology, ScanWorks® HSIO for Intel® Architecture can non-intrusively validate signal integrity of high-speed I/O and memory buses without placing physical probe on bus. Software-based toolkit supports all Intel processor platforms, including Intel Core(TM) processors for desktop, mobile, and ultrathin laptops; Intel Xeon® processors for servers, embedded and communications, and storage systems; and Atom processors for micro servers and SoCs.
Board-Tester-in-a-Chip has embedded memory test instruments.Asset InterTech Inc. Richardson, TX 75080
Aug 13, 2012 ScanWorks® FCT provides embedded instrumentation library for FPGA-controlled test (FCT) circuit board test tool, giving electronics manufacturers non-intrusive means of increasing test coverage. Included DDR2/DDR3 memory link test instrument and generic memory tester can be temporarily embedded in functional FPGA on circuit board. After engineers select required instruments, ScanWorks FCT automatically configures, inserts, operates, and removes FPGA-based board tester.
Controller Kits for ScanWorks leverage PCI Express® bus.Asset InterTech Inc. Richardson, TX 75080
May 31, 2012 Platform controllers PCIe-1000 and PCIe-410 support ScanWorks validation, test, and debug tools. Able to accelerate test throughput by plugging into high-speed PCIe bus in PC where ScanWorks is running, kits can apply ScanWorks non-intrusive board tests (NBT) to circuit board. PCIe-1000 consists of single-TAP controller for JTAG testing, and PCIe-410 controller kit has 4-port interface pod that can test up to 4 circuit boards simultaneously.
Testing Software inserts and operates board-tester-in-a-chip.Asset InterTech Inc. Richardson, TX 75080
Sep 28, 2011 With ASSET® ScanWorks® platform for embedded instruments, engineers can select instruments they need, set parameters, and insert them into FPGA to function as circuit board tester. Program automatically generates all constructs for embedded tester, facilitates synthesis of instrument code into firmware, and creates software image of tester to program FPGA. Once inserted, ScanWorks FCT operates board-tester-in-a-chip from drag-and-drop interface to perform validation, test, and debug.
JTAG-based Embedded Debugger diagnoses Intel® x86 systems.Asset InterTech Inc. Richardson, TX 75080
Apr 06, 2011 ScanWorks embedded diagnostics solution implements hardware-based run control in system firmware. Once debugger has been installed, systems can be debugged remotely from anywhere and at anytime without any external JTAG emulator hardware. Firmware operates out of x86-based circuit board's service processor or Baseboard Management Controller (BMC) and may be implemented in FPGA on board. Solution can access Intel x86 processor through its debug port to diagnose system faults/failures.
Software Tools debugs 22 nm CPU-based circuit board designs.Asset InterTech Inc. Richardson, TX 75080
Mar 08, 2011 Offered as Web-based solution, ScanWorks® High-Speed IO Toolkit for PC Client validates and debugs circuit board designs targeting Intel® CoreT processors for desktop/mobile designs that will be fabricated at 22 nm process node. Diagnostic tool can graphically visualize and display validation and debug information down to individual bit or specific lane on high-speed serial bus. Funtionality meets validation and debug needs of engineers designing for mobile and desktop marketplaces.
Validation and Test Software supports Intel® CoreT processors.Asset InterTech Inc. Richardson, TX 75080
Feb 22, 2011 ScanWorks® platform for embedded instruments is validation and test platform that supports Intel 2nd generation Core i3, i5, and i7 processors. It enables manufacturers to perform structural and functional tests at processor speeds on circuit boards. Multiple test technologies are supported, including processor-controlled test which can control circuit board's processor and assert structural and functional validation and test routines on board.
Testing Software validates DDR3 memory for Intel platforms.Asset InterTech Inc. Richardson, TX 75080
Sep 20, 2010 Designed for memory suppliers, ScanWorks® DDR3 Memory Toolkit verifies performance of bus that connects DDR3 memory devices to Intel's processors. Toolkit employs Intel® IBIST Interconnect Built-In Self Test embedded instrumentation in Intel processor to drive data patterns onto bus. These patterns form basis for tests that verify read/write capabilities. In addition, certain operational parameters on bus, such as voltage and signal timing, can be modulated.
Click below for more Product News from Asset InterTech Inc.
Other Company News From Asset InterTech Inc.
May 08, 2013
How to do Functional Tests on I2C and SPI Monitors with JTAG is Explored in New eBook from ASSET InterTech
Feb 26, 2013
New e-book Explores How CPU Cache-as-RAM Can Help Debug Non-Booting Prototype Circuit Boards
Feb 12, 2013
New e-book Explores How Manufacturing Process Variances Affect Throughput on High-Speed Serdes
Dec 13, 2012
ASSET ScanWorks' Two FPGA-based Instruments for Testing On-board Memory Named a Best in Test Finalist
Nov 27, 2012
New White Paper Reveals Shrinking Eye Diagrams and Signal Integrity Problems on High-Speed Buses - Bandwidth Tests Often Detect Degraded Performance on DDR, PCI Express, Intel QPI, USB, and Other High-Speed Buses
Sep 10, 2012
ASSET Integrates ScanWorks with Teradyne's PXI Express Instruments for Robust JTAG and Boundary-Scan Test and Device Programming on Large-ScaleTesters
Aug 23, 2012
New Tutorial Explains how IJTAG Standard Streamlines Chip Validation and Characterization
Jul 24, 2012
How to Test High-Speed Memory with Non-Intrusive Embedded Instruments Explained in White Paper
Sep 13, 2011
ASSET ScanWorks Is First to Offer Validation Tools for New Intel® Microarchitecture Codenamed Haswell
Jun 09, 2011
Asset Joins PCI-SIG So Add-In Cards Can Validate Their Access to Intel's Embedded Instrumentation
Nov 30, 2010
Frost & Sullivan Recognizes ASSET for Its Competitive Strategy Innovation for ScanWorks Platform
Nov 02, 2010
ASSET Partners with Leading EMS to Accelerate Adoption of New IEEE P1687 Embedded Instrumentation Standard
Feb 11, 2010
ASSET's ScanWorks is First Development Tool for the Emerging IJTAG Embedded Instrumentation Standard
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