Boundary-Scan Suite offers cluster testing support.

Corelis, Inc.    Cerritos, CA 90703
May 02, 2013 Broadening structural and functional test capabilities, ScanExpress Boundary-Scan Tool Suite v7.8 features model-based test coverage, which limits test vector generation to nets where all nodes have been identified with device model. Cluster definitions are assignable by pin numbers in addition to net name. TPG parsing engine will automatically ignore leading P values found in pin definitions for non-BGA type BSDL files. In addition, v7.8 expands JET support to TI AM335x Sitara™ processors.

Bus Analyzer Software features repeatable trigger conditions.

Corelis, Inc.    Cerritos, CA 90703
Nov 15, 2012 Designed to optimize capabilities of BusPro-I and CAS-1000-I2C/E bus analyzer products, I2C Exerciser v1.23 allows users to generate I2C traffic, non-intrusively listen to and record all I2C bus traffic, and display real-time data in both state and waveform timing windows—all concurrently using single instrument. Verified to run on Windows 8, software provides master and slave emulation, scripting language to control test sequences, and signal parametric measurements.

Quad-SPI Host Adapter supports up to 200 Mbps throughput.

Corelis, Inc.    Cerritos, CA 90703
Aug 13, 2012 Featuring 60 MHz clock rates, USB-powered BusPro-S enables engineers to save development time by providing low level control of Serial Peripheral Interface buses for generation of SPI messages and programming SPI memory. Unit provides user selectable interface voltages down to 1.8 V; standard, dual, quad, and 3-wire mode support; and 8 independent slave select signals. BusPro-S is controlled by included SPI Exerciser software using two modules: Debugger and Programmer.

Boundary Scan Tools expand structural, functional test abilities.

Corelis, Inc.    Cerritos, CA 90703
Jun 01, 2012 In addition to support for multi-core devices, ScanExpress Boundary-Scan Tool Suite v7.7 offers separate global and local constraint entry within ScanExpress TPG preparation GUI. Inverted transparency model support is provided along with constraint to identify inverted nets as well as ability to associate multiple BSDL files to single JTAG device. Solution further offers FlexNet network licensing for ScanExpress JET and NAND Flash bad block management support in ScanExpress JET.

JTAG Solution is designed for Teradyne in-circuit testers.

Corelis, Inc.    Cerritos, CA 90703
Apr 16, 2012 Designed for use with Teradyne TestStation(TM) and GR228x series testers, QuadTAP/CFM integrates advanced boundary-scan test capabilities into Teradyne in-circuit testers. This 4-channel platform provides Advanced JTAG control using vacant slots on Teradyne Multi-Function Application Board, allowing up to 2 test access ports (TAPs) with single CFM slot or up to 4 TAPs using expander modules. TAP interface voltages are independently adjustable from 1.25-3.3 V.

JTAG Testing Software supports Freescale i.MX51 processors.

Corelis, Inc.    Cerritos, CA 90703
Nov 22, 2011 Providing at-speed testing of embedded processor-based electronic PCB and systems, ScanExpress JET(TM) detects, isolates, and diagnoses structural and functional defects with minimal development. Program controls i.MX51's ARM Cortex(TM)-A8 core through JTAG debug port, enabling development and execution of binary and script test steps using graphical user interface on host PC. Standardized interface tests for SDRAM memory, I2C, Ethernet, PMIC, and UART.

JTAG Test System supports AMD embedded processors.

Corelis, Inc.    Cerritos, CA 90703
Oct 27, 2011 Supporting Turion(TM) II Neo, Athlon(TM) II Neo, Opteron(TM) 4100, and Opteron(TM) Quad-Core processors, ScanExpress JET provides automated at-speed, non-intrusive functional testing for SDRAM memory, SPI Flash, I2C, and UART. System features HyperTransport(TM) link validation, peripheral detection of PCI and PCIe buses, and fully automatic test development for all supported peripherals. No boot code is required for test execution.

JTAG Platform integrates boundary-scan test into in-circuit testers.

Corelis, Inc.    Cerritos, CA 90703
Oct 14, 2011 Integrating boundary-scan test patterns into Teradyne TestStation and GR228x series in-circuit testers (ICTs), USB-1149.1/CFM offers Teradyne users 100 MHz clock rate boundary-scan test support, JTAG test vector reusability across multiple manufacturing test stations, and testing of IEEE-1149.6 AC-coupled digital networks. Additional capabilities include in-system programming of Flash and CPLD devices, and automated boundary-scan test vector generation/execution.

Boundary Scan Test Software automates test development.

Corelis, Inc.    Cerritos, CA 90703
Apr 18, 2011 ScanExpress Boundary-Scan Tool Suite v7.5 includes ScanExpress TPG, with automatic identification and classification of resistors and capacitors involved in IEEE-1149.6 high speed, AC-coupled, and differential circuits. Scripting functions such as SPI and I2C functions, GPIO control, 3rd-party program execution, and access to test session information are included. Supporting multiple ID codes/boundary-scan device, suite also offers ScanExpress JET support for ARM Cortex-M3 and Cortex-A8 cores.

JTAG Test Solution accommodates all risk profiles.

Corelis, Inc.    Cerritos, CA 90703
Nov 23, 2010 Offered as service-oriented product based on ScanExpress software, TestGenie provides complete boundary-scan test procedure along with production-ready execution station. In addition to board specific perpetual licenses for ScanExpress Runner, ScanExpress ADO, and ScanExpress Viewer modules, platform includes USB JTAG controller, 12 month hardware and software support contract, and test procedure development for one unit under test.