Rudolph Receives Multiple System Orders for Inspection, Metrology and Analytics of High-end Frequency Filters


Tools will be used to accelerate ramp and improve yields for SAW/BAW filters, a critical enabling technology for smartphones



Flanders, New Jersey – Rudolph Technologies, Inc. (NYSE: RTEC) announced today that it has received multiple orders from a leading radio frequency (RF) filter manufacturer that includes five inspection and metrology tools in addition to process control software products. The equipment will be used to accelerate ramps and enhance yields in the manufacture of RF devices using surface acoustic wave (SAW) and bulk acoustic wave (BAW) filters, which have emerged as the best technology to meet the multi-frequency, signal filtering requirements of smartphones. Shipment of systems and software began in the first quarter and will continue throughout the second quarter 2015.



“Highly selective filters are a critical enabling technology for smartphones, which must filter the transmit and receive paths for 2G, 3G, and 4G wireless access methods in up to 15 bands, as well as Wi-Fi, Bluetooth® and the receive path of GPS receivers,” said Tim Kryman, director of metrology product management for Rudolph. “The phones must be able to isolate signals from one another and reject interference from other extraneous sources. The number of such devices is growing rapidly as more and more are added into cell phones and other mobile devices. A standard telephone may use one or two filters, while a smartphone may need 30-40. With the Internet of Things ramping rapidly, manufacturing of these components is likely to grow dramatically requiring measurement of multilayer metal stacks, including the critical piezoelectric layer, to ensure precision.”



“High-throughput and cross-fab capabilities of our inspection and metrology tools and software platform deliver unique capabilities for overall process improvement and control,” said Rudolph’s Mike Plisinski, executive vice president and chief operating officer. “For Rudolph, this is a significant win on many levels. It brings us squarely into a new and fast growing market segment: RF devices in mobile applications, and it validates the cross-fab, front-end/back-end strategic position we have cultivated for several years. Our ability to displace an entrenched inspection competitor in this instance further demonstrates the strength of our approach.”



“Rudolph’s process control solutions enable our customers to quickly respond to increased demand in this consumer-driven market with high quality devices,” added Plisinski. “Our ability to provide inspection and metrology solutions that cover both front-end and back-end processes coupled with factory-wide analytics that provide additional insight is a key benefit for our customers in this growing market segment.”



For more information about Rudolph Technologies, visit www.rudolphtech.com.



About Rudolph Technologies

Rudolph Technologies, Inc. is a leader in the design, development, manufacture and support of defect inspection, advanced packaging lithography, process control metrology, and data analysis systems and software used by semiconductor device manufacturers worldwide. Rudolph provides a full-fab solution through its families of proprietary products that provide critical yield-enhancing information, enabling microelectronic device manufacturers to drive down the costs and time to market of their products. The Company’s expanding portfolio of equipment and software solutions is used in both the wafer processing and final manufacturing of ICs, and in adjacent markets such as FPD and LED. Headquartered in Flanders, New Jersey, Rudolph supports its customers with a worldwide sales and service organization. Additional information can be found on the Company’s website at www.rudolphtech.com.



Rudolph Contacts:



Guerrant Associates

Laura Guerrant-Oiye

Principal

808.882.1467

lguerrant@guerrantir.com



Trade Press:

Amy Shay

952.259.1794

amy.shay@rudolphtech.com

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