Papers Invited for small specimen test techniques symposium.
Press Release Summary:
October 29, 2012 - Papers are invited for Sixth International Symposium on Small Specimen Test Techniques, which will be held January 29–31, 2014 in Houston, TX and address experimental, analytical, or computational aspects of small (and miniature) specimen techniques as well as their applications. To participate, presenters/authors must submit 250–300 word preliminary abstract by February 28, 2013 that includes clear definition of objective and approach of work discussed.
Original Press Release
Papers are Invited for ASTM International Symposium on Small Specimen Test Techniques
Press release date: October 22, 2012
This sixth symposium will continue the tradition of the small specimen symposia series by specifically addressing the experimental, analytical, or computational aspects of small (and miniature) specimen techniques and their applications. Papers are invited on this topic.
To participate in the symposium, presenters/authors must submit a 250-300 word preliminary abstract by Feb. 28, 2013. The abstract must include a clear definition of the objective and approach of the work discussed, pointing out material that is new, and present sufficient details regarding results. The presentation and manuscript must not be of a commercial nature nor can it have been previously published. The symposium chairman will notify you by March 29, 2013, of your paper’s acceptability for presentation at the symposium.
Symposium presenters are required to submit their papers to the Selected Technical Paper (STP), an online and printed, peer-reviewed publication for the international scientific and engineering community. After the final selection of abstracts has been approved, the ASTM Editorial Office will send authors’ instructions via email. Manuscripts to be peer reviewed for the STP are due online no later than Jan. 24, 2014, at the ASTM Editorial Office.
Visit www.astm.org/E10CFPJan2014 to submit your abstract and for additional information.
Additional technical information about the symposium is available from symposium chairman Mikhail A. Sokolov, Oak Ridge National Lab, Oak Ridge, Tenn. (phone: 865-574-4842; firstname.lastname@example.org) and co-chairmen Enrico Lucon, National Institute of Standards and Technology, Bolder, Colo. (phone: 702-383-1673; email@example.com).
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