Company News

Keysight Technologies, Inc. - Santa Rosa, CA

Original Press Release

Keysight Technologies Demonstrates Latest Measurement Solutions, Services in Military, Aerospace Automated Test at IEEE Autotestcon 2017

Press release date: Sep 12, 2017

What:

Keysight Technologies will showcase its latest aerospace and defense applications at IEEE Autotestcon 2017 This includes the M9383A PXIe microwave signal generator, the Test Automation Platform (TAP) developer’s system, and Radio Test Solution.

The M9383A, introduced in June 2017, is the industry’s first scalable PXIe microwave signal generator with frequency coverage up to 44 GHz and modulation bandwidth up to 1 GHz. The generator supports Mil-ATE test requirements and is upgradeable. In addition to the M9383A, Keysight offers a broad portfolio of PXI instrumentation to support Military ATE applications.

The Test Automation Platform (TAP) developer’s system (KS8400A), provides a fast and flexible test sequence and test plan creation platform to solve all automation and automation centric solution needs. Engineers can use TAP, which is based on the Microsoft .NET platform, stand-alone, or in combination with higher-level test executive software environments. The system is much more than just a programing language, it is a platform upon which engineers can build test solutions with a modular software approach. TAP also provides powerful results and timing analytics to help engineers easily view, debug and optimize their tests.

Keysight’s Radio Test Solution offers hardware and software building blocks for testing analog and digital radios - from 10 Hz to 27 GHz. The test solution, with its has high-density throughput and an open flexible and scalable modular architecture, provides for efficient and complete test development and execution. The Radio Test Solution also supports general purpose measurements and commercial connectivity standards, such as LTE, WLAN and Bluetooth, which makes it ideal for next-generation radio testing.

When:

Sept. 12–14

Where:

Renaissance Schaumburg Convention Center and Hotel, Schaumburg, Illinois

Additional Information: IEEE Autotestcon 2017 Conference (http://www.keysight.com/main/eventDetail.jspx?cc=IN&lc=eng&ckey=2157777&nid=-11143.0.00&id=2157777)

Contacts:

Geri Lynne LaCombe, Americas

+1 303 662 4748

geri_lacombe@keysight.com

Sarah Calnan, Europe

+44 (118) 927 5101

sarah_calnan@keysight.com

Connie Wong, Asia

+852 3197-7818

connie-ky_wong@keysight.com