IEEE Accelerated Stress Testing Committee to hold meeting in October.
Press Release Summary:
IEEE's technical committee on Accelerated Stress Testing and Reliability (ASTR) has issued call for presentations for its 15th Annual ASTR Workshop, to be held October 6-8, 2010. Themed Bridging the Gap from Laboratory to Field, workshop will provide forum to share ideas on limiting and eliminating product field failures. Focus will be on finding design weaknesses and improving strategies to screen defects/weaknesses in electronic, optoelectronic, photonic, and electro-mechanical hardware.
Original Press Release:
ASTR 2010 Workshop Scheduled for October 6-8 in Denver Colorado
Sponsored by the IEEE/CPMT TC-ASTR Committee
DENVER, Colorado - IEEE's technical committee on Accelerated Stress Testing and Reliability (ASTR), a Components, Packaging and Manufacturing Technology (CPMT) Society, has issued a call for presentations for its 15th Annual ASTR Workshop to be held in Denver, Colorado, October 6-8.
This year's Workshop theme is "Bridging the Gap from Laboratory to Field" and will provide a forum to share ideas on limiting and eliminating product field failures. The focus will be on finding design weaknesses, developing robust systems, and improving strategies to cost effectively screen defects and weaknesses in electronic, optoelectronic, photonic, and electro-mechanical hardware.
For more information regarding ASTR 2010 and abstract submission, please visit the group's website at http://www.ewh.ieee.org/soc/cpmt/tc7/ast2010/.
TC-ASTR, the Committee on Accelerated Stress Testing and Reliability was established to assist professionals involved in assuring that their electronic systems hardware is robust and meets world-class standards for design quality and durability. Accelerated Stress Testing (AST) has been embraced by an ever widening array of worldwide companies seeking to reconcile the need for the highest quality product with the necessary push for early time to market. TC-ASTR goals are to help share ideas on new ways of effectively detecting and removing the causes of field failures in electronic components and systems. One of the most valuable tools has been the new approach of accelerated testing based on the capabilities and limits of electronic materials and systems under environmental stress conditions. Through the process of stimulating the materials and hardware to operational failure, and then understanding the root cause of the physical weaknesses and improving those weaknesses has been found to be one of the most efficient ways of making a mature product in the shortest time. TC-ASTR annually holds a Workshop to share these new ideas and continue dialog with the test and reliability professionals on better ways of accelerating and detecting hidden defects, flaws, and weaknesses in electronic and electromechanical hardware that would result in failures during use.
