IEEE 2010 Workshop to cover stress testing and reliability.

Press Release Summary:



IEEE's technical committee on Accelerated Stress Testing and Reliability (ASTR) will hold 2010 ASTR Workshop in Denver, CO, October 6-9, 2010. Opening day keynote will be led by Glen Griffiths, while panel discussion, Bridging the Gap between Lab and Field, will be moderated by Andy Drenick of Qualmark Corporation. Event will also feature 3 tutorial sessions and cover advancements made in accelerated reliability testing for PV devices, LCD TVs, multichip power units, and medical devices.



Original Press Release:



The 2010 IEEE Accelerated Stress Testing and Reliability (ASTR) Workshop to Feature Keynotes from Corporate and Academic Experts



DENVER, Colorado - IEEE's technical committee on Accelerated Stress Testing and Reliability (ASTR), a group sponsored by the IEEE Components, Packaging, and Manufacturing Technology (CPMT) Society, has announced a high-impact line up of industry experts slated to present at an upcoming annual workshop to be held in Denver, Colorado, October 6-9, 2010.

Glen Griffiths, Senior Director of Hewlett Packard's Global Engineering Services Division will provide the opening day keynote, leading into the 2010 panel discussion "Bridging the Gap between Lab and Field" to be moderated by Andy Drenick, CEO and President of Qualmark Corporation. Day 2 keynotes include a morning presentation by Dr. Chandra Desai from the University of Arizona and a luncheon presentation by Dr. Kai Goebel, NASA-Ames Center. Closing keynote will be presented by Gary Hazard of Tellabs.

Keynote presentations are representative of the corporate and academic mix slated to share expertise in reliability and accelerated stress testing practices and technology in a variety of formats including presentations, tutorials, and panel discussions during the 3-day event. Hot topics include advancements made in accelerated reliability testing of photovoltaic devices, lead-free solder joints, LCD TVs, medical devices, multi-chip power units, commercial and avionic testing environments, and telecom and DOD applications.

In addition to the keynote presentations, the ASTR workshop will feature three tutorial sessions from Dr. David Read of the National Institute of Standards and Technology, Milena Krasich of Raytheon, and Dr. Ephraim Suhir, of UC Santa Cruz. The workshop will also feature 20 additional presentations from representatives in industry, government, and academia.

Online registration to attend the ASTR 2010 Workshop and reserve your room at the Grand Hyatt Denver is available on the ASTR 2010 Workshop site: http://www.ewh.ieee.org/soc/cpmt/tc7/ast2010/

TC-ASTR, the Committee on Accelerated Stress Testing and Reliability was established to assist professionals involved in assuring that their electronic systems hardware is robust and meets world-class standards for design quality and durability. Accelerated Stress Testing (AST) has been embraced by an ever widening array of worldwide companies seeking to reconcile the need for the highest quality product with the necessary push for early time to market. TC-ASTR goals are to help share ideas on new ways of effectively detecting and removing the causes of field failures in electronic components and systems. One of the most valuable tools has been the new approach of accelerated testing based on the capabilities and limits of electronic materials and systems under environmental stress conditions. This new approach involves stimulating the materials and hardware under test to operational failure, understanding the root cause and mechanisms involved in the failure, and addressing those weaknesses to make the product robust in the shortest amount of time.TC-ASTR annually holds a workshop to share new ideas and continue dialog with test and reliability professionals on better ways of accelerating and detecting hidden defects, flaws, and weaknesses in electronic and electromechanical hardware that would result in failures during use.

Press Contact:

Gail Eckert

ASTR 2010

Publicity Chair

geckert@qualmark.com

303.254.8800x618

All Topics