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CyberOptics to Present Award-Winning SPI and AOI Inspection Solutions at NEPCON China

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Cyberoptics Ltd.

5900 Golden Hills Dr, Minneapolis, MN, 55416, USA

Original Press Release

CyberOptics to Present Award-Winning SPI and AOI Inspection Solutions at NEPCON China

Press release date: April 10, 2013

CyberOptics Corporation (Nasdaq: CYBE) will present its award-winning SPI and AOI inspection solutions in booth 1G55 at NEPCON China 2013, scheduled to take place April 23-25, 2013 at the Shanghai World EXPO Exhibition Convention Center.

The QX600™ AOI System comes with an all-new Strobed Inspection Module (SIM) with enhanced illumination - delivering the best 01005 and solder joint inspection ever. A higher sensor resolution (12 µm) captures brilliant and crisp quality images for accurate defect review analysis. Programming has been further simplified and improved with a combination of SAM (Statistical Appearance Modeling) and AI2 (Autonomous Image Interpretation) technologies -- giving you the power to inspect anything without having to set parameters or tune algorithms. And, you don’t need to anticipate defects or predefine variance either. AI2 enables faster programming with easy model setup, good defect detection even with excessive variance and accurate results with just one example.

The SE500ULTRA™ system is power-packed with 30 percent more speed, revamped defect review software and optional dual illumination sensor. An all-new, improved ultra-fast sensor combined with a unique ‘all-in-one’ scan technique (that integrates fiducial, barcode and range scans into one, seamless inspection scan sequence) is what makes the SE500ULTRA 30 percent faster at 210cm² /sec. The optional Dual Illumination sensor further enhances repeatability and reproducibility on the very smallest of paste deposits. The SE500ULTRA™ is closed loop feedback ready, which means, better yields too!

The QX100™ AOI system redefines tabletop inspection by combining the performance of an in-line inspection system with the flexibility of a tabletop system. The system features CyberOptics’ unique image acquisition technology, the SIM, and is capable of inspecting component sizes down to 01005.

The sleek QX100™ is powered by AI2 (Autonomous Image Interpretation), a next-generation image analysis technique. With AI2, programming gets faster -with a dramatic 90 percent reduction in examples, and simpler -with full support for unsupervised and semi-automatic model training, helping you setup models effortlessly. Inspection programs created on QX100™ can be directly transferred to our in-line AOI systems (QX600, QX100i).

Also on display is the QX100i™ AOI offering a high value, flexible inspection solution for all applications and is the ideal choice for selective solder and pre-reflow applications.

Perfectly complementing our great line-up of inspection products is CyberConnect™, your best tool for correlating defects between AOI and SPI systems. Integrated within our SPC software, this tool connects the RIGHT data, the SMART way. Correlating helps you pin-point exactly what went wrong and take corrective action reducing rework costs and improving overall line yield. All this simply means quicker turnaround and enhanced product quality.

The CyberOptics team looks forward to welcoming visitors at booth 1G55 at NEPCON China. For more information, please visit www.cyberoptics.com.

About CyberOptics Corporation
Founded in 1984, CyberOptics is a recognized leader in AOI and SPI inspection solutions for the global electronics assembly and semiconductor capital equipment markets. Headquartered in Minneapolis, MN, CyberOptics conducts operations in North America, Singapore, China, Japan and Europe. For more information, visit the company’s Web site at www.cyberoptics.com.

Contact:
Mallika Ramakrishna
CyberOptics Corp
+65 6744 3021
E-mail:mramakrishna@cyberoptics.com
Website: www.cyberoptics.com

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