Asylum Research Presents Cypher(TM) UCLA-CNSI Scan Tour/Workshop April 19-21, 2011


March 7, 2011 (Santa Barbara, CA): Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announces the Cypher AFM Scan Tour and Workshop will take place at the UCLA-CNSI's Nano and Pico Characterization Laboratory on April 19-21, 2011. Each day's agenda will include a presentation of Cypher's unique features and allow attendees to "look inside the box" and really get to grips with Cypher's revolutionary design. Attendees are invited to bring their samples for individual demonstrations of Cypher in real-time, and to experience the unique capabilities of the world's highest resolution AFM, including closed loop atomic resolution, fast scanning, and advanced ease-of-use features such as SpotOn(TM) automatic laser and photodiode alignment. Three slots will be available each day for attending groups to assess their own samples using their scanning modes of choice. Registration is free and all interested parties are welcome. Attendance is limited so early registration is recommended. Attendees may register at AsylumResearch.com/CATour/

John Green, Executive Vice President of Sales at Asylum Research commented, "We are very pleased that the California NanoSystems Institute (CNSI) at UCLA will be the first stop on our Cypher California Tour this year. The Nano and Pico Characterization Laboratory is a renowned center providing state-of-the-art research tools and experienced scientist support for its multitude of users and collaborators in the nanoscience community. This workshop will introduce researchers to the advanced capabilities that Cypher can bring to their research, especially in the dynamic and growing fields of energy storage, polymer materials, and single molecule studies."

Adam Stieg, Scientific Director of the Nano and Pico Characterization Laboratory (NPC) at UCLA-CNSI, noted "The NPC Lab and CNSI are extremely excited to be a host for Asylum's 2011 Cypher California Tour. Workshops of this kind provide an extremely valuable opportunity for researchers to gain hands-on experience in the characterization of real samples that would not be possible in other venues. Given the breadth of the scientific community here at UCLA, this extended workshop will serve to expose researchers to the advantages provided by AFM methods in the execution of cutting-edge nanoscience research."

About Asylum Research
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http://www.asylumresearch.com/References/Testimonials.shtml
Asylum Research is the technology leader in atomic force and scanning probe microscopy (AFM/SPM) for both materials and bioscience applications. Founded in 1999, we are an employee owned company dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 250 years combined AFM/SPM experience among our staff. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more. Asylum's product line offers imaging and measurement capabilities for a wide range of samples, including advanced techniques such as electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force microscopy (PFM), thermal analysis, quantitative nanoindenting, and a wide range of environmental accessories and application-ready modules.

Asylum's MFP-3D set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback sensor technology. The MFP-3D offers both top and bottom sample viewing and easy integration with most commercially-available inverted optical microscopes.

Asylum's new Cypher AFM is the world's first new small sample AFM/SPM in over a decade, and sets the new standard as the world's highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, >20X faster AC imaging with small cantilevers, Spot-On(TM) automated laser and photodetector alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities.

Asylum Research offers the lowest cost of ownership of any AFM company. Ask us about our industry-best 2-year warranty, our legendary product and applications support, and our exclusive 6-month money-back satisfaction guarantee. We are dedicated to providing the most technically advanced AFMs for researchers who want to take their experiments to the next level. Asylum Research also distributes third party cantilevers from Olympus, Nanoworld/Nanosensors, and our own MFM and iDrive(TM) tips.

About UCLA's CNSI Nano and Pico Characterization Lab
The Nano and Pico Characterization Lab (NPC) in the California NanoSystems Institute (CNSI) at the University of California, Los Angeles (UCLA) provides an unprecedented collection of nanoscale surface analysis instrumentation in a single, multi-user facility. By combining multiple modes of surface analysis, this facility enables thorough investigation of the vast array of physical, chemical and electrical properties necessary for complete study of an experimental system and developing nanotechnologies.

The Nano & Pico Characterization Lab provides both state-of-the-art microscopic techniques to visualize surfaces, adsorbates, nanostructures and devices at the atomic and molecular scale as well as a unique opportunity for researchers to gain insight into local properties under a wide range of experimental conditions. An ever increasing demand for knowledge of how matter behaves at the nanoscale and beyond has forced these measurements and methods to the forefront of nanoscience research.

For additional information, contact Terry Mehr, Director of Marketing Communications, or Monteith Heaton, EVP, Marketing/Business Development, Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117, 805-696-6466x224/227, Terry@AsylumResearch.com, Monte@AsylumResearch.com, www.AsylumResearch.com.

Keywords: AFM Class, Atomic Force Microscopy (AFM), Scanning Probe Microscopy (SPM)

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