Talking Laser Diffraction - Malvern Specialists Present Particle Sizing Guidance at Pittcon 2010


22 February 2010: Malvern, UK: Specialists from Malvern Instruments are contributing to the Pittcon 2010 (28 February - 5 March 2010; Orlando, FL, USA) technical program across multiple disciplines with a series of podium and poster presentations. These include two presentations that discuss one of the most widely used techniques for particle size analysis, laser diffraction. Both draw on Malvern's expertise in applications development and understanding to help further the practical implementation of this key analytical tool, which is now the particle sizing technique of choice across many industries.

Making a podium presentation, Applications Manager Dr. Alan Rawle will consider the requirements for optical model selection when using laser diffraction, making reference to ISO-13320:2009, the updated standard for laser diffraction measurements. His talk will consider the importance of particle optical properties in defining the limits of applicability of the available models, showing how the particle absorption is important in guiding users towards a correct selection. Dr Rawle will present experimental data that clearly illustrate the application of each model, with the aim of helping users of this technique gain a greater understanding of its application in practice. His presentation is at 2.00pm on Thursday 4 March in Room 308A (3090-1).

In a poster presentation - 'Particle size: Laser diffraction versus Dynamic Light Scattering'- on the same day, Dr. Kapeeleshwar Krishana, Applications Scientist at Malvern Instruments, will compare the dynamic ranges for both techniques, providing a realistic assessment of the capabilities and limitations of each. This type of understanding is essential in selecting the most appropriate technique for specific particle sizing applications.

Malvern has long been a world leader in particle characterization, with a deep understanding of the techniques involved and in particular how to apply them across a diverse range of disciplines and industrial sectors. With an intense focus on meeting the needs of its customers, Malvern continues to advance the practice of particle characterization, delivering increasingly intelligent, easy to use, high performance systems. www.malvern.com

About Malvern Instruments

Malvern Instruments provides a range of complementary materials characterization tools that deliver inter-related measurements reflecting the complexities of particulates and disperse systems, nanomaterials and macromolecules. Analytical instruments from Malvern are used in the characterization of a wide variety of materials, from industrial bulk powders to nanomaterials and delicate macromolecules. A broad portfolio of innovative technologies is combined with intelligent, user-friendly software. These systems deliver industrially relevant data enabling our customers to make the connection between micro (such as particle size) and macro (bulk) material properties (rheology) and chemical composition (chemical imaging).

Particle size, particle shape, zeta potential, molecular weight, chemical composition and rheological properties measurements are now joined by advanced chromatography solutions (GPC/SEC), extending Malvern's technologies for protein molecular weight, size and aggregation measurements, and synthetic polymer molecular weight and distribution. The company's laboratory, at-line, on-line and in-line solutions are proven in sectors as diverse as cement production and pharmaceutical drug discovery.

Headquartered in Malvern, UK, Malvern Instruments has subsidiary organizations in all major European markets, North America, China, Korea and Japan, a joint venture in India, a global distributor network and applications laboratories around the world. www.malvern.com

USA contact:

Marisa Fraser

Malvern Instruments Inc.

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Fax: +1 508 768 6403

marisa.fraser@malvern.com

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