RIEGL USA to Exhibit and Present at SPAR International 2014


RIEGL USA will be exhibiting and presenting at SPAR International 2014.



SPAR International 2014 will be held at the Broadmoor in Colorado Springs, Colorado from April 14 through April 17, 2014.



RIEGL USA will also be exhibiting at Booth 430 during the conference. Please be sure to come by the booth to talk to our staff about any questions that you may have about our hardware and software solutions!



Joshua France, Mobile Systems Segment Manager, will be presenting “Multisensor Precision in a Complex World: Automatic Adjustment Software” on Wednesday, April 16 from 9:00 AM to 10:30 AM during the New Technologies- Comparing Options: Scanning Vs. LiDAR Vs. Photogrammetry session in Broadmoor Hall D.



Tan Nguyen, Field Support Manager, and Dr. Dennis Hirota, President of Sam O. Hirota, will be presenting ‘RiALITY- Dive into the Point Cloud” on Wednesday, April 16 from 11:00 AM to 12:30 PM during the New Technologies- Augmented Reality session in Broadmoor Hall D.



Bret Bienkowski, Terrestrial Segment Manager, will be presenting “4D Laser Scanning: Monitoring Change Over Time” on Thursday, April 17 from 9:45 AM to 10:15 AM during the Technical Seminars in Broadmoor Hall F.



RIEGL USA looks forward to a successful conference and to seeing you at SPAR International 2014!



About RIEGL USA:

Celebrating twenty years of excellence, RIEGL USA delivers cutting edge technology in airborne, mobile, terrestrial, and the newest unmanned laser scanning solutions. From purchase, to system integration, as well as training and support, RIEGL USA stands out as a leader in the industry.

 

RIEGL USA: Building Systems, Delivering Performance



For More Information:

Susan Licari, Marketing Manager    

RIEGL USA      

7035 Grand National Drive, Suite 100    

Orlando, FL 32819      

Phone:  (407) 248-9927, Fax:  (407) 248-2636   

Toll Free: 1-855-Go-RieglUSA     

slicari@rieglusa.com; info@rieglusa.com     

     

Serving the North American Market since 1993


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