Nextest Showcases a Range of Test Solutions at SEMICON/West 2007 |
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Nextest Systems Corporation
1901 Monterey Rd.,
San Jose, CA, 95112
USA
Press release date: July 16, 2007
Nextest Showcases a Range of Test Solutions at SEMICON/West 2007
SAN FRANCISCO, July 16 // -- Nextest Systems Corporation (NASDAQ:NEXT), a leading manufacturer of automatic test equipment (ATE) for cost-sensitive semiconductors, announced that it will exhibit a wide range of test solutions at SEMICON/West this year. The conference is being held at the Moscone West Convention Center in San Francisco, California, July 17-19, 2007. The conference provides a venue for semiconductor equipment makers to promote their company, products and services, to chip-making companies from around the world.
Showcased in Nextest's booth #8441, at SEMICON/West this year, are test solutions that demonstrate the Magnum's product family test systems; ranging from 256 pins, up to 7680 pins, and capable of testing a variety of devices, including: NAND, SOC, and logic semiconductors.
MAGNUM Grande(TM) 7680-pin Test System
To address the industry-wide concern over escalating test costs and capacity requirements, Nextest will demonstrate Magnum's unique architecture that provides customers with the flexibility to add functionality and pin count without system downtime, or software reconfiguration.
At SEMICON/West 2005, Magnum displayed 320 devices in parallel. At that same show in 2006, that number soared to 720 parts in parallel. This year, Magnum Grande's 7,680 I/O pin test system will be integrated with a Mirae Model 530 handler-capable of testing 960 NAND flash devices in parallel. To date, this is the highest number of devices being tested in parallel.
MAGNUM SV(TM) 1024-pin Test System
Demonstrating Magnum's logic test capability, the Magnum SV is a production test system targeted at FPGA devices. This system is the ideal solution for test requirements of high pin count devices in parallel and provides a flexible pattern architecture for logic and memory test on- the-fly. Also being demonstrated is Nextest's logic Wavetool software that dramatically reduces test program development time.
MAGNUM iCP-EV(TM) 128-pin Test System
Also on display, the Magnum ICP-EV will be integrated with an Interaction IAOPT-15ONE Illuminator. Focused at the CMOS Image Sensor (CIS) market, Magnum iCP-EV offers CIS manufacturers a low-cost engineering alternative for program development and debug. Due to the system's small physical size, engineering can perform the necessary work in an office environment, prior to moving devices to the Magnum iCP for volume- production testing. This innovative approach allows for a smooth transition to test CIS devices in parallel and is a much more cost- effective method over utilizing expensive, "large-iron" test equipment. CIS devices are being utilized in numerous consumer products such as cell phones, still cameras, web cams, PDA's, and security cameras.
ABOUT NEXTEST
Nextest Systems Corporation is a low-cost leader in the design and manufacture of automatic test equipment (ATE) for Flash memory and System-On- Chip semiconductors. Nextest's products address the growing demand from manufacturers for ATE with increased throughput, functionality and reliability, while reducing time to market and cost of test. Nextest has shipped over 1,800 systems to more than 60 semiconductor companies worldwide. Further information is available at http://www.nextest.com/.
Source: Nextest Systems Corporation
Web site: http://www.nextest.com/
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