(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
Matrix Metrologies, Inc.
101-5 Colin Dr.
Holbrook, NY, 11741
USA
Press release date: December 13, 2008
HOLBROOK, NY, - DEC, 2008 - Matrix Metrologies, Inc., a supplier of film measurement and WEEH/RoHS restricted element compliance testing equipment, introduces a new comprehensive eight page XRF brochure featuring the companies complete line of Bench top X-ray fluorescence measurement systems designed exclusively for metal film thickness and composition measurement of common metal finishing and microelectronics industry plating and coated layers.
Matrix's XRF tools are capable of measuring single, double and tri-layer coatings, and alloyed coatings and are specifically designed for measuring metal finished parts such as fasteners, connectors and machined parts, as well as microelectronics and precious metal finished product. Precise and non-destructive measurements can be performed in a few seconds and thickness and composition of alloy coatings can be analyzed simultaneously along with accurate primary metal determination in plating solutions and composition of your unfinished base material.
Matrix Metrologies, headquartered in Holbrook, New York, is a supplier of X-ray measurement equipment and services used for film thickness and composition measurement and offers over twenty five years experience in XRF, X-ray fluorescence machines, XRF instrumentation recertification and repair and supplies a complete line of NIST traceable XRF calibration standards and recertification services.
Additional information on Matrix Metrologies, Inc. can be found at http://www.matrixmetrologies.com. Or info@matrixmetrologies.com
101-5 Colin Drive, Holbrook, NY 11741
Contact: Frank Reilly T.631.472.2400 F.631.472.2424
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