New White Paper Reveals Shrinking Eye Diagrams and Signal Integrity Problems on High-Speed Buses - Bandwidth Tests Often Detect Degraded Performance on DDR, PCI Express, Intel QPI, USB, and Other High-Speed Buses
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Asset InterTech Inc.
2201 N. Central Expy Ste. 105
Richardson, TX, 75080
Press release date: November 27, 2012
Richardson, TX - A new white paper from ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, points out how increasing bus speeds on circuit boards could create havoc for signal integrity on those buses, in turn degrading the bus' throughput performance. Each new generation of a high-speed bus typically runs at a higher signal frequency, but this decreases the margin for error on the bus, making it more sensitive to disruptions from jitter, inter-symbol interference (ISI), crosstalk and other factors.
To avoid potential problems on high-speed buses like DDR3, PCI Express, Intel® QPI, Serial ATA, USB and others, bus performance must be validated during each phase of a system's life cycle, including design/development, manufacturing and as an installed system in the field. Unfortunately, effectively and economically validating the signal integrity on a high-speed bus has become more difficult as the limitations of legacy probe-based test equipment such as oscilloscopes have become more obvious in recent years. Now though, non-intrusive software-driven test methods based on embedded instrumentation are providing alternative validation solutions that are more cost-effective and deliver observed signal integrity data.
The white paper, titled "Bandwidth tests reveal shrinking eye diagrams and signal integrity problems," can be downloaded from ASSET's web site at http://www.asset-intertech.com/Products/High-Speed-I-O-Validation/HSIO-Software/e-Book-Shrinking-Eye-Diagram
Go to this page to view the many resources in ASSET's News Room, including a variety of other tutorials and white papers: http://www.asset-intertech.com/News
About ASSET InterTech
ASSET InterTech is the leading supplier of tools for embedded instrumentation for design validation, test and debug. The ScanWorks® platform for embedded instruments provides automation, access and analysis tools in one environment. Users can quickly and easily validate and test semiconductors, circuit boards or entire systems during every phase of a product's life, including design, manufacturing/repair and field maintenance. ASSET InterTech is located at 2201 North Central Expressway, Suite 105, Richardson, TX 75080.
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