High Energy Spectral Analysis |
McPherson, Inc.
7 Stuart Rd.
Chelmsford, MA, 01824
USA
Press release date: January 1, 2012
The Laboratory of Radiation Physics Belgorod State University ordered a Model 248/310 spectrometer from McPherson, Inc. The grazing incidence spectrometer is on the way! It's been accepted by the Russian experimental physicist Alexander Kubankin. It will help their spectroscopy in the soft x-ray and extreme vacuum ultraviolet (EUV) wavelength region. Their research includes new x-ray sources in the 0.1 to fifty nanometer region, methods for researching electron interactions with structured targets, and a new topic, guiding fast electrons.
Chief physicist at the Laboratory of Radiation Physics is Nikolay Nasonov. He creates theory for and designs experiments. A 60keV electron gun is basis for investigation of interaction of X-rays and fast electrons with condensed medium. The plan is for the new McPherson spectrometer to measure Cherenkov Effect in the extreme vacuum ultraviolet, as well as measure the enhanced intensity of transition radiation from fast electron target interactions at grazing angles.
The McPherson Model 248/310 grazing incidence spectrometer is unique and makes optical measurements from one to 300 nanometers. It operates in scanning mode, or with microchannel plate intensifier or direct-detection CCD.
McPherson, Inc. (Chelmsford, MA USA) manufactures a variety of instruments that measure and tune specific wavelengths of light. They are prepared for high-vacuum, and also with all metal seals for ultra high vacuum applications. Accessories like light sources, detectors, and sample chambers are available. All vacuum compatible, calibrated sources and detectors too. For more than fifty years, we've served international and domestic customers in university and research laboratories.
McPherson, Inc., 7A Stuart Road, Chelmsford MA 01824 USA
www.McPhersonInc.com
Email MCP@McPhersonInc.com, Telephone 1-978-256-4512, fax 1-978-256-4512
Point of Contact: Erik Schoeffel, Sales Coordinator
|
|
|
|
|
|
| 
